ATE387726T1 - Phasenwechsel-material enthaltendes elektrisches bauelement - Google Patents
Phasenwechsel-material enthaltendes elektrisches bauelementInfo
- Publication number
- ATE387726T1 ATE387726T1 AT03773940T AT03773940T ATE387726T1 AT E387726 T1 ATE387726 T1 AT E387726T1 AT 03773940 T AT03773940 T AT 03773940T AT 03773940 T AT03773940 T AT 03773940T AT E387726 T1 ATE387726 T1 AT E387726T1
- Authority
- AT
- Austria
- Prior art keywords
- phase
- change material
- phase change
- electrical component
- component containing
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/20—Multistable switching devices, e.g. memristors
- H10N70/231—Multistable switching devices, e.g. memristors based on solid-state phase change, e.g. between amorphous and crystalline phases, Ovshinsky effect
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B63/00—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
- H10B63/30—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices comprising selection components having three or more electrodes, e.g. transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B63/00—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/821—Device geometry
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/821—Device geometry
- H10N70/826—Device geometry adapted for essentially vertical current flow, e.g. sandwich or pillar type devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/841—Electrodes
- H10N70/8413—Electrodes adapted for resistive heating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/881—Switching materials
- H10N70/884—Switching materials based on at least one element of group IIIA, IVA or VA, e.g. elemental or compound semiconductors
Landscapes
- Semiconductor Memories (AREA)
- Compositions Of Oxide Ceramics (AREA)
- Inorganic Insulating Materials (AREA)
- Waveguide Switches, Polarizers, And Phase Shifters (AREA)
- Organic Insulating Materials (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP02080430 | 2002-12-19 | ||
| EP03100583 | 2003-03-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE387726T1 true ATE387726T1 (de) | 2008-03-15 |
Family
ID=32683811
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT03773940T ATE387726T1 (de) | 2002-12-19 | 2003-12-03 | Phasenwechsel-material enthaltendes elektrisches bauelement |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US8779474B2 (de) |
| EP (1) | EP1576676B1 (de) |
| JP (1) | JP2006511971A (de) |
| KR (1) | KR20050092017A (de) |
| AT (1) | ATE387726T1 (de) |
| AU (1) | AU2003282323A1 (de) |
| DE (1) | DE60319424T2 (de) |
| TW (1) | TW200503299A (de) |
| WO (1) | WO2004057684A1 (de) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200529414A (en) * | 2004-02-06 | 2005-09-01 | Renesas Tech Corp | Storage |
| WO2006003620A1 (en) | 2004-06-30 | 2006-01-12 | Koninklijke Philips Electronics N.V. | Method for manufacturing an electric device with a layer of conductive material contacted by nanowire |
| WO2006035325A1 (en) * | 2004-09-27 | 2006-04-06 | Koninklijke Philips Electronics N.V. | Electric device with nanowires comprising a phase change material |
| JP2006245251A (ja) * | 2005-03-03 | 2006-09-14 | Mitsubishi Materials Corp | 非晶質状態が安定な相変化記録膜およびこの相変化記録膜を形成するためのスパッタリングターゲット |
| US20070052009A1 (en) * | 2005-09-07 | 2007-03-08 | The Regents Of The University Of California | Phase change memory device and method of making same |
| WO2007057972A1 (ja) * | 2005-11-21 | 2007-05-24 | Renesas Technology Corp. | 半導体装置 |
| TW200805643A (en) | 2006-03-24 | 2008-01-16 | Koninkl Philips Electronics Nv | Electric device with phase change resistor |
| KR101177284B1 (ko) * | 2007-01-18 | 2012-08-24 | 삼성전자주식회사 | 상변화 물질층과 그 제조방법과 이 방법으로 형성된 상변화물질층을 포함하는 상변화 메모리 소자와 그 제조 및 동작방법 |
| CN101663771A (zh) | 2007-04-20 | 2010-03-03 | Nxp股份有限公司 | 电子器件和制造电子器件的方法 |
| KR100857466B1 (ko) * | 2007-05-16 | 2008-09-08 | 한국전자통신연구원 | 안티몬-아연 합금을 이용한 상변화형 비휘발성 메모리 소자및 이의 제조방법 |
| CN100530739C (zh) * | 2007-07-17 | 2009-08-19 | 中国科学院上海微系统与信息技术研究所 | 相变材料呈环形的相变存储器器件单元及制备方法 |
| JP5334995B2 (ja) | 2008-01-16 | 2013-11-06 | エヌエックスピー ビー ヴィ | 相変化材料層を有する多層構造およびその製造方法 |
| US7906774B2 (en) | 2008-02-01 | 2011-03-15 | Industrial Technology Research Institute | Phase change memory device |
| WO2009115995A1 (en) * | 2008-03-21 | 2009-09-24 | Nxp B.V. | An electronic component comprising a convertible structure |
| US20110108792A1 (en) * | 2009-11-11 | 2011-05-12 | International Business Machines Corporation | Single Crystal Phase Change Material |
| US8129268B2 (en) | 2009-11-16 | 2012-03-06 | International Business Machines Corporation | Self-aligned lower bottom electrode |
| US8233317B2 (en) | 2009-11-16 | 2012-07-31 | International Business Machines Corporation | Phase change memory device suitable for high temperature operation |
| US8470635B2 (en) | 2009-11-30 | 2013-06-25 | Micron Technology, Inc. | Keyhole-free sloped heater for phase change memory |
| US8017432B2 (en) * | 2010-01-08 | 2011-09-13 | International Business Machines Corporation | Deposition of amorphous phase change material |
| CN103247757B (zh) * | 2013-04-18 | 2015-11-18 | 宁波大学 | 一种用于相变存储器的Zn-Sb-Te相变存储薄膜材料及其制备方法 |
| US9257643B2 (en) * | 2013-08-16 | 2016-02-09 | International Business Machines Corporation | Phase change memory cell with improved phase change material |
| US10447234B2 (en) | 2014-04-18 | 2019-10-15 | Northeastern University | Piezoelectric MEMS resonator with integrated phase change material switches |
| US11158783B2 (en) | 2015-10-13 | 2021-10-26 | Northeastern University | Piezoelectric cross-sectional Lamé mode transformer |
| DE102017210369A1 (de) | 2017-06-21 | 2018-12-27 | Lithium Energy and Power GmbH & Co. KG | Batteriezelle |
| US11380843B2 (en) | 2020-02-13 | 2022-07-05 | International Business Machines Corporation | Phase change memory using multiple stacks of PCM materials |
| CN112331767B (zh) * | 2020-10-27 | 2023-12-22 | 华中科技大学 | 一种Ge-Sb基相变材料及多级相变存储器 |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE69023786T2 (de) | 1989-03-17 | 1996-06-13 | Fuji Xerox Co Ltd | Optischer Aufzeichnungsträger. |
| US5166758A (en) | 1991-01-18 | 1992-11-24 | Energy Conversion Devices, Inc. | Electrically erasable phase change memory |
| US5534712A (en) | 1991-01-18 | 1996-07-09 | Energy Conversion Devices, Inc. | Electrically erasable memory elements characterized by reduced current and improved thermal stability |
| US5128099A (en) * | 1991-02-15 | 1992-07-07 | Energy Conversion Devices, Inc. | Congruent state changeable optical memory material and device |
| US5714768A (en) * | 1995-10-24 | 1998-02-03 | Energy Conversion Devices, Inc. | Second-layer phase change memory array on top of a logic device |
| US5825046A (en) * | 1996-10-28 | 1998-10-20 | Energy Conversion Devices, Inc. | Composite memory material comprising a mixture of phase-change memory material and dielectric material |
| US5912839A (en) * | 1998-06-23 | 1999-06-15 | Energy Conversion Devices, Inc. | Universal memory element and method of programming same |
| WO2000039028A1 (en) | 1998-12-23 | 2000-07-06 | Battelle Memorial Institute | Mesoporous silica film from a solution containing a surfactant and methods of making same |
| DE60034974T2 (de) | 1999-03-15 | 2008-01-24 | Matsushita Electric Industrial Co., Ltd., Kadoma | Optisches Phasenübergangsaufzeichnungsmedium und Herstellungsverfahren |
| JP4558950B2 (ja) | 1999-03-25 | 2010-10-06 | オヴォニクス インコーポレイテッド | 改善された接合を有する電気的にプログラム可能なメモリ素子 |
| US6314014B1 (en) * | 1999-12-16 | 2001-11-06 | Ovonyx, Inc. | Programmable resistance memory arrays with reference cells |
| WO2002009206A1 (en) | 2000-07-22 | 2002-01-31 | Ovonyx, Inc. | Electrically programmable memory element |
| US6809401B2 (en) | 2000-10-27 | 2004-10-26 | Matsushita Electric Industrial Co., Ltd. | Memory, writing apparatus, reading apparatus, writing method, and reading method |
| AU2002354082A1 (en) * | 2001-12-12 | 2003-06-23 | Matsushita Electric Industrial Co., Ltd. | Nonvolatile memory |
| US6899938B2 (en) | 2002-02-22 | 2005-05-31 | Energy Conversion Devices, Inc. | Phase change data storage device for multi-level recording |
| DE60309232T2 (de) * | 2002-03-05 | 2007-09-06 | Mitsubishi Kagaku Media Co. Ltd. | Phasenwechselaufzeichnungsmaterial für ein Informationsaufzeichnungsmedium und ein Informationsaufzeichnungsmedium dieses verwendend |
| US6917532B2 (en) | 2002-06-21 | 2005-07-12 | Hewlett-Packard Development Company, L.P. | Memory storage device with segmented column line array |
| US6850432B2 (en) * | 2002-08-20 | 2005-02-01 | Macronix International Co., Ltd. | Laser programmable electrically readable phase-change memory method and device |
| DE10297784T5 (de) | 2002-08-21 | 2005-07-14 | Ovonyx Inc. | Atomare Schichtabscheidung bei programmierbaren Bauelementen |
| US6778420B2 (en) * | 2002-09-25 | 2004-08-17 | Ovonyx, Inc. | Method of operating programmable resistant element |
| US7307267B2 (en) | 2002-12-19 | 2007-12-11 | Nxp B.V. | Electric device with phase change material and parallel heater |
| DE60335208D1 (de) | 2002-12-19 | 2011-01-13 | Nxp Bv | Elektrisches bauelement mit einer schicht aus phasenwechsel-material und verfahren zur seiner herstellung |
-
2003
- 2003-12-03 US US10/539,251 patent/US8779474B2/en not_active Ceased
- 2003-12-03 AU AU2003282323A patent/AU2003282323A1/en not_active Abandoned
- 2003-12-03 JP JP2005502598A patent/JP2006511971A/ja not_active Withdrawn
- 2003-12-03 AT AT03773940T patent/ATE387726T1/de not_active IP Right Cessation
- 2003-12-03 DE DE60319424T patent/DE60319424T2/de not_active Expired - Lifetime
- 2003-12-03 US US15/210,771 patent/USRE48202E1/en active Active
- 2003-12-03 WO PCT/IB2003/005648 patent/WO2004057684A1/en not_active Ceased
- 2003-12-03 KR KR1020057011349A patent/KR20050092017A/ko not_active Ceased
- 2003-12-03 EP EP03773940A patent/EP1576676B1/de not_active Expired - Lifetime
- 2003-12-16 TW TW092135564A patent/TW200503299A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| US8779474B2 (en) | 2014-07-15 |
| DE60319424T2 (de) | 2009-02-19 |
| WO2004057684A1 (en) | 2004-07-08 |
| EP1576676B1 (de) | 2008-02-27 |
| KR20050092017A (ko) | 2005-09-16 |
| EP1576676A1 (de) | 2005-09-21 |
| AU2003282323A1 (en) | 2004-07-14 |
| TW200503299A (en) | 2005-01-16 |
| JP2006511971A (ja) | 2006-04-06 |
| DE60319424D1 (de) | 2008-04-10 |
| US20060049389A1 (en) | 2006-03-09 |
| USRE48202E1 (en) | 2020-09-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |