ATE308414T1 - Profilierung eines strahlungsbündels für stereolithographie - Google Patents

Profilierung eines strahlungsbündels für stereolithographie

Info

Publication number
ATE308414T1
ATE308414T1 AT00128126T AT00128126T ATE308414T1 AT E308414 T1 ATE308414 T1 AT E308414T1 AT 00128126 T AT00128126 T AT 00128126T AT 00128126 T AT00128126 T AT 00128126T AT E308414 T1 ATE308414 T1 AT E308414T1
Authority
AT
Austria
Prior art keywords
stereolithography
intensity
pinhole
profiling
scanning mechanism
Prior art date
Application number
AT00128126T
Other languages
English (en)
Inventor
Stuart Thomas Spence
Thomas Almquist
Harry L Tarnoff
Original Assignee
3D Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US07/182,830 external-priority patent/US5059359A/en
Application filed by 3D Systems Inc filed Critical 3D Systems Inc
Application granted granted Critical
Publication of ATE308414T1 publication Critical patent/ATE308414T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T17/00—Three-dimensional [3D] modelling for computer graphics
    • G06T17/20—Finite element generation, e.g. wire-frame surface description, tesselation
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C64/00—Additive manufacturing, i.e. manufacturing of three-dimensional [3D] objects by additive deposition, additive agglomeration or additive layering, e.g. by 3D printing, stereolithography or selective laser sintering
    • B29C64/10—Processes of additive manufacturing
    • B29C64/106—Processes of additive manufacturing using only liquids or viscous materials, e.g. depositing a continuous bead of viscous material
    • B29C64/124—Processes of additive manufacturing using only liquids or viscous materials, e.g. depositing a continuous bead of viscous material using layers of liquid which are selectively solidified
    • B29C64/129—Processes of additive manufacturing using only liquids or viscous materials, e.g. depositing a continuous bead of viscous material using layers of liquid which are selectively solidified characterised by the energy source therefor, e.g. by global irradiation combined with a mask
    • B29C64/135—Processes of additive manufacturing using only liquids or viscous materials, e.g. depositing a continuous bead of viscous material using layers of liquid which are selectively solidified characterised by the energy source therefor, e.g. by global irradiation combined with a mask the energy source being concentrated, e.g. scanning lasers or focused light sources
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C64/00—Additive manufacturing, i.e. manufacturing of three-dimensional [3D] objects by additive deposition, additive agglomeration or additive layering, e.g. by 3D printing, stereolithography or selective laser sintering
    • B29C64/40—Structures for supporting 3D objects during manufacture and intended to be sacrificed after completion thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0037—Production of three-dimensional images
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70416—2.5D lithography
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T17/00—Three-dimensional [3D] modelling for computer graphics
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T17/00—Three-dimensional [3D] modelling for computer graphics
    • G06T17/10—Constructive solid geometry [CSG] using solid primitives, e.g. cylinders, cubes
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/49—Nc machine tool, till multiple
    • G05B2219/49013—Deposit layers, cured by scanning laser, stereo lithography SLA, prototyping

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Optics & Photonics (AREA)
  • Computer Graphics (AREA)
  • Materials Engineering (AREA)
  • Software Systems (AREA)
  • Chemical & Material Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Powder Metallurgy (AREA)
  • Laser Beam Processing (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
AT00128126T 1988-04-18 1989-04-17 Profilierung eines strahlungsbündels für stereolithographie ATE308414T1 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US07/182,830 US5059359A (en) 1988-04-18 1988-04-18 Methods and apparatus for production of three-dimensional objects by stereolithography
US26980188A 1988-11-08 1988-11-08
US07/268,907 US5059021A (en) 1988-04-18 1988-11-08 Apparatus and method for correcting for drift in production of objects by stereolithography
US07/268,816 US5058988A (en) 1988-04-18 1988-11-08 Apparatus and method for profiling a beam
US07/268,837 US5123734A (en) 1988-04-18 1988-11-08 Apparatus and method for calibrating and normalizing a stereolithographic apparatus

Publications (1)

Publication Number Publication Date
ATE308414T1 true ATE308414T1 (de) 2005-11-15

Family

ID=27539082

Family Applications (3)

Application Number Title Priority Date Filing Date
AT96120757T ATE208702T1 (de) 1988-04-18 1989-04-17 Profilierung eines strahlungsbündels für stereolithographie
AT89303780T ATE160968T1 (de) 1988-04-18 1989-04-17 Profilierung eines strahlungsbündels für stereolithographie
AT00128126T ATE308414T1 (de) 1988-04-18 1989-04-17 Profilierung eines strahlungsbündels für stereolithographie

Family Applications Before (2)

Application Number Title Priority Date Filing Date
AT96120757T ATE208702T1 (de) 1988-04-18 1989-04-17 Profilierung eines strahlungsbündels für stereolithographie
AT89303780T ATE160968T1 (de) 1988-04-18 1989-04-17 Profilierung eines strahlungsbündels für stereolithographie

Country Status (7)

Country Link
EP (1) EP0375097B1 (de)
AT (3) ATE208702T1 (de)
CA (2) CA1334052C (de)
DE (4) DE68928485T2 (de)
HK (1) HK1003490A1 (de)
IL (1) IL89976A0 (de)
WO (1) WO1989011085A1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4416988A1 (de) * 1994-05-13 1995-11-16 Eos Electro Optical Syst Vorrichtung und Verfahren zum Herstellen eines dreidimensionalen Objekts
US5753171A (en) * 1994-05-13 1998-05-19 Eos Gmbh Electro Optical Systems Method and apparatus for producing a three-dimensional object
DE19918613A1 (de) 1999-04-23 2000-11-30 Eos Electro Optical Syst Verfahren zur Kalibrierung einer Vorrichtung zum Herstellen eines dreidimensionalen Objektes, Kalibrierungsvorrichtung und Verfahren und Vorrichtung zur Herstellung eines dreidimensionalen Objektes
CN101896868A (zh) * 2007-07-20 2010-11-24 新加坡科技研究局 使用光固化组合物的双光子立体光刻成型
FR2966266B1 (fr) * 2010-10-15 2016-01-22 Phidias Technologies Procede et dispositif de prototypage rapide.
BE1024052B1 (nl) 2013-12-03 2017-11-08 Layerwise N.V. Werkwijze en inrichting voor het kalibreren van meerdere energiestralen voor het additief vervaardigen van een object
JP7354590B2 (ja) 2019-05-29 2023-10-03 セイコーエプソン株式会社 三次元造形物の製造方法および三次元造形装置
JP7306065B2 (ja) 2019-05-30 2023-07-11 セイコーエプソン株式会社 三次元造形物の製造方法および三次元造形装置
CN114184131B (zh) * 2021-12-09 2024-01-30 安徽华烨特种材料有限公司 浸胶增强材料接头识别设备
CN115415747B (zh) * 2022-09-19 2024-01-26 四川精控阀门制造有限公司 强制密封球阀堆焊球体的加工方法
CN118650873B (zh) * 2024-07-03 2026-01-02 广州黑格智造信息科技有限公司 用于形成三维物体的设备、方法及非易失性存储介质
CN118884782B (zh) * 2024-08-13 2025-09-26 托托科技(苏州)有限公司 一种基于阵列的光刻参数确定方法及系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5226242A (en) * 1975-08-22 1977-02-26 Nippon Telegr & Teleph Corp <Ntt> Unit for analysing the distribution of a light mode
JPS5670429A (en) * 1979-11-14 1981-06-12 Nec Corp Measuring device for laser beam
US4320462A (en) * 1980-03-31 1982-03-16 Hughes Aircraft Company High speed laser pulse analyzer
SE440415B (sv) * 1983-11-17 1985-07-29 Mydata Ab Forfarande och anordning for kalibrering av ett positioneringssystem
US4575330A (en) * 1984-08-08 1986-03-11 Uvp, Inc. Apparatus for production of three-dimensional objects by stereolithography
JPS62163933A (ja) 1986-01-14 1987-07-20 Nippon Kogaku Kk <Nikon> レ−ザビ−ム断面光強度分布測定装置

Also Published As

Publication number Publication date
CA1334052C (en) 1995-01-24
DE68928485D1 (de) 1998-01-22
IL89976A0 (en) 1989-12-15
DE375097T1 (de) 1996-02-29
EP0375097A3 (de) 1991-09-25
DE68929541D1 (de) 2005-12-08
ATE160968T1 (de) 1997-12-15
ATE208702T1 (de) 2001-11-15
EP0375097B1 (de) 1997-12-10
WO1989011085A1 (en) 1989-11-16
DE68929348D1 (de) 2001-12-20
CA1341214C (en) 2001-04-10
DE68928485T2 (de) 1998-07-02
DE68929348T2 (de) 2002-09-26
HK1003490A1 (en) 1998-10-30
EP0375097A2 (de) 1990-06-27
DE68929541T2 (de) 2006-08-10

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