ATE388410T1 - Verfahren und vorrichtung zur messung und anzeige von augenmustermessungen - Google Patents

Verfahren und vorrichtung zur messung und anzeige von augenmustermessungen

Info

Publication number
ATE388410T1
ATE388410T1 AT05001392T AT05001392T ATE388410T1 AT E388410 T1 ATE388410 T1 AT E388410T1 AT 05001392 T AT05001392 T AT 05001392T AT 05001392 T AT05001392 T AT 05001392T AT E388410 T1 ATE388410 T1 AT E388410T1
Authority
AT
Austria
Prior art keywords
offsets
signal
operative
generate
desired time
Prior art date
Application number
AT05001392T
Other languages
English (en)
Inventor
Thomas Eugene Waschura
James E Waschura
Original Assignee
Synthesys Res Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Synthesys Res Inc filed Critical Synthesys Res Inc
Application granted granted Critical
Publication of ATE388410T1 publication Critical patent/ATE388410T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/3171—BER [Bit Error Rate] test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Dc Digital Transmission (AREA)
  • Eye Examination Apparatus (AREA)
AT05001392T 2004-02-02 2005-01-25 Verfahren und vorrichtung zur messung und anzeige von augenmustermessungen ATE388410T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US54140404P 2004-02-02 2004-02-02

Publications (1)

Publication Number Publication Date
ATE388410T1 true ATE388410T1 (de) 2008-03-15

Family

ID=34652517

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05001392T ATE388410T1 (de) 2004-02-02 2005-01-25 Verfahren und vorrichtung zur messung und anzeige von augenmustermessungen

Country Status (6)

Country Link
US (1) US7467336B2 (de)
EP (1) EP1560034B1 (de)
JP (1) JP2005223911A (de)
AT (1) ATE388410T1 (de)
CA (1) CA2495844A1 (de)
DE (1) DE602005005093T2 (de)

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US7284141B2 (en) * 2004-02-05 2007-10-16 Anritsu Company Method of and apparatus for measuring jitter and generating an eye diagram of a high speed data signal
DE102004016359A1 (de) * 2004-04-02 2005-10-27 Texas Instruments Deutschland Gmbh Abtastverfahren und -vorrichtung
US20060020412A1 (en) * 2004-07-23 2006-01-26 Bruensteiner Matthew M Analog waveform information from binary sampled measurements
US20060047449A1 (en) * 2004-08-27 2006-03-02 Broadcom Corporation Graphical test development tool for use with automated test equipment
JP4909554B2 (ja) * 2004-09-24 2012-04-04 テクトロニクス・インコーポレイテッド パターン識別方法
US7743288B1 (en) * 2005-06-01 2010-06-22 Altera Corporation Built-in at-speed bit error ratio tester
JP4955303B2 (ja) * 2006-03-23 2012-06-20 テクトロニクス・インコーポレイテッド デジタル信号分析プログラム及び波形表示装置
EP1847844A1 (de) * 2006-04-21 2007-10-24 Agilent Technologies, Inc. Digitale Datensignalanalyse mittels Evaluierung abgetasteter Werte in Zusammenhang mit Signalbitwerten
US20070294590A1 (en) * 2006-05-16 2007-12-20 Texas Instruments Incorporated Compression scheme to reduce the bandwidth requirements for continuous trace stream encoding of system performance
JP5161444B2 (ja) * 2006-08-11 2013-03-13 テクトロニクス・インコーポレイテッド ジッタ特性分析プログラム及びジッタ特性の表又はグラフ表示方法
US8995514B1 (en) * 2012-09-28 2015-03-31 Xilinx, Inc. Methods of and circuits for analyzing a phase of a clock signal for receiving data
US20170109244A1 (en) * 2015-10-15 2017-04-20 Kabushiki Kaisha Toshiba Storage device and method
WO2021168440A1 (en) * 2020-02-21 2021-08-26 Tektronix, Inc. Real-equivalent-time oscilloscope
CN115668149A (zh) 2020-06-11 2023-01-31 特克特朗尼克公司 用于波形数据的循环环路图像表示
DE112022000932T5 (de) * 2021-02-03 2023-11-16 Tektronix, Inc. Augen-klassen-separator mit überlapp, zusammgesetzte und dynamisiche augen-trigger für menschen und maschinelles lernen
US12442852B2 (en) 2022-03-30 2025-10-14 Tektronix, Inc. Tuning a device under test using parallel pipeline machine learning assistance
US11907090B2 (en) 2021-08-12 2024-02-20 Tektronix, Inc. Machine learning for taps to accelerate TDECQ and other measurements
US11940889B2 (en) 2021-08-12 2024-03-26 Tektronix, Inc. Combined TDECQ measurement and transmitter tuning using machine learning
US11923895B2 (en) 2021-03-24 2024-03-05 Tektronix, Inc. Optical transmitter tuning using machine learning and reference parameters
US11923896B2 (en) 2021-03-24 2024-03-05 Tektronix, Inc. Optical transceiver tuning using machine learning
CN112800635B (zh) * 2021-04-08 2021-07-20 深圳市鼎阳科技股份有限公司 矢量网络分析仪和统计眼图生成的方法
US12146914B2 (en) 2021-05-18 2024-11-19 Tektronix, Inc. Bit error ratio estimation using machine learning
US12571841B2 (en) 2021-06-04 2026-03-10 Tektronix, Inc. General digital signal processing waveform machine learning control application
US12416662B2 (en) 2022-01-14 2025-09-16 Tektronix, Inc. Machine learning model training using de-noised data and model prediction with noise correction
US12596145B2 (en) 2022-03-30 2026-04-07 Tektronix, Inc. Optical tuning test system using parallel oven pipelines with parallel instrument channels and machine learning assistance
CN119232295A (zh) * 2024-10-14 2024-12-31 上海芯炽科技集团有限公司 一种应用于高速传输系统的信号眼图的检测方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5124849A (en) * 1990-06-01 1992-06-23 Swan Instruments Data storage media certification process
US5228042A (en) * 1991-02-07 1993-07-13 Northern Telecom Limited Method and circuit for testing transmission paths
CA2056679C (en) * 1991-11-29 2002-02-12 Timothy Joseph Nohara Automatic monitoring of digital communication channel conditions using eye patterns
GB2340277B (en) * 1995-02-24 2000-05-03 Advantest Corp Bit error measurement system
US6430715B1 (en) * 1999-09-17 2002-08-06 Digital Lightwave, Inc. Protocol and bit rate independent test system
US6728311B1 (en) * 2000-04-04 2004-04-27 Thomas Eugene Waschura Apparatus and method for creating eye diagram
US6715112B2 (en) * 2000-11-29 2004-03-30 Agilent Technologies, Inc. Method and apparatus for displaying triggered waveform on an error performance analyzer
US20030097226A1 (en) * 2001-11-21 2003-05-22 Synthesys Apparatus and method for sampling eye diagrams with window comparators
US7310389B2 (en) * 2002-03-14 2007-12-18 Syntle Sys Research, Inc Method and apparatus for determining the errors of a multi-valued data signal that are outside the limits of an eye mask
US7606297B2 (en) * 2002-03-15 2009-10-20 Synthesys Research, Inc. Method and system for creating an eye diagram using a binary data bit decision mechanism
EP1460793A1 (de) * 2003-03-19 2004-09-22 Synthesys Research, Inc. Verfahren und Vorrichtung zur Fehlerzählung eines ausserhalb des Bereiches einer Augenmaske liegenden Datensignals
EP1460792A1 (de) * 2003-03-19 2004-09-22 Synthesys Research, Inc. Verfahren und System zum Erzeugen eines Augenmusters

Also Published As

Publication number Publication date
CA2495844A1 (en) 2005-08-02
US20050246601A1 (en) 2005-11-03
EP1560034A1 (de) 2005-08-03
DE602005005093T2 (de) 2009-03-19
DE602005005093D1 (de) 2008-04-17
US7467336B2 (en) 2008-12-16
EP1560034B1 (de) 2008-03-05
JP2005223911A (ja) 2005-08-18

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