ATE364844T1 - Testkopfpositionierungsvorrichtung - Google Patents

Testkopfpositionierungsvorrichtung

Info

Publication number
ATE364844T1
ATE364844T1 AT02807885T AT02807885T ATE364844T1 AT E364844 T1 ATE364844 T1 AT E364844T1 AT 02807885 T AT02807885 T AT 02807885T AT 02807885 T AT02807885 T AT 02807885T AT E364844 T1 ATE364844 T1 AT E364844T1
Authority
AT
Austria
Prior art keywords
outer cylinder
test head
positioning apparatus
piston
positioning
Prior art date
Application number
AT02807885T
Other languages
English (en)
Inventor
Christian Mueller
Original Assignee
Intest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intest Corp filed Critical Intest Corp
Application granted granted Critical
Publication of ATE364844T1 publication Critical patent/ATE364844T1/de

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q1/00—Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
    • B23Q1/25—Movable or adjustable work or tool supports
    • B23Q1/26—Movable or adjustable work or tool supports characterised by constructional features relating to the co-operation of relatively movable members; Means for preventing relative movement of such members
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00—Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • B23Q11/001—Arrangements compensating weight or flexion on parts of the machine
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J18/00—Arms
    • B25J18/02—Arms extensible
    • B25J18/025—Arms extensible telescopic
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J19/00—Accessories fitted to manipulators, e.g. for monitoring, for viewing; Safety devices combined with or specially adapted for use in connection with manipulators
    • B25J19/0008—Balancing devices
    • B25J19/0012—Balancing devices using fluidic devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J19/00—Accessories fitted to manipulators, e.g. for monitoring, for viewing; Safety devices combined with or specially adapted for use in connection with manipulators
    • B25J19/0008—Balancing devices
    • B25J19/002—Balancing devices using counterweights
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T74/00—Machine element or mechanism
    • Y10T74/20—Control lever and linkage systems
    • Y10T74/20207—Multiple controlling elements for single controlled element
    • Y10T74/20305—Robotic arm

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Robotics (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Body Structure For Vehicles (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Supporting Of Heads In Record-Carrier Devices (AREA)
  • Die Bonding (AREA)
AT02807885T 2002-10-02 2002-10-02 Testkopfpositionierungsvorrichtung ATE364844T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/IB2002/004064 WO2004031782A1 (en) 2002-10-02 2002-10-02 Test head positioning apparatus

Publications (1)

Publication Number Publication Date
ATE364844T1 true ATE364844T1 (de) 2007-07-15

Family

ID=32051167

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02807885T ATE364844T1 (de) 2002-10-02 2002-10-02 Testkopfpositionierungsvorrichtung

Country Status (9)

Country Link
US (1) US20060156850A1 (de)
EP (1) EP1549961B1 (de)
JP (1) JP4511354B2 (de)
CN (1) CN100383534C (de)
AT (1) ATE364844T1 (de)
AU (1) AU2002368253A1 (de)
DE (1) DE60220729T2 (de)
HK (1) HK1078135B (de)
WO (1) WO2004031782A1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MY127154A (en) * 2000-09-22 2006-11-30 Intest Corp Apparatus and method for balancing and for providing a compliant range to a test head
JP4336831B2 (ja) * 2004-11-24 2009-09-30 東芝機械株式会社 産業用ロボット
WO2008085463A1 (en) 2006-12-29 2008-07-17 In Test Corporation Test head positioning system and method
TWI490513B (zh) * 2006-12-29 2015-07-01 Intest Corp 用於使負載沿平移軸線平移之負載定位系統以及使負載達到平衡之方法
DE102007011700B4 (de) * 2007-03-09 2009-03-26 Hubertus Heigl Handhabungsvorrichtung zum Positionieren eines Testkopfs, insbesondere an einer Prüfeinrichtung
DE102007027698B4 (de) * 2007-06-15 2011-06-22 Airbus Operations GmbH, 21129 Dualer Linear-Aktuator
US7677129B2 (en) * 2007-09-28 2010-03-16 Intuitive Surgical, Inc. Multiaxis counterbalance and positioning system using a spatial linkage
US8212578B1 (en) 2008-03-17 2012-07-03 Intest Corporation Test head positioner system
US8981807B2 (en) 2010-07-27 2015-03-17 Intest Corporation Positioner system and method of positioning
KR101174276B1 (ko) 2010-12-28 2012-08-16 (주)피엔티 패키지 분류 장치
US8943892B2 (en) * 2012-05-11 2015-02-03 The Boeing Company Automated inspection of spar web in hollow monolithic structure
CN103777675B (zh) * 2012-10-24 2015-07-01 亿和精密工业（苏州）有限公司 一种定位调整装置
KR101644329B1 (ko) * 2015-12-30 2016-08-02 (주) 네스텍코리아 전자부품 테스트용 자동 소켓
CN107478968A (zh) * 2017-08-07 2017-12-15 纳恩博（天津）科技有限公司 检测工装
US10962590B2 (en) * 2017-12-27 2021-03-30 Spin Memory, Inc. Magnet mounting apparatus for MTJ device testers
US20240227208A9 (en) * 2022-10-19 2024-07-11 Advantest Corporation Magnetically retained replaceable cylinder component for pick-and-place test head unit

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1554101A (en) * 1975-07-09 1979-10-17 Herbert Ltd A Pressure fluid operated feed drive system for a movable member
US4527942A (en) * 1982-08-25 1985-07-09 Intest Corporation Electronic test head positioner for test systems
US4705447A (en) * 1983-08-11 1987-11-10 Intest Corporation Electronic test head positioner for test systems
US5149029A (en) * 1982-08-25 1992-09-22 Intest Corporation Electronic test head positioner for test systems
DE3617741A1 (de) * 1986-05-27 1987-12-03 Heigl Helmuth Handhabungsvorrichtung
US6057695A (en) * 1993-09-15 2000-05-02 Intest Corporation Method and apparatus for automated docking of a test head to a device handler
JP3347844B2 (ja) * 1993-10-12 2002-11-20 エスエムシー株式会社 バランサ
JPH07217607A (ja) * 1994-02-03 1995-08-15 Smc Corp 負荷の位置決め装置
JP3869465B2 (ja) * 1995-02-23 2007-01-17 テラダイン・インコーポレーテッド 自動テスト装置のテストヘッド用マニピュレータ
JP4319709B2 (ja) * 1997-07-25 2009-08-26 株式会社アドバンテスト 半導体デバイス試験装置のテストヘッド位置決め装置
US6271657B1 (en) * 1997-07-25 2001-08-07 Advantest Corporation Test head positioner for semiconductor device testing apparatus
AU2964400A (en) * 1999-01-13 2000-08-01 Intest Ip Corp. Test head manipulator
EP1200842B1 (de) * 1999-07-14 2003-10-29 Teradyne, Inc. Manipulator für eine automatische testeinrichtung mit innerhalb des testkopfs befindlicher stütze
MY144519A (en) * 2000-03-01 2011-09-30 Intest Corp Vertical counter balanced test head manipulator
MY127154A (en) * 2000-09-22 2006-11-30 Intest Corp Apparatus and method for balancing and for providing a compliant range to a test head

Also Published As

Publication number Publication date
HK1078135B (en) 2007-12-21
JP2006501464A (ja) 2006-01-12
HK1086885A1 (zh) 2006-09-29
DE60220729D1 (de) 2007-07-26
CN1708693A (zh) 2005-12-14
US20060156850A1 (en) 2006-07-20
AU2002368253A1 (en) 2004-04-23
WO2004031782A1 (en) 2004-04-15
EP1549961A1 (de) 2005-07-06
EP1549961B1 (de) 2007-06-13
HK1078135A1 (en) 2006-03-03
JP4511354B2 (ja) 2010-07-28
DE60220729T2 (de) 2008-02-14
CN100383534C (zh) 2008-04-23

Similar Documents

Publication Publication Date Title
DE60220729D1 (de) Testkopfpositionierungsvorrichtung
CN103292974B (zh) 椅柜桌床屏风静载荷、稳定性、冲击试验机
DE60314503D1 (de) Filtervorrichtung
MY126895A (en) Contact arm and electronic device testing apparatus using the same
EP1742469A3 (de) Stützgerät für Anzeigevorrichtung
ATE550285T1 (de) Krananordnung
DE60037293D1 (de) Fühlerprobe mit Vorrichtung für konstanten Druck
EP2533061A3 (de) Vertikels Prüfkopfstützsystem
ATE464508T1 (de) Projektor
CN103529373A (zh) Oled缺陷检测装置
TW200738993A (en) Adjustable height support apparatus and display with the same
DE602004030768D1 (de) Handgelenk zum anbringen eines testkopfes
CN203732239U (zh) 一种背光模组检测治具
EP1754926A3 (de) Geräteträger
DE50303579D1 (de) Vorrichtung zum hoehen- und neigungsausgleich
CN105066849B (zh) 岩体结构面摩擦角测量装置
MY136680A (en) Test head positioning apparatus
CN104608122A (zh) 一种缸盖抓取装置
ATE470645T1 (de) Hubgerät
ATE432054T1 (de) Vorrichtung zur entfernung von zahnapplikationen wie brackets
ATE433041T1 (de) Bodenbearbeitungsgerät
CN105960126A (zh) 一种新型减震智能电力电气柜
CN206878776U (zh) 一种带有光照的pid测试装置
CN218444844U (zh) 一种新型双向同步拉伸测试仪
CN222416708U (zh) 一种用于地铁隧道施工自动化监测的可调式支架

Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification

Ref document number: 1549961

Country of ref document: EP

REN Ceased due to non-payment of the annual fee