ATE343804T1 - Laserproduktion und produktqualifikation über beschleunigte lebensdauerprüfung auf der basis statistischer modellierung - Google Patents

Laserproduktion und produktqualifikation über beschleunigte lebensdauerprüfung auf der basis statistischer modellierung

Info

Publication number
ATE343804T1
ATE343804T1 AT03760218T AT03760218T ATE343804T1 AT E343804 T1 ATE343804 T1 AT E343804T1 AT 03760218 T AT03760218 T AT 03760218T AT 03760218 T AT03760218 T AT 03760218T AT E343804 T1 ATE343804 T1 AT E343804T1
Authority
AT
Austria
Prior art keywords
product qualification
statistical modeling
testing based
accelerated lifetime
laser production
Prior art date
Application number
AT03760218T
Other languages
English (en)
Inventor
Song Miao
Chun Lei
Raj Cornelius
Alex Klajic
Original Assignee
Finisar Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Finisar Corp filed Critical Finisar Corp
Application granted granted Critical
Publication of ATE343804T1 publication Critical patent/ATE343804T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/0014—Measuring characteristics or properties thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Laser Beam Processing (AREA)
  • Glass Compositions (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Laser Surgery Devices (AREA)
AT03760218T 2002-05-20 2003-05-20 Laserproduktion und produktqualifikation über beschleunigte lebensdauerprüfung auf der basis statistischer modellierung ATE343804T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US38242302P 2002-05-20 2002-05-20
US10/440,743 US6977517B2 (en) 2002-05-20 2003-05-19 Laser production and product qualification via accelerated life testing based on statistical modeling

Publications (1)

Publication Number Publication Date
ATE343804T1 true ATE343804T1 (de) 2006-11-15

Family

ID=29739819

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03760218T ATE343804T1 (de) 2002-05-20 2003-05-20 Laserproduktion und produktqualifikation über beschleunigte lebensdauerprüfung auf der basis statistischer modellierung

Country Status (6)

Country Link
US (2) US6977517B2 (de)
EP (1) EP1509796B1 (de)
AT (1) ATE343804T1 (de)
AU (1) AU2003231798A1 (de)
DE (1) DE60309315T2 (de)
WO (1) WO2003107059A1 (de)

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US7486894B2 (en) 2002-06-25 2009-02-03 Finisar Corporation Transceiver module and integrated circuit with dual eye openers
US7561855B2 (en) * 2002-06-25 2009-07-14 Finisar Corporation Transceiver module and integrated circuit with clock and data recovery clock diplexing
US7809275B2 (en) * 2002-06-25 2010-10-05 Finisar Corporation XFP transceiver with 8.5G CDR bypass
US7127371B2 (en) * 2003-10-08 2006-10-24 Ge Medical Systems Information Customized medical equipment preventative maintenance method and system
US7338818B2 (en) * 2005-05-19 2008-03-04 International Business Machines Corporation Systems and arrangements to assess thermal performance
US7458058B2 (en) * 2005-06-10 2008-11-25 Texas Instruments Incorporated Verifying a process margin of a mask pattern using intermediate stage models
US9104650B2 (en) 2005-07-11 2015-08-11 Brooks Automation, Inc. Intelligent condition monitoring and fault diagnostic system for preventative maintenance
CN101263499B (zh) 2005-07-11 2013-03-27 布鲁克斯自动化公司 智能状态监测和故障诊断系统
US7565266B2 (en) * 2006-02-14 2009-07-21 Seagate Technology, Llc Web-based system of product performance assessment and quality control using adaptive PDF fitting
JP2007250799A (ja) * 2006-03-15 2007-09-27 Eudyna Devices Inc 半導体レーザの製造方法
US8085824B2 (en) * 2007-05-31 2011-12-27 Finisar Corporation Optimization of laser parameters to achieve desired performance
FR2929728B1 (fr) * 2008-04-02 2011-01-14 Eads Europ Aeronautic Defence Procede de determination du pronostic de fonctionnement d'un systeme.
US8260556B2 (en) * 2008-08-21 2012-09-04 Bio-Rad Laboratories, Inc. Calibration surface method for determination on of analyte ratios
CN102023636B (zh) * 2010-12-03 2012-07-25 浙江理工大学 一种机床数控系统的加速寿命试验方法
US8452439B2 (en) * 2011-03-15 2013-05-28 Taiwan Semiconductor Manufacturing Co., Ltd. Device performance parmeter tuning method and system
US9880892B2 (en) * 2014-02-24 2018-01-30 International Business Machines Corporation System and method for managing semiconductor manufacturing defects
CN103940585B (zh) * 2014-04-16 2016-08-17 桂林电子科技大学 基于多水平步降应力的led照明产品加速衰减试验的方法
CN103940586B (zh) * 2014-04-24 2016-08-24 工业和信息化部电子第五研究所 中红外固体激光器的寿命检测方法
CN104657614B (zh) * 2015-02-28 2018-02-02 卢申林 一种产品现场失效率的计算方法
CN105913166B (zh) * 2016-03-28 2020-03-17 航天科工防御技术研究试验中心 一种机电整机产品贮存寿命试验加速因子评估方法
KR20200097289A (ko) 2017-12-10 2020-08-18 루머스 리미티드 이미지 프로젝터
CN108182311B (zh) * 2017-12-25 2021-02-26 北京航天晨信科技有限责任公司 一种基于加速寿命试验的指挥通信设备可靠性评估方法
CN108333209B (zh) * 2018-02-28 2020-04-28 中国电子科技集团公司第十三研究所 一种GaN HEMT加速寿命试验方法
CN109492253B (zh) * 2018-10-09 2023-06-30 北京圣涛平试验工程技术研究院有限责任公司 半导体器件的辐射损伤可靠性评估方法及装置
CN113055086A (zh) * 2019-12-26 2021-06-29 中兴通讯股份有限公司 光模块老化测试装置
CN113343463B (zh) * 2021-06-08 2022-04-29 西南交通大学 考虑老化进程的地铁牵引整流器二极管剩余寿命预测方法
KR102664970B1 (ko) * 2021-11-03 2024-05-10 아주대학교산학협력단 포토 커플러 수명 예측 방법
CN114325463B (zh) * 2021-11-26 2024-06-04 神龙汽车有限公司 一种车灯耐久性试验时长确定方法
CN116804697A (zh) * 2023-06-25 2023-09-26 武汉敏芯半导体股份有限公司 激光器芯片的老化条件获取方法、系统及芯片筛选方法
WO2025191627A1 (ja) * 2024-03-11 2025-09-18 三菱電機株式会社 予測装置、予測方法およびプログラム

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US20030074173A1 (en) 2001-10-17 2003-04-17 Intel Corporation Technique for defining probabilistic reliability test requirements

Also Published As

Publication number Publication date
US20050218925A1 (en) 2005-10-06
AU2003231798A1 (en) 2003-12-31
DE60309315T2 (de) 2007-08-30
US20040023422A1 (en) 2004-02-05
WO2003107059A1 (en) 2003-12-24
EP1509796B1 (de) 2006-10-25
DE60309315D1 (de) 2006-12-07
EP1509796A1 (de) 2005-03-02
EP1509796A4 (de) 2005-11-16
US7019548B2 (en) 2006-03-28
US6977517B2 (en) 2005-12-20

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