ATE378609T1 - Effiziente schaltarchitektur mit verringerten stub-längen - Google Patents

Effiziente schaltarchitektur mit verringerten stub-längen

Info

Publication number
ATE378609T1
ATE378609T1 AT04789202T AT04789202T ATE378609T1 AT E378609 T1 ATE378609 T1 AT E378609T1 AT 04789202 T AT04789202 T AT 04789202T AT 04789202 T AT04789202 T AT 04789202T AT E378609 T1 ATE378609 T1 AT E378609T1
Authority
AT
Austria
Prior art keywords
switching
switching architecture
stub length
efficient switching
signals
Prior art date
Application number
AT04789202T
Other languages
English (en)
Inventor
Fang Xu
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of ATE378609T1 publication Critical patent/ATE378609T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07385—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using switching of signals between probe tips and test bed, i.e. the standard contact matrix which in its turn connects to the tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L49/00—Packet switching elements
    • H04L49/15—Interconnection of switching modules
    • H04L49/1515—Non-blocking multistage, e.g. Clos
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q3/00—Selecting arrangements
    • H04Q3/42—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker
    • H04Q3/54—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker in which the logic circuitry controlling the exchange is centralised
    • H04Q3/545—Circuit arrangements for indirect selecting controlled by common circuits, e.g. register controller, marker in which the logic circuitry controlling the exchange is centralised using a stored program
    • H04Q3/54575—Software application
    • H04Q3/54591—Supervision, e.g. fault localisation, traffic measurements, avoiding errors, failure recovery, monitoring, statistical analysis
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L49/00—Packet switching elements
    • H04L49/55—Prevention, detection or correction of errors
    • H04L49/555—Error detection
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q2213/00—Indexing scheme relating to selecting arrangements in general and for multiplex systems
    • H04Q2213/1302—Relay switches
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q2213/00—Indexing scheme relating to selecting arrangements in general and for multiplex systems
    • H04Q2213/1304—Coordinate switches, crossbar, 4/2 with relays, coupling field
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q2213/00—Indexing scheme relating to selecting arrangements in general and for multiplex systems
    • H04Q2213/13076—Distributing frame, MDF, cross-connect switch
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q2213/00—Indexing scheme relating to selecting arrangements in general and for multiplex systems
    • H04Q2213/1316—Service observation, testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q2213/00—Indexing scheme relating to selecting arrangements in general and for multiplex systems
    • H04Q2213/13166—Fault prevention

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Use Of Switch Circuits For Exchanges And Methods Of Control Of Multiplex Exchanges (AREA)
  • Electronic Switches (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Control Of Motors That Do Not Use Commutators (AREA)
AT04789202T 2003-09-30 2004-09-29 Effiziente schaltarchitektur mit verringerten stub-längen ATE378609T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/675,083 US6958598B2 (en) 2003-09-30 2003-09-30 Efficient switching architecture with reduced stub lengths

Publications (1)

Publication Number Publication Date
ATE378609T1 true ATE378609T1 (de) 2007-11-15

Family

ID=34377044

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04789202T ATE378609T1 (de) 2003-09-30 2004-09-29 Effiziente schaltarchitektur mit verringerten stub-längen

Country Status (7)

Country Link
US (2) US6958598B2 (de)
EP (1) EP1668376B1 (de)
JP (1) JP2007507715A (de)
CN (1) CN100587509C (de)
AT (1) ATE378609T1 (de)
DE (1) DE602004010162T2 (de)
WO (1) WO2005033722A1 (de)

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US6958598B2 (en) * 2003-09-30 2005-10-25 Teradyne, Inc. Efficient switching architecture with reduced stub lengths
US9244111B2 (en) * 2003-10-17 2016-01-26 Ronald P. Clarridge Amperage/voltage loop calibrator with loop diagnostics
US7248058B2 (en) * 2003-10-17 2007-07-24 Clarridge Ronald P Testing and calibration device with diagnostics
US7450568B2 (en) * 2003-12-05 2008-11-11 Cisco Technology, Inc. System and method for managing a VolP network
JP2008516205A (ja) * 2004-10-08 2008-05-15 ヴェリジー（シンガポール） プライベート リミテッド フィーチャ指向型テストプログラムの開発と実行
TWI253566B (en) * 2004-12-23 2006-04-21 Accton Technology Corp Setting method to increase the throughput
US20080001955A1 (en) * 2006-06-29 2008-01-03 Inventec Corporation Video output system with co-layout structure
JP2011520219A (ja) * 2008-04-15 2011-07-14 コト テクノロジー，インコーポレーテッド 改良されたフォームｃリレーおよびそのリレーを使用するパッケージ
US7975189B2 (en) * 2008-11-14 2011-07-05 Trelliware Technologies, Inc. Error rate estimation/application to code-rate adaption
TWI372874B (en) * 2009-03-11 2012-09-21 Star Techn Inc Method for configuring a combinational switching matrix and testing system for semiconductor devices using the same
US9445795B2 (en) * 2009-10-16 2016-09-20 Confluent Surgical, Inc. Prevention of premature gelling of delivery devices for pH dependent forming materials
CN102128956B (zh) * 2010-01-19 2013-06-19 中芯国际集成电路制造(上海)有限公司 测试座连接板
US9097757B2 (en) * 2011-04-14 2015-08-04 National Instruments Corporation Switching element system and method
KR20140000855A (ko) * 2012-06-26 2014-01-06 삼성전자주식회사 테스트 인터페이스 보드 및 테스트 시스템
TW201412027A (zh) * 2012-09-14 2014-03-16 Chicony Electronics Co Ltd 矩陣測試方法、系統及電壓時脈控制方法
TWI493194B (zh) * 2013-07-15 2015-07-21 Mpi Corp Probe module with feedback test function
US9500675B2 (en) 2013-07-15 2016-11-22 Mpi Corporation Probe module supporting loopback test
TWI489113B (zh) * 2013-07-15 2015-06-21 Mpi Corp A probe card that switches the signal path
US9453883B2 (en) * 2014-03-04 2016-09-27 Advantest Corporation Distributed power supply architecture in automatic test equipment
TWI583960B (zh) * 2015-06-05 2017-05-21 Mpi Corp Probe module with feedback test function (3)
TWI583961B (zh) * 2015-06-05 2017-05-21 Mpi Corp 具回授測試功能之探針模組(一)
CN110703795B (zh) * 2019-09-27 2020-09-15 南京航空航天大学 一种基于切换拓扑的无人机群协同安全控制方法
CN114264914B (zh) * 2021-12-08 2025-04-25 北京航天测控技术有限公司 矩阵开关自检方法、矩阵开关及自动测试系统

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Also Published As

Publication number Publication date
US20070025257A1 (en) 2007-02-01
CN1860377A (zh) 2006-11-08
US6958598B2 (en) 2005-10-25
US20050068898A1 (en) 2005-03-31
US7863888B2 (en) 2011-01-04
EP1668376A1 (de) 2006-06-14
CN100587509C (zh) 2010-02-03
DE602004010162T2 (de) 2008-10-30
DE602004010162D1 (de) 2007-12-27
WO2005033722A1 (en) 2005-04-14
JP2007507715A (ja) 2007-03-29
EP1668376B1 (de) 2007-11-14

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