ATE32477T1 - Programmierbarer signalanalysator. - Google Patents

Programmierbarer signalanalysator.

Info

Publication number
ATE32477T1
ATE32477T1 AT82304563T AT82304563T ATE32477T1 AT E32477 T1 ATE32477 T1 AT E32477T1 AT 82304563 T AT82304563 T AT 82304563T AT 82304563 T AT82304563 T AT 82304563T AT E32477 T1 ATE32477 T1 AT E32477T1
Authority
AT
Austria
Prior art keywords
signal analyzer
analog signal
programmable signal
ieee
effected
Prior art date
Application number
AT82304563T
Other languages
English (en)
Inventor
Albert A Star
John M Weick
Original Assignee
Grumman Aerospace Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Grumman Aerospace Corp filed Critical Grumman Aerospace Corp
Application granted granted Critical
Publication of ATE32477T1 publication Critical patent/ATE32477T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/08—Circuits for altering the measuring range
    • G01R15/09—Autoranging circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Color Television Systems (AREA)
  • Stereo-Broadcasting Methods (AREA)
AT82304563T 1981-09-08 1982-08-31 Programmierbarer signalanalysator. ATE32477T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/300,254 US4507740A (en) 1981-09-08 1981-09-08 Programmable signal analyzer
EP82304563A EP0074235B1 (de) 1981-09-08 1982-08-31 Programmierbarer Signalanalysator

Publications (1)

Publication Number Publication Date
ATE32477T1 true ATE32477T1 (de) 1988-02-15

Family

ID=23158328

Family Applications (1)

Application Number Title Priority Date Filing Date
AT82304563T ATE32477T1 (de) 1981-09-08 1982-08-31 Programmierbarer signalanalysator.

Country Status (8)

Country Link
US (1) US4507740A (de)
EP (1) EP0074235B1 (de)
JP (2) JPS5855764A (de)
AT (1) ATE32477T1 (de)
AU (1) AU556934B2 (de)
CA (1) CA1169153A (de)
DE (1) DE3278110D1 (de)
IL (1) IL66288A0 (de)

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US4678345A (en) * 1986-05-01 1987-07-07 Tektronix, Inc. Equivalent time pseudorandom sampling system
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IT1213486B (it) * 1986-08-29 1989-12-20 Gibertini Electtronica Srl Dispositivo circuitale a microprocessore per la visualizzazione continua di una scala di tipo analogico.
US4809189A (en) * 1986-10-09 1989-02-28 Tektronix, Inc. Equivalent time waveform data display
US4812996A (en) * 1986-11-26 1989-03-14 Tektronix, Inc. Signal viewing instrumentation control system
US4743844A (en) * 1986-12-19 1988-05-10 Tektronix, Inc. Self-adjusting oscilloscope
US4802098A (en) * 1987-04-03 1989-01-31 Tektronix, Inc. Digital bandpass oscilloscope
US4760329A (en) * 1987-04-23 1988-07-26 Grumman Aerospace Corporation Programmable tester with bubble memory
US5029116A (en) * 1987-12-17 1991-07-02 Hitachi Automobile Appliances Sales Company, Ltd. Oscilloscope operation supporting device
US4974181A (en) * 1988-04-15 1990-11-27 The United States Of America As Represented By The Adminstrator, Of The National Aeronautics And Space Administration Adaptive data acquisition multiplexing system and method
US5083288A (en) * 1989-02-24 1992-01-21 Arpad Somlyody Apparatus for configuring a remote process sensor and signal transmitter
US5144565A (en) * 1990-03-26 1992-09-01 K. J. Law Engineers, Inc. Measurement of metallurgical properties in ferromagnetic test parts
GB2252829B (en) * 1991-02-15 1994-10-19 Crystal Semiconductor Corp Method and apparatus for decreasing the interference and noise sensitivity of a ratiometric converter type of circuit
AU665182B2 (en) * 1991-02-28 1995-12-21 Associative Measurement Pty Ltd Scientific instrument emulator
ATE229671T1 (de) * 1991-02-28 2002-12-15 Ass Measurement Pty Ltd Wissenschaftliches emulatorgerät
FR2676819B1 (fr) * 1991-05-21 1994-07-08 Merlin Gerin Chaine de traitement de grandeurs de mesure pour controleur d'isolement numerique.
US5223788A (en) * 1991-09-12 1993-06-29 Grumman Aerospace Corporation Functional avionic core tester
US5630164A (en) * 1992-02-27 1997-05-13 Associative Measurements Pty. Ltd. Scientific instrument emulator having a computer and an analog signal interface for real-time signal processing
US5315706A (en) * 1992-05-27 1994-05-24 National Instruments Corporation High speed IEEE 488 bus interface system and method
US5550747A (en) * 1994-03-07 1996-08-27 Hewlett-Packard Company Unbounded marker for spectrum analysis
US5594663A (en) * 1995-01-23 1997-01-14 Hewlett-Packard Company Remote diagnostic tool
US5649129A (en) * 1995-06-07 1997-07-15 National Instruments Corporation GPIB system including controller and analyzer
US5959479A (en) * 1997-09-11 1999-09-28 Hewlett-Packard Company Sampling timebase system
US5965819A (en) * 1998-07-06 1999-10-12 Csi Technology Parallel processing in a vibration analyzer
US6775544B2 (en) 1999-06-03 2004-08-10 At&T Wireless Services, Inc. Automatic diagnostic for detection of interference in wireless communication system
TWI227329B (en) * 1999-09-25 2005-02-01 Advantest Corp Test language conversion method
US6697763B1 (en) * 1999-12-07 2004-02-24 Pei Electronics, Inc. Measurement module and system for monitoring the status of armored vehicle electronic components
US6665621B2 (en) * 2000-11-28 2003-12-16 Scientific Technologies Incorporated System and method for waveform processing
US6715112B2 (en) * 2000-11-29 2004-03-30 Agilent Technologies, Inc. Method and apparatus for displaying triggered waveform on an error performance analyzer
DE10124371A1 (de) * 2001-05-18 2002-11-21 Rohde & Schwarz Meßgerät mit über ein Blockdiagramm ansteuerbaren Funktionseinheiten
US20060075212A1 (en) * 2002-12-31 2006-04-06 Zeroplus Technology Co., Ltd. Programmable logic analyzer data analyzing method
CA2511394A1 (en) * 2002-12-31 2004-07-15 Ming-Gwo Cheng Programmable logic analyzer data analyzing method
US7457995B1 (en) * 2004-02-02 2008-11-25 Litepoint Corp. Method and apparatus for generating reference transmission signal for use in testing communications receivers
US8046183B2 (en) * 2008-03-04 2011-10-25 Tektronix, Inc. Pre-trigger and post-trigger acquisition for no dead time acquisition system
CN102043693B (zh) * 2009-10-19 2014-02-19 鸿富锦精密工业（深圳）有限公司 循环上电测试装置
KR102483371B1 (ko) * 2022-12-01 2022-12-30 (주)이랑텍 전자장비용 시험계측기 확장 장치 및 방법
US20250052788A1 (en) * 2023-08-09 2025-02-13 Stmicroelectronics International N.V. Systems, apparatuses, and methods for on chip dynamic ir drop oscilloscope

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JPS5547697A (en) * 1978-09-13 1980-04-04 Shigeji Kondo Aldehyde bisulfite adduct of peptide antibiotic k582m-a and its preparation
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Also Published As

Publication number Publication date
JPH0557673U (ja) 1993-07-30
JPS5855764A (ja) 1983-04-02
DE3278110D1 (en) 1988-03-17
AU556934B2 (en) 1986-11-27
US4507740A (en) 1985-03-26
EP0074235A1 (de) 1983-03-16
EP0074235B1 (de) 1988-02-10
AU8640882A (en) 1983-03-17
CA1169153A (en) 1984-06-12
IL66288A0 (en) 1982-11-30

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Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee