ATE374374T1 - Prüfschaltung für hvdc-thyristorventile - Google Patents

Prüfschaltung für hvdc-thyristorventile

Info

Publication number
ATE374374T1
ATE374374T1 AT02712592T AT02712592T ATE374374T1 AT E374374 T1 ATE374374 T1 AT E374374T1 AT 02712592 T AT02712592 T AT 02712592T AT 02712592 T AT02712592 T AT 02712592T AT E374374 T1 ATE374374 T1 AT E374374T1
Authority
AT
Austria
Prior art keywords
voltage
capacitor
polarity
hvdc
inductor
Prior art date
Application number
AT02712592T
Other languages
English (en)
Inventor
Erik Jansson
Baoliang Sheng
Original Assignee
Abb Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=20283068&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE374374(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Abb Ab filed Critical Abb Ab
Application granted granted Critical
Publication of ATE374374T1 publication Critical patent/ATE374374T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/263—Circuits therefor for testing thyristors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/333—Testing of the switching capacity of high-voltage circuit-breakers ; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage
    • G01R31/3333—Apparatus, systems or circuits therefor
    • G01R31/3336—Synthetic testing, i.e. with separate current and voltage generators simulating distance fault conditions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Rectifiers (AREA)
  • Power Conversion In General (AREA)
AT02712592T 2001-02-21 2002-02-21 Prüfschaltung für hvdc-thyristorventile ATE374374T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0100579A SE518628C2 (sv) 2001-02-21 2001-02-21 Provningskrets för HVDC-tyristorventiler samt förfarande för syntetisk provning

Publications (1)

Publication Number Publication Date
ATE374374T1 true ATE374374T1 (de) 2007-10-15

Family

ID=20283068

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02712592T ATE374374T1 (de) 2001-02-21 2002-02-21 Prüfschaltung für hvdc-thyristorventile

Country Status (6)

Country Link
EP (1) EP1362242B2 (de)
CN (1) CN1210572C (de)
AT (1) ATE374374T1 (de)
DE (1) DE60222634T2 (de)
SE (1) SE518628C2 (de)
WO (1) WO2002067003A1 (de)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6826455B1 (en) * 2003-05-09 2004-11-30 Masco Corporation Booster-powered valve system
CN100335909C (zh) * 2005-09-12 2007-09-05 北京四方清能电气电子有限公司 一种用于电力电子功率模块测试的新电路及其脉冲控制方法
CN100421346C (zh) * 2006-03-17 2008-09-24 中国电力科学研究院 合成全工况试验装置启动和退出方法
CN100449319C (zh) * 2006-03-17 2009-01-07 中国电力科学研究院 一种合成全工况试验装置主电路
CN101187690B (zh) * 2007-11-28 2010-06-02 中国电力科学研究院 直流换流阀恢复期间瞬时正向电压试验的方法
CN101545961B (zh) * 2009-04-21 2012-05-23 江苏省电力试验研究院有限公司 电子式互感器的极性试验系统及其极性试验方法
CN101706541B (zh) * 2009-12-04 2012-12-26 中国电力科学研究院 一种直流输电换流阀故障电流实验检测装置
CN101726640B (zh) * 2009-12-23 2012-09-05 中国电力科学研究院 一种换流阀运行试验装置的控制保护系统
CN101893670B (zh) * 2010-06-25 2013-12-18 中国电力科学研究院 一种用于高压直流输电换流阀的光电测量系统
CN101951173B (zh) * 2010-08-30 2012-07-25 中国西电电气股份有限公司 直流输电晶闸管阀运行试验用双6脉波桥臂并联电流源
CN101937059B (zh) * 2010-08-30 2013-02-13 中国西电电气股份有限公司 一种换流阀运行试验单波次故障电流试验装置及试验方法
CN101980035B (zh) * 2010-09-10 2014-03-12 中国电力科学研究院 一种换流阀用晶闸管承受最严酷电流应力的试验设计与分析方法
CN101975916B (zh) * 2010-09-20 2013-12-18 中国电力科学研究院 一种新型晶闸管反向恢复保护试验方法
CN102486517B (zh) * 2010-12-01 2015-11-25 中国电力科学研究院 冲击电压复合的高压直流输电换流阀故障电流试验方法
CN102486498B (zh) * 2010-12-01 2014-12-31 中国电力科学研究院 一种高压直流输电换流阀合成试验装置
CN102486524B (zh) * 2010-12-01 2015-06-24 中国电力科学研究院 一种直流换流阀非周期触发试验装置
CN102486499A (zh) * 2010-12-01 2012-06-06 中国电力科学研究院 一种高压直流输电换流阀最小关断角运行试验方法
CN102486527B (zh) * 2010-12-01 2015-09-23 中国电力科学研究院 一种高压直流输电换流阀合成试验方法
GB2489262B (en) * 2011-03-23 2016-07-06 Alstom Technology Ltd Testing apparatus
CN102590738B (zh) * 2012-01-20 2014-11-26 荣信电力电子股份有限公司 用于可控硅阀组检测的实验站
CN102707163B (zh) * 2012-01-20 2014-07-23 荣信电力电子股份有限公司 用于可控硅阀组检测的实验站
CN102608447B (zh) * 2012-01-31 2014-09-10 荣信电力电子股份有限公司 用于可控硅阀组检测的实验站
KR101326327B1 (ko) 2012-05-22 2013-11-11 명지대학교 산학협력단 사이리스터 밸브의 합성 시험 장치
FR2997196B1 (fr) 2012-10-22 2016-01-29 Alstom Technology Ltd Circuit de test de disjoncteur haute tension a courant continu
CN103259390B (zh) * 2013-03-21 2016-09-21 国网智能电网研究院 直流输电换流阀开通阶跃电流的确定方法
US9465074B2 (en) * 2013-10-09 2016-10-11 Ford Global Technologies, Llc System and method for measuring switching loss associated with semiconductor switching devices
KR101442990B1 (ko) 2013-10-16 2014-11-04 엘에스산전 주식회사 고전압직류송전 사이리스터 밸브를 위한 합성시험회로
CA2942007A1 (en) 2014-03-19 2015-09-24 General Electric Company Hybrid three-level npc thyristor converter with chain-link strings as inner ac switches
DE102014105719B4 (de) 2014-04-23 2015-11-26 Ge Energy Power Conversion Gmbh Schaltungsvorrichtung mit einer Thyristorschaltung sowie ein Verfahren zum Prüfen der Thyristorschaltung
EP2975420A1 (de) * 2014-07-18 2016-01-20 Alstom Technology Ltd Synthetische Prüfschaltung
WO2016009081A1 (en) * 2014-07-18 2016-01-21 Alstom Technology Ltd Synthetic test circuit
US20170269161A1 (en) * 2014-08-19 2017-09-21 Alstom Technology Ltd Synthetic test circuit
EP2988143A1 (de) * 2014-08-19 2016-02-24 Alstom Technology Ltd Synthetische Prüfschaltung
EP2993482A1 (de) * 2014-09-02 2016-03-09 Alstom Technology Ltd Synthetische Prüfschaltung
WO2016034523A1 (en) * 2014-09-02 2016-03-10 Alstom Technology Ltd Synthetic test circuit
EP3198288A1 (de) * 2014-09-22 2017-08-02 General Electric Technology GmbH Synthetische prüfschaltung
EP2998752A1 (de) * 2014-09-22 2016-03-23 Alstom Technology Ltd Synthetische Prüfschaltung
KR101980691B1 (ko) * 2015-06-18 2019-05-22 엘에스산전 주식회사 초고압직류송전의 밸브 성능 시험을 위한 합성시험 회로
KR101666762B1 (ko) * 2015-09-03 2016-10-14 엘에스산전 주식회사 시험 밸브의 합성 시험을 위한 전압 공급 회로
KR101779709B1 (ko) * 2016-04-15 2017-09-18 엘에스산전 주식회사 합성시험회로 및 이의 전류주입방법
CN110095715A (zh) * 2019-05-07 2019-08-06 西安交通大学 一种模拟暂态脉冲电应力作用的自动化试验装置及方法
CN112834840B (zh) * 2020-12-30 2024-02-02 西安布伦帕电力无功补偿技术有限公司 电容器极性反转试验回路及方法
CN113189424B (zh) * 2021-04-26 2022-09-06 中国南方电网有限责任公司超高压输电公司天生桥局 一种串联谐振的柔性直流换流阀运行试验拓扑及控制方法
CN114002564B (zh) * 2021-10-29 2023-04-07 西安交通大学 模拟换流阀长期运行工况的晶闸管电热联合老化实验系统

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB959611A (en) * 1962-01-24 1964-06-03 Ass Elect Ind Improvements relating to apparatus for testing electrical circuit breakers
EP0418678A3 (en) * 1989-09-20 1991-12-27 Hitachi, Ltd. Synthetic equivalent test circuit of circuit breaker
DE4337810A1 (de) * 1993-11-05 1995-05-11 Abb Management Ag Prüfkreis für die synthetische Prüfung von Hochspannungsleistungsschaltern

Also Published As

Publication number Publication date
WO2002067003A1 (en) 2002-08-29
DE60222634T2 (de) 2008-06-26
WO2002067003A8 (en) 2004-05-21
EP1362242B2 (de) 2010-10-06
SE0100579D0 (sv) 2001-02-21
EP1362242A1 (de) 2003-11-19
SE518628C2 (sv) 2002-11-05
EP1362242B1 (de) 2007-09-26
DE60222634D1 (de) 2007-11-08
SE0100579L (sv) 2002-08-22
CN1493004A (zh) 2004-04-28
CN1210572C (zh) 2005-07-13

Similar Documents

Publication Publication Date Title
ATE374374T1 (de) Prüfschaltung für hvdc-thyristorventile
ATE336007T1 (de) Integrierte schaltung mit testinterface
CN105337606A (zh) 支持压力测试的具有栅极钳位的驱动器电路
KR920020521A (ko) 반도체집적회로
US20130088287A1 (en) Semiconductor device and method of controlling analog switch
CN204180046U (zh) 电子电路及驱动电路
PL351223A1 (en) Integrated circuit testing method
DE602006007695D1 (de) Prüfbare elektronische schaltung
US20030122431A1 (en) MOSFET based, high voltage, electronic relays for AC power switching and inductive loads
KR920702499A (ko) 초고집적 반도체장치의 용장(redundancy)을 위한 영전력소모 레이저 퓨즈시그니쳐회로
ATE324768T1 (de) Elektronische schaltungen
WO2003098231A3 (en) Monolithic i-load architectures for automatic test equipment
TW200618275A (en) High voltage tolerant I/O circuit using native NMOS transistor for improved performance
WO2002042783A3 (en) Vddq INTEGRATED CIRCUIT TESTING SYSTEM AND METHOD
WO2003067274A3 (en) Method and device for detecting faults on integrated circuits
KR100988487B1 (ko) 반도체 시험 장치
EP1388869A3 (de) Prüfschaltung für eine Zündspule und Verfahren zum Prüfen einer Zündspule
CN104868901A (zh) 信号检测电路
ATE449461T1 (de) Hochfrequenz-signalschalttechniken
JP2007174480A (ja) 高周波スイッチ装置及び通信機
KR970016609A (ko) 병렬 테스트시 전원 공급 제어 회로를 구비한 반도체 검사 장치
US7498854B1 (en) High speed solid state switch
US5402301A (en) Damping circuit providing capability of adjusting current flowing through damping component
ATE502436T1 (de) Hochstrom-ladungspumpe für intelligenten leistungsschaltertreiber
JP2012129939A (ja) スイッチ装置および試験装置

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties