ATE368958T1 - Unterspannungsdetektor - Google Patents

Unterspannungsdetektor

Info

Publication number
ATE368958T1
ATE368958T1 AT04733898T AT04733898T ATE368958T1 AT E368958 T1 ATE368958 T1 AT E368958T1 AT 04733898 T AT04733898 T AT 04733898T AT 04733898 T AT04733898 T AT 04733898T AT E368958 T1 ATE368958 T1 AT E368958T1
Authority
AT
Austria
Prior art keywords
absolute temperature
voltage reference
voltage
supply voltage
varies
Prior art date
Application number
AT04733898T
Other languages
English (en)
Inventor
David Gubbins
Original Assignee
Analog Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analog Devices Inc filed Critical Analog Devices Inc
Application granted granted Critical
Publication of ATE368958T1 publication Critical patent/ATE368958T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature
    • H03K17/145—Modifications for compensating variations of physical values, e.g. of temperature in field-effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/22—Modifications for ensuring a predetermined initial state when the supply voltage has been applied
    • H03K17/223—Modifications for ensuring a predetermined initial state when the supply voltage has been applied in field-effect transistor switches

Landscapes

  • Measurement Of Current Or Voltage (AREA)
  • Electronic Switches (AREA)
  • Burglar Alarm Systems (AREA)
AT04733898T 2003-06-02 2004-05-19 Unterspannungsdetektor ATE368958T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/452,856 US6894544B2 (en) 2003-06-02 2003-06-02 Brown-out detector

Publications (1)

Publication Number Publication Date
ATE368958T1 true ATE368958T1 (de) 2007-08-15

Family

ID=33452080

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04733898T ATE368958T1 (de) 2003-06-02 2004-05-19 Unterspannungsdetektor

Country Status (6)

Country Link
US (1) US6894544B2 (de)
EP (1) EP1629599B1 (de)
CN (1) CN100423450C (de)
AT (1) ATE368958T1 (de)
DE (1) DE602004007915T2 (de)
WO (1) WO2004107577A1 (de)

Families Citing this family (49)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7543253B2 (en) * 2003-10-07 2009-06-02 Analog Devices, Inc. Method and apparatus for compensating for temperature drift in semiconductor processes and circuitry
KR100605594B1 (ko) * 2003-10-31 2006-07-28 주식회사 하이닉스반도체 파워업신호 발생 장치
US7113025B2 (en) * 2004-04-16 2006-09-26 Raum Technology Corp. Low-voltage bandgap voltage reference circuit
US7420397B2 (en) * 2004-06-02 2008-09-02 Stmicroelectronics Sa Low-consumption inhibit circuit with hysteresis
US20060161794A1 (en) * 2005-01-18 2006-07-20 Dell Products L.P. Prioritizing power throttling in an information handling system
US7667533B1 (en) * 2005-11-16 2010-02-23 Marvell International Ltd. Self biased low noise high PSRR constant GM for VCO
US8207777B1 (en) * 2005-11-21 2012-06-26 Analog Devices, Inc. Compensation with ratiometric attenuation
US8164377B1 (en) 2005-11-21 2012-04-24 Analog Devices, Inc. Signal dependent compensation with matched detectors
TW200734448A (en) * 2006-02-03 2007-09-16 Advanced Tech Materials Low pH post-CMP residue removal composition and method of use
US7274999B1 (en) * 2006-03-10 2007-09-25 Atmel Corporation Brownout detector system and method
JP4893931B2 (ja) * 2006-05-19 2012-03-07 オムロン株式会社 セーフティ・コントローラ
US7579898B2 (en) * 2006-07-31 2009-08-25 Freescale Semiconductor, Inc. Temperature sensor device and methods thereof
US8102201B2 (en) 2006-09-25 2012-01-24 Analog Devices, Inc. Reference circuit and method for providing a reference
US7576598B2 (en) * 2006-09-25 2009-08-18 Analog Devices, Inc. Bandgap voltage reference and method for providing same
US7772894B2 (en) * 2006-11-13 2010-08-10 Atmel Corporation Method for providing a power on reset signal with a quadratic current compared to an exponential current
US7777537B2 (en) * 2006-11-13 2010-08-17 Atmel Corporation Method for providing a power on reset signal with a logarithmic current compared with a quadratic current
US7714563B2 (en) * 2007-03-13 2010-05-11 Analog Devices, Inc. Low noise voltage reference circuit
US20080265860A1 (en) * 2007-04-30 2008-10-30 Analog Devices, Inc. Low voltage bandgap reference source
US7605578B2 (en) 2007-07-23 2009-10-20 Analog Devices, Inc. Low noise bandgap voltage reference
US7840916B2 (en) * 2007-11-19 2010-11-23 International Business Machines Corporation Structure for on-chip electromigration monitoring system
US7612606B2 (en) * 2007-12-21 2009-11-03 Analog Devices, Inc. Low voltage current and voltage generator
US7598799B2 (en) * 2007-12-21 2009-10-06 Analog Devices, Inc. Bandgap voltage reference circuit
US7957111B2 (en) * 2008-02-15 2011-06-07 Analog Devices, Inc. Differential current output driver with overvoltage protection
US7880533B2 (en) * 2008-03-25 2011-02-01 Analog Devices, Inc. Bandgap voltage reference circuit
US7902912B2 (en) * 2008-03-25 2011-03-08 Analog Devices, Inc. Bias current generator
US7750728B2 (en) * 2008-03-25 2010-07-06 Analog Devices, Inc. Reference voltage circuit
TWI370902B (en) * 2008-08-08 2012-08-21 Novatek Microelectronics Corp Voltage detecting circuit and voltage detecting method
US8228100B2 (en) * 2010-01-26 2012-07-24 Freescale Semiconductor, Inc. Data processing system having brown-out detection circuit
US8451047B2 (en) * 2011-05-17 2013-05-28 Issc Technologies Corp. Circuit used for indicating process corner and extreme temperature
US9461562B1 (en) 2012-02-24 2016-10-04 Cypress Semiconductor Corporation Low voltage detector
KR20140079008A (ko) * 2012-12-18 2014-06-26 삼성전기주식회사 파워 온 리셋 회로
US9632521B2 (en) 2013-03-13 2017-04-25 Analog Devices Global Voltage generator, a method of generating a voltage and a power-up reset circuit
US9525407B2 (en) * 2013-03-13 2016-12-20 Analog Devices Global Power monitoring circuit, and a power up reset generator
CN103869865B (zh) * 2014-03-28 2015-05-13 中国电子科技集团公司第二十四研究所 温度补偿带隙基准电路
CN105445529B (zh) * 2014-07-28 2018-06-15 无锡华润上华科技有限公司 具有时序控制功能的掉电检测电路
US9634653B2 (en) * 2014-12-11 2017-04-25 Texas Instruments Incorporated Method and apparatus for a brown out detector
US10191527B2 (en) * 2015-05-14 2019-01-29 Arm Limited Brown-out detector
EP3176669B1 (de) * 2015-11-30 2019-01-09 Commissariat A L'energie Atomique Et Aux Energies Alternatives Schaltkreis zur erzeugung einer referenzspannung
CN107664711B (zh) * 2017-09-01 2019-12-13 新茂国际科技股份有限公司 掉电侦测器
US10651840B2 (en) 2018-04-16 2020-05-12 Analog Devices Global Unlimited Company Low quiescent current power on reset circuit
US10613561B1 (en) 2018-10-30 2020-04-07 Nxp Usa, Inc. Device and method for calibrating a voltage regulator
CN110308317B (zh) * 2019-07-26 2022-01-14 上海华虹宏力半导体制造有限公司 一种bod电路
KR102735222B1 (ko) 2020-01-30 2024-11-27 삼성전자주식회사 구동 전압 감지 회로, 이를 포함하는 전자 장치 및 전자 시스템
CN111953330A (zh) * 2020-08-31 2020-11-17 上海天俣可信物联网科技有限公司 一种与温度无关的低功耗上电复位电路
US11296692B1 (en) * 2021-04-30 2022-04-05 Nxp B.V. Power-on reset circuit
CN114629477B (zh) * 2022-04-02 2024-08-16 北京中科芯蕊科技有限公司 一种高精度低功耗的上电复位电路
CN114839425B (zh) * 2022-06-29 2022-10-14 圣邦微电子（北京）股份有限公司 欠压检测器及包含该欠压检测器的电源系统
US12553924B2 (en) 2023-03-03 2026-02-17 Analog Devices International Unlimited Company Low power and high accuracy voltage monitor with built-in reference
US12282047B2 (en) 2023-03-03 2025-04-22 Analog Devices International Unlimited Company Low power and high accuracy voltage monitor with built-in reference

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4961102A (en) * 1982-01-04 1990-10-02 Shideler Jay A Junction programmable vertical transistor with high performance transistor
US4701639A (en) * 1985-12-09 1987-10-20 National Semiconductor Corporation Threshold detector circuit and method
EP0360884A1 (de) * 1988-09-26 1990-04-04 Siemens Aktiengesellschaft CMOS-Differentialkomparator mit Offsetspannung
US5144159A (en) * 1990-11-26 1992-09-01 Delco Electronics Corporation Power-on-reset (POR) circuit having power supply rise time independence
US5324996A (en) * 1993-02-16 1994-06-28 Ast Research, Inc. Floating fault tolerant input buffer circuit
US5959477A (en) * 1998-06-02 1999-09-28 Advanced Micro Devices, Inc. Precision power-on reset circuit
US6239630B1 (en) * 1999-07-23 2001-05-29 Analog Devices Inc CMOS-compatible power-on reset circuit
US6437614B1 (en) * 2001-05-24 2002-08-20 Sunplus Technology Co., Ltd. Low voltage reset circuit device that is not influenced by temperature and manufacturing process
US6686783B1 (en) * 2002-10-28 2004-02-03 Analog Devices, Inc. Power-on reset system

Also Published As

Publication number Publication date
CN100423450C (zh) 2008-10-01
DE602004007915D1 (de) 2007-09-13
US6894544B2 (en) 2005-05-17
US20040239413A1 (en) 2004-12-02
WO2004107577A1 (en) 2004-12-09
EP1629599A1 (de) 2006-03-01
DE602004007915T2 (de) 2008-04-24
EP1629599B1 (de) 2007-08-01
CN1799197A (zh) 2006-07-05

Similar Documents

Publication Publication Date Title
ATE368958T1 (de) Unterspannungsdetektor
US9083181B2 (en) Over-current protection circuit for light source driving module and related backlight module
US9461455B2 (en) Protecting circuit
US8829952B2 (en) Gate drive circuit
US20140085756A1 (en) Protection circuit and electronic device using the same
US9742387B2 (en) Voltage comparator
US20110181339A1 (en) Level shift circuit
TW201742357A (zh) 功率開關電路及所應用的電源電路
TW201535908A (zh) 電子裝置及其充電保護電路
TW200640132A (en) Delay circuit and ring oscillator
TW200610268A (en) Level shifter and method thereof
US10298119B2 (en) Scalable protection voltage generation
TW200419900A (en) Internal power-on reset circuit and method for low-voltage chip
US7863944B2 (en) Passive clock detector
US9312754B2 (en) Power supply apparatus with reducing voltage overshooting
CN203840596U (zh) 一种纹波电流抑制电路和led电路
US9503071B2 (en) Circuit for providing dummy load
CN103889121B (zh) 一种纹波电流抑制电路
CN107147284A (zh) 一种保护电路及供电系统
TW200513036A (en) Delay stage insensitive to operating voltage and delay circuit including the same
TW200624845A (en) Low voltage detection circuit
AU2003201054A1 (en) Circuits with improved power supply rejection
TWI585566B (zh) 直流電源控制系統及電路
US9490622B2 (en) Over-current protection device for expansion cards
TW200511723A (en) Hysteresis circuits used in comparator

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties