ATE323711T1 - Organometallverbindungen und ihre verwendung als vorstufen zur ausbildung von schichten und pulvern von metallen oder metall-derivaten - Google Patents
Organometallverbindungen und ihre verwendung als vorstufen zur ausbildung von schichten und pulvern von metallen oder metall-derivatenInfo
- Publication number
- ATE323711T1 ATE323711T1 AT01950811T AT01950811T ATE323711T1 AT E323711 T1 ATE323711 T1 AT E323711T1 AT 01950811 T AT01950811 T AT 01950811T AT 01950811 T AT01950811 T AT 01950811T AT E323711 T1 ATE323711 T1 AT E323711T1
- Authority
- AT
- Austria
- Prior art keywords
- group
- metals
- precursors
- powders
- metal
- Prior art date
Links
- 229910052751 metal Inorganic materials 0.000 title abstract 7
- 239000002184 metal Substances 0.000 title abstract 7
- 150000002739 metals Chemical class 0.000 title abstract 4
- 239000000843 powder Substances 0.000 title abstract 2
- 239000002243 precursor Substances 0.000 title abstract 2
- 150000001875 compounds Chemical class 0.000 title 1
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical group [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 abstract 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 abstract 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 abstract 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 abstract 2
- 229910017052 cobalt Inorganic materials 0.000 abstract 2
- 239000010941 cobalt Substances 0.000 abstract 2
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 abstract 2
- 229910052805 deuterium Inorganic materials 0.000 abstract 2
- 229910052739 hydrogen Inorganic materials 0.000 abstract 2
- 239000001257 hydrogen Substances 0.000 abstract 2
- 150000002902 organometallic compounds Chemical class 0.000 abstract 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 abstract 2
- 125000004469 siloxy group Chemical group [SiH3]O* 0.000 abstract 2
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 abstract 1
- 125000000217 alkyl group Chemical group 0.000 abstract 1
- 125000003710 aryl alkyl group Chemical group 0.000 abstract 1
- 125000003118 aryl group Chemical group 0.000 abstract 1
- 230000015572 biosynthetic process Effects 0.000 abstract 1
- 238000005234 chemical deposition Methods 0.000 abstract 1
- 238000005229 chemical vapour deposition Methods 0.000 abstract 1
- 150000002431 hydrogen Chemical group 0.000 abstract 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 abstract 1
- ILNKLXHFYKXPKY-UHFFFAOYSA-N iridium osmium Chemical compound [Os].[Ir] ILNKLXHFYKXPKY-UHFFFAOYSA-N 0.000 abstract 1
- 229910052742 iron Inorganic materials 0.000 abstract 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 229910052759 nickel Inorganic materials 0.000 abstract 1
- 125000001820 oxy group Chemical group [*:1]O[*:2] 0.000 abstract 1
- -1 oxysilyl Chemical group 0.000 abstract 1
- 229910052763 palladium Inorganic materials 0.000 abstract 1
- 229910052697 platinum Inorganic materials 0.000 abstract 1
- 229910052702 rhenium Inorganic materials 0.000 abstract 1
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 abstract 1
- 229910052703 rhodium Inorganic materials 0.000 abstract 1
- 239000010948 rhodium Substances 0.000 abstract 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 abstract 1
- 229910052707 ruthenium Inorganic materials 0.000 abstract 1
- 125000003808 silyl group Chemical group [H][Si]([H])([H])[*] 0.000 abstract 1
- 125000000547 substituted alkyl group Chemical group 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
- 229910052713 technetium Inorganic materials 0.000 abstract 1
- GKLVYJBZJHMRIY-UHFFFAOYSA-N technetium atom Chemical compound [Tc] GKLVYJBZJHMRIY-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F15/00—Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table
- C07F15/06—Cobalt compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F15/00—Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table
- C07F15/06—Cobalt compounds
- C07F15/065—Cobalt compounds without a metal-carbon linkage
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/42—Silicides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/0212—Manufacture or treatment of FETs having insulated gates [IGFET] using self-aligned silicidation
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Catalysts (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US21498800P | 2000-06-29 | 2000-06-29 | |
| US09/894,450 US6777565B2 (en) | 2000-06-29 | 2001-06-28 | Organometallic compounds and their use as precursors for forming films and powders of metal or metal derivatives |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE323711T1 true ATE323711T1 (de) | 2006-05-15 |
Family
ID=26909576
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT01950811T ATE323711T1 (de) | 2000-06-29 | 2001-06-29 | Organometallverbindungen und ihre verwendung als vorstufen zur ausbildung von schichten und pulvern von metallen oder metall-derivaten |
Country Status (8)
| Country | Link |
|---|---|
| US (4) | US6777565B2 (de) |
| EP (1) | EP1299404B1 (de) |
| KR (1) | KR100795324B1 (de) |
| CN (1) | CN100354286C (de) |
| AT (1) | ATE323711T1 (de) |
| AU (1) | AU2001271770A1 (de) |
| DE (1) | DE60118925T2 (de) |
| WO (1) | WO2002002574A1 (de) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100455287B1 (ko) * | 2002-02-28 | 2004-11-06 | 삼성전자주식회사 | 반도체 장치의 커패시터, 그 제조방법 및 상기 커패시터를채용하고 있는 전자 소자 |
| AU2003222000A1 (en) * | 2002-03-14 | 2003-09-29 | Wisys Technology Foundation, Inc. | Mbe-method for the production of a gallium manganese nitride ferromagnetic film |
| KR100819297B1 (ko) * | 2002-06-26 | 2008-04-02 | 삼성전자주식회사 | 고반사율 미세 패턴의 제조방법 |
| US20040180452A1 (en) * | 2003-03-14 | 2004-09-16 | Yongjie Cui | Method and apparatus for the production of a semiconductor compatible ferromagnetic film |
| JP4581119B2 (ja) * | 2003-09-17 | 2010-11-17 | 株式会社トリケミカル研究所 | NiSi膜形成材料およびNiSi膜形成方法 |
| KR100555541B1 (ko) * | 2003-12-23 | 2006-03-03 | 삼성전자주식회사 | 코발트 실리사이드막 형성방법 및 그 형성방법을 이용한반도체 장치의 제조방법 |
| US7294449B1 (en) | 2003-12-31 | 2007-11-13 | Kovio, Inc. | Radiation patternable functional materials, methods of their use, and structures formed therefrom |
| US7004874B2 (en) * | 2004-03-15 | 2006-02-28 | Magna Powertrain, Inc. | On-demand power take-off unit for four-wheel drive vehicle |
| JP4353371B2 (ja) * | 2004-08-06 | 2009-10-28 | 株式会社トリケミカル研究所 | 膜形成方法 |
| KR100643637B1 (ko) * | 2005-01-25 | 2006-11-10 | 한국화학연구원 | 니켈 아미노알콕사이드 선구 물질을 사용하는 원자층침착법으로 니켈 산화물 박막을 제조하는 방법 |
| US7064224B1 (en) * | 2005-02-04 | 2006-06-20 | Air Products And Chemicals, Inc. | Organometallic complexes and their use as precursors to deposit metal films |
| US20100264224A1 (en) * | 2005-11-22 | 2010-10-21 | Lex Kosowsky | Wireless communication device using voltage switchable dielectric material |
| KR100918362B1 (ko) * | 2006-07-27 | 2009-09-22 | 주식회사 엘지화학 | 유기 박막 트랜지스터 및 이의 제조방법 |
| KR100852234B1 (ko) * | 2006-11-17 | 2008-08-13 | 삼성전자주식회사 | 금속 산화막의 형성 방법, 이를 이용한 게이트 구조물의제조 방법 및 커패시터의 제조 방법 |
| EP1935897B1 (de) * | 2006-12-22 | 2011-03-02 | L'AIR LIQUIDE, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Neue organische Rutheniumverbindung, Herstellungsverfahren dafür und Verwendung als Rutheniumvorläufer zur Herstellung von filmbeschichteten Metallelektroden auf Rutheniumbasis |
| US7754600B2 (en) * | 2007-03-01 | 2010-07-13 | Hewlett-Packard Development Company, L.P. | Methods of forming nanostructures on metal-silicide crystallites, and resulting structures and devices |
| KR20100017171A (ko) | 2007-05-21 | 2010-02-16 | 레르 리키드 쏘시에떼 아노님 뿌르 레드 에렉스뿔라따시옹 데 프로세데 조르즈 클로드 | 반도체 적용을 위한 신규 코발트 전구체 |
| US20090220771A1 (en) * | 2008-02-12 | 2009-09-03 | Robert Fleming | Voltage switchable dielectric material with superior physical properties for structural applications |
| DE102008029385B4 (de) * | 2008-06-23 | 2014-11-27 | Carl Von Ossietzky Universität Oldenburg | Verfahren zur Herstellung von Seltenerdmetalloxidschichten und Übergangsmetalloxidschichten, Verwendung einer Vorrichtung zur Herstellung von Seltenerdmetalloxidschichten und Übergangsmetalloxidschichten sowie Verwendung eines Metallnitrats |
| WO2011078399A1 (ja) * | 2009-12-25 | 2011-06-30 | 独立行政法人科学技術振興機構 | 結晶性コバルトシリサイド膜の形成方法 |
| CN103413758B (zh) * | 2013-07-17 | 2017-02-08 | 华为技术有限公司 | 半导体鳍条的制作方法、FinFET器件的制作方法 |
| WO2016040077A1 (en) * | 2014-09-14 | 2016-03-17 | Entergris, Inc. | Cobalt deposition selectivity on copper and dielectrics |
| JP2019500495A (ja) * | 2015-12-02 | 2019-01-10 | ビーエーエスエフ ソシエタス・ヨーロピアBasf Se | 薄い無機膜の生成方法 |
| US10787738B2 (en) | 2016-01-27 | 2020-09-29 | Basf Se | Process for the generation of thin inorganic films |
| KR102467795B1 (ko) * | 2016-08-31 | 2022-11-18 | 바스프 에스이 | 얇은 무기 필름의 생성 방법 |
| CN106684122B (zh) * | 2017-01-20 | 2020-04-24 | 京东方科技集团股份有限公司 | 导电层、薄膜晶体管及其制作方法、阵列基板和显示装置 |
| JP6980406B2 (ja) * | 2017-04-25 | 2021-12-15 | 株式会社日立ハイテク | 半導体製造装置及び半導体装置の製造方法 |
| KR102342124B1 (ko) | 2019-02-14 | 2021-12-22 | 주식회사 히타치하이테크 | 반도체 제조 장치 |
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| GB717269A (en) | 1951-04-09 | 1954-10-27 | Azfa Ag Fuer Photofabrikation | Magnetizable metal oxides |
| US3088361A (en) | 1958-11-28 | 1963-05-07 | Hallock Robert Lay | Driven fastener |
| US3290348A (en) * | 1963-04-25 | 1966-12-06 | Shell Oil Co | Cobalt (omicron) complexes of phosphorus esters |
| GB1135979A (en) * | 1965-06-11 | 1968-12-11 | Ici Ltd | Hydrogenation process |
| US4645849A (en) * | 1985-01-22 | 1987-02-24 | General Electric Company | Hydrogenation of unsaturated hydrocarbons with cyclometallated transition metal catalysts |
| US4814294A (en) | 1987-07-30 | 1989-03-21 | Allied-Signal Inc. | Method of growing cobalt silicide films by chemical vapor deposition |
| WO1990000260A1 (en) | 1988-06-30 | 1990-01-11 | Raynet Corporation | Optical fiber tap utilizing reflector and cammed closure |
| WO1992002574A1 (en) * | 1990-08-08 | 1992-02-20 | Exxon Chemical Patents Inc. | Processes for producing shaped foamable parts |
| TW209308B (en) * | 1992-03-02 | 1993-07-11 | Digital Equipment Corp | Self-aligned cobalt silicide on MOS integrated circuits |
| US5587651A (en) | 1994-11-21 | 1996-12-24 | General Electric Company | Alternating current sensor based on parallel-plate geometry and having a conductor for providing separate self-powering |
| JPH08202661A (ja) | 1995-01-31 | 1996-08-09 | Matsushita Electric Ind Co Ltd | 携帯端末装置 |
| US5605865A (en) | 1995-04-03 | 1997-02-25 | Motorola Inc. | Method for forming self-aligned silicide in a semiconductor device using vapor phase reaction |
| JPH1045416A (ja) | 1996-07-31 | 1998-02-17 | Sony Corp | コバルトシリサイド膜の形成方法 |
| US5851921A (en) | 1997-04-04 | 1998-12-22 | Advanced Micro Devices, Inc. | Semiconductor device and method for forming the device using a dual layer, self-aligned silicide to enhance contact performance |
| FR2765151A1 (fr) | 1997-06-26 | 1999-01-01 | Michelin & Cie | Armature de sommet pour pneumatique radial |
| KR100296117B1 (ko) | 1998-05-27 | 2001-10-26 | 윤덕용 | 화학기상증착법에의한코발트다이실리사이드콘택형성방법 |
| US6271131B1 (en) * | 1998-08-26 | 2001-08-07 | Micron Technology, Inc. | Methods for forming rhodium-containing layers such as platinum-rhodium barrier layers |
| US7255954B2 (en) * | 1998-08-27 | 2007-08-14 | Cabot Corporation | Energy devices |
| US6239028B1 (en) * | 1998-09-03 | 2001-05-29 | Micron Technology, Inc. | Methods for forming iridium-containing films on substrates |
| US6037001A (en) | 1998-09-18 | 2000-03-14 | Gelest, Inc. | Method for the chemical vapor deposition of copper-based films |
| JP2000281694A (ja) * | 1999-03-29 | 2000-10-10 | Tanaka Kikinzoku Kogyo Kk | 有機金属気相エピタキシー用の有機金属化合物 |
-
2001
- 2001-06-28 US US09/894,450 patent/US6777565B2/en not_active Expired - Lifetime
- 2001-06-29 AT AT01950811T patent/ATE323711T1/de not_active IP Right Cessation
- 2001-06-29 KR KR1020027017924A patent/KR100795324B1/ko not_active Expired - Fee Related
- 2001-06-29 CN CNB018121519A patent/CN100354286C/zh not_active Expired - Fee Related
- 2001-06-29 EP EP01950811A patent/EP1299404B1/de not_active Expired - Lifetime
- 2001-06-29 WO PCT/US2001/021050 patent/WO2002002574A1/en not_active Ceased
- 2001-06-29 AU AU2001271770A patent/AU2001271770A1/en not_active Abandoned
- 2001-06-29 DE DE60118925T patent/DE60118925T2/de not_active Expired - Fee Related
-
2002
- 2002-11-08 US US10/290,719 patent/US6753245B2/en not_active Expired - Fee Related
-
2004
- 2004-04-19 US US10/827,479 patent/US7507390B2/en not_active Expired - Fee Related
-
2008
- 2008-07-08 US US12/169,211 patent/US20080268151A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| US20040197470A1 (en) | 2004-10-07 |
| CN100354286C (zh) | 2007-12-12 |
| AU2001271770A1 (en) | 2002-01-14 |
| EP1299404B1 (de) | 2006-04-19 |
| US6753245B2 (en) | 2004-06-22 |
| KR100795324B1 (ko) | 2008-01-21 |
| WO2002002574A1 (en) | 2002-01-10 |
| DE60118925T2 (de) | 2006-12-21 |
| US20020015789A1 (en) | 2002-02-07 |
| US7507390B2 (en) | 2009-03-24 |
| CN1440417A (zh) | 2003-09-03 |
| US20030073860A1 (en) | 2003-04-17 |
| DE60118925D1 (de) | 2006-05-24 |
| KR20030028767A (ko) | 2003-04-10 |
| US20080268151A1 (en) | 2008-10-30 |
| US6777565B2 (en) | 2004-08-17 |
| EP1299404A1 (de) | 2003-04-09 |
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