ATE357739T1 - Testträgerplatte auf platinenebene mit laminiertem aufbau - Google Patents

Testträgerplatte auf platinenebene mit laminiertem aufbau

Info

Publication number
ATE357739T1
ATE357739T1 AT02077788T AT02077788T ATE357739T1 AT E357739 T1 ATE357739 T1 AT E357739T1 AT 02077788 T AT02077788 T AT 02077788T AT 02077788 T AT02077788 T AT 02077788T AT E357739 T1 ATE357739 T1 AT E357739T1
Authority
AT
Austria
Prior art keywords
board
laminated structure
test carrier
level
carrier board
Prior art date
Application number
AT02077788T
Other languages
English (en)
Inventor
Michael John Adams
William H Howland Jr
William J Alexander
Original Assignee
Solid State Measurements Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Solid State Measurements Inc filed Critical Solid State Measurements Inc
Application granted granted Critical
Publication of ATE357739T1 publication Critical patent/ATE357739T1/de

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Road Paving Structures (AREA)
AT02077788T 2001-07-10 2002-07-10 Testträgerplatte auf platinenebene mit laminiertem aufbau ATE357739T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US30432501P 2001-07-10 2001-07-10
US10/139,685 US6803780B2 (en) 2001-07-10 2002-05-03 Sample chuck with compound construction

Publications (1)

Publication Number Publication Date
ATE357739T1 true ATE357739T1 (de) 2007-04-15

Family

ID=26837462

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02077788T ATE357739T1 (de) 2001-07-10 2002-07-10 Testträgerplatte auf platinenebene mit laminiertem aufbau

Country Status (6)

Country Link
US (1) US6803780B2 (de)
EP (1) EP1276145B1 (de)
JP (1) JP2003077990A (de)
AT (1) ATE357739T1 (de)
DE (1) DE60218938T2 (de)
TW (1) TW559972B (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4107643B2 (ja) * 2002-07-23 2008-06-25 日本碍子株式会社 接合体の製造方法
US7934417B2 (en) 2004-02-20 2011-05-03 Markus Hund Scanning probe microscope
US7327439B2 (en) * 2004-11-16 2008-02-05 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
DE102011117869A1 (de) * 2011-11-08 2013-05-08 Centrotherm Thermal Solutions Gmbh & Co. Kg Vorrichtung zum Ansaugen eines Substrats und Vorrichtung zum thermischen Behandeln von Substraten
WO2015095857A2 (en) * 2013-12-22 2015-06-25 Lehighton Electronics, Inc. System and method for noncontact sensing maximum open circuit voltage of photovoltaic semiconductors
CN109494181B (zh) * 2018-11-12 2020-11-20 中国科学院长春光学精密机械与物理研究所 一种微型芯片转移吸嘴的制造工艺
JP7379171B2 (ja) * 2020-01-08 2023-11-14 日本特殊陶業株式会社 保持装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6099538A (ja) * 1983-11-01 1985-06-03 横河・ヒュ−レット・パッカ−ド株式会社 ピンチヤツク
DE69133413D1 (de) * 1990-05-07 2004-10-21 Canon Kk Substratträger des Vakuumtyps
US5798286A (en) * 1995-09-22 1998-08-25 Tessera, Inc. Connecting multiple microelectronic elements with lead deformation
JP2001168155A (ja) * 1999-12-07 2001-06-22 Ibiden Co Ltd ウエハプローバ

Also Published As

Publication number Publication date
JP2003077990A (ja) 2003-03-14
US20030011392A1 (en) 2003-01-16
US6803780B2 (en) 2004-10-12
DE60218938T2 (de) 2007-12-06
EP1276145B1 (de) 2007-03-21
DE60218938D1 (de) 2007-05-03
EP1276145A3 (de) 2005-03-23
TW559972B (en) 2003-11-01
EP1276145A2 (de) 2003-01-15

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Legal Events

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