ATE324610T1 - Vorrichtung und prozess zur probencharakterisierung - Google Patents

Vorrichtung und prozess zur probencharakterisierung

Info

Publication number
ATE324610T1
ATE324610T1 AT02782544T AT02782544T ATE324610T1 AT E324610 T1 ATE324610 T1 AT E324610T1 AT 02782544 T AT02782544 T AT 02782544T AT 02782544 T AT02782544 T AT 02782544T AT E324610 T1 ATE324610 T1 AT E324610T1
Authority
AT
Austria
Prior art keywords
sample
schlieren
phase
image
shifting
Prior art date
Application number
AT02782544T
Other languages
English (en)
Inventor
Luc Joannes
Original Assignee
Univ Bruxelles
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Bruxelles filed Critical Univ Bruxelles
Application granted granted Critical
Publication of ATE324610T1 publication Critical patent/ATE324610T1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/50—Optics for phase object visualisation
    • G02B27/54—Schlieren-optical systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G01N21/455—Schlieren methods, e.g. for gradient index determination; Shadowgraph

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
AT02782544T 2001-12-05 2002-12-05 Vorrichtung und prozess zur probencharakterisierung ATE324610T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP01870270 2001-12-05

Publications (1)

Publication Number Publication Date
ATE324610T1 true ATE324610T1 (de) 2006-05-15

Family

ID=8185064

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02782544T ATE324610T1 (de) 2001-12-05 2002-12-05 Vorrichtung und prozess zur probencharakterisierung

Country Status (7)

Country Link
US (1) US7206079B2 (de)
EP (1) EP1454183B1 (de)
AT (1) ATE324610T1 (de)
AU (1) AU2002347227A1 (de)
CA (1) CA2467901C (de)
DE (1) DE60211021T2 (de)
WO (1) WO2003048837A2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100818995B1 (ko) * 2006-03-23 2008-04-02 삼성전자주식회사 편광 측정 장치, 타원 분광기 및 빛의 편광 상태 측정 방법
US9329313B2 (en) * 2012-09-07 2016-05-03 Lockheed Martin Corporation System and method for photographing cylindrical or spherical objects with reduced glare
US9232117B2 (en) 2013-03-12 2016-01-05 Metrolaser, Inc. Digital Schlieren imaging
FR3062476B1 (fr) 2017-01-27 2020-12-25 Imagine Optic Methode d'evaluation de la qualite de la mesure d'un front d'onde et systemes mettant en œuvre une telle methode
JP6818702B2 (ja) * 2018-01-15 2021-01-20 株式会社東芝 光学検査装置及び光学検査方法
BE1027225B9 (fr) * 2019-04-24 2021-02-03 Lambda X Système de mesure par déflectométrie
US12196944B2 (en) 2020-01-09 2025-01-14 Kimball Electronics Indiana, Inc. Imaging system for leak detection
US11650151B2 (en) * 2020-10-08 2023-05-16 United States Of America As Represented By The Administrator Of Nasa Compact, self-aligned projection focusing schlieren method and system
CN113252663B (zh) * 2021-04-20 2025-06-03 北京航空航天大学 基于纹影法测量收敛-扩张管最佳膨胀比的装置及方法
FR3132947B1 (fr) 2022-02-21 2024-02-23 Imagine Optic Systèmes et procédés d’analyse de la qualité de surface d’une lame à faces parallèles
CN116678583B (zh) * 2023-01-12 2024-04-05 中国空气动力研究与发展中心设备设计与测试技术研究所 一种基于相位调制的纹影系统及其调节方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH326623A (de) * 1953-06-04 1957-12-31 Lkb Produkter Fabriksaktiebola Vorrichtung für Registrierung vom Verlauf des Brechungsindexes in rotierenden Zentrifugenzellen
US2998719A (en) * 1955-09-21 1961-09-05 Robert J Rubin Shock tube for studying warhead combination damage
US2977847A (en) * 1957-04-29 1961-04-04 Univ Ohio State Res Found Optical system for microscopes or similar instruments
US5515158A (en) * 1994-02-01 1996-05-07 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Retroreflection focusing schlieren system

Also Published As

Publication number Publication date
WO2003048837A2 (en) 2003-06-12
AU2002347227A1 (en) 2003-06-17
CA2467901A1 (en) 2003-06-12
DE60211021T2 (de) 2007-01-04
WO2003048837A3 (en) 2003-10-23
US20050036153A1 (en) 2005-02-17
DE60211021D1 (de) 2006-06-01
EP1454183A2 (de) 2004-09-08
AU2002347227A8 (en) 2003-06-17
EP1454183B1 (de) 2006-04-26
US7206079B2 (en) 2007-04-17
CA2467901C (en) 2011-02-01

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