ATE332565T1 - Schnelle abtast- und halte spitzenwerkdetektorschaltung - Google Patents

Schnelle abtast- und halte spitzenwerkdetektorschaltung

Info

Publication number
ATE332565T1
ATE332565T1 AT02360224T AT02360224T ATE332565T1 AT E332565 T1 ATE332565 T1 AT E332565T1 AT 02360224 T AT02360224 T AT 02360224T AT 02360224 T AT02360224 T AT 02360224T AT E332565 T1 ATE332565 T1 AT E332565T1
Authority
AT
Austria
Prior art keywords
circuit
sample
hold
vpeak
hold circuit
Prior art date
Application number
AT02360224T
Other languages
English (en)
Inventor
Frank Ilchmann
Ralph Ballentin
Original Assignee
Cit Alcatel
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cit Alcatel filed Critical Cit Alcatel
Application granted granted Critical
Publication of ATE332565T1 publication Critical patent/ATE332565T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G11C27/024—Sample-and-hold arrangements using a capacitive memory element
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G11C27/024—Sample-and-hold arrangements using a capacitive memory element
    • G11C27/026—Sample-and-hold arrangements using a capacitive memory element associated with an amplifier

Landscapes

  • Measurement Of Current Or Voltage (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Spectrometry And Color Measurement (AREA)
AT02360224T 2002-07-26 2002-07-26 Schnelle abtast- und halte spitzenwerkdetektorschaltung ATE332565T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP02360224A EP1385174B1 (de) 2002-07-26 2002-07-26 Schnelle Abtast- und Halte Spitzenwerkdetektorschaltung

Publications (1)

Publication Number Publication Date
ATE332565T1 true ATE332565T1 (de) 2006-07-15

Family

ID=29797348

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02360224T ATE332565T1 (de) 2002-07-26 2002-07-26 Schnelle abtast- und halte spitzenwerkdetektorschaltung

Country Status (5)

Country Link
US (1) US6788115B2 (de)
EP (1) EP1385174B1 (de)
CN (1) CN1280637C (de)
AT (1) ATE332565T1 (de)
DE (1) DE60212958T2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6774617B2 (en) * 2000-11-28 2004-08-10 Texas Instruments Incorporated Peak detector for detecting a peak signal
JP2005252816A (ja) * 2004-03-05 2005-09-15 Sanyo Electric Co Ltd サンプルホールド回路
GB0421535D0 (en) * 2004-09-28 2004-10-27 Imp College Innovations Ltd Sample and hold circuits
US7342407B2 (en) * 2006-01-31 2008-03-11 Advantest Corporation Temperature compensation circuit and testing apparatus
GB2435694A (en) * 2006-03-03 2007-09-05 Toumaz Technology Ltd Peak voltage detector circuit
CN100505105C (zh) * 2006-12-07 2009-06-24 中国科学院半导体研究所 一种采样/保持电路装置
US8310277B2 (en) * 2009-08-27 2012-11-13 Qualcomm, Incorporated High linear fast peak detector
TWI415133B (zh) * 2009-09-04 2013-11-11 Nat Univ Tsing Hua 使用斜坡取樣法之峰值量測及保持電路及其方法
CN101847981B (zh) * 2010-04-12 2012-06-06 无锡中星微电子有限公司 多输入比较器和电源转换电路
CN102394630A (zh) * 2011-11-25 2012-03-28 浙江商业职业技术学院 一种用于开关电源的峰值采样保持电路及其方法
CN103207315B (zh) * 2012-01-11 2016-08-10 国民技术股份有限公司 单端幅度检测器以及单端幅度检测单元
EP3084771B1 (de) 2013-12-16 2020-04-15 Sondex Wireline Limited Spitzenhalteschaltung mit breitem temperaturbereich
CN105306020B (zh) * 2015-09-28 2017-11-07 南京航空航天大学 一种连续检测信号波峰的峰值保持电路
US9819313B2 (en) 2016-01-26 2017-11-14 Analog Devices, Inc. Envelope detectors with high input impedance
US11156644B2 (en) * 2019-01-03 2021-10-26 International Business Machines Corporation In situ probing of a discrete time analog circuit
CN111277251B (zh) * 2020-02-20 2023-03-14 西北工业大学 自触发供电控制的低功耗前端读出电路

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4038568A (en) * 1976-02-23 1977-07-26 The United States Of America As Represented By The Secretary Of The Air Force Pulse peak sample and hold circuit
JPS58122698A (ja) * 1982-01-14 1983-07-21 Sony Corp サンプルホ−ルド回路
GB2253960B (en) * 1991-02-21 1995-02-15 Gen Electric Co Ltd A duo-binary and/or binary data slicer
JPH10191101A (ja) * 1996-12-25 1998-07-21 Mitsubishi Electric Corp 映像信号用クランプ回路および複合映像信号合成回路
JPH10188589A (ja) * 1996-12-26 1998-07-21 Canon Inc サンプル・ホールド回路
DE19804379A1 (de) * 1997-02-05 1998-08-06 Denso Corp Abtast- und Haltekreis
JP3364406B2 (ja) * 1997-03-24 2003-01-08 株式会社東芝 ピークホールド回路
US5986481A (en) * 1997-03-24 1999-11-16 Kabushiki Kaisha Toshiba Peak hold circuit including a constant voltage generator
US6028459A (en) * 1998-04-20 2000-02-22 National Semiconductor Corporation Track and hold circuit with clamp
EP1198798B1 (de) * 2000-03-28 2009-11-25 Nxp B.V. Abtast- und halteverstärker mit kontrollierbarer rückkopplung zwischen haltekapazitat und eingangspuffer

Also Published As

Publication number Publication date
DE60212958D1 (de) 2006-08-17
US20040027174A1 (en) 2004-02-12
CN1280637C (zh) 2006-10-18
EP1385174A1 (de) 2004-01-28
CN1472539A (zh) 2004-02-04
DE60212958T2 (de) 2006-12-28
EP1385174B1 (de) 2006-07-05
US6788115B2 (en) 2004-09-07

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Legal Events

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