ATE392044T1 - Komparator-offsetkallibration für a/d-umsetzer - Google Patents

Komparator-offsetkallibration für a/d-umsetzer

Info

Publication number
ATE392044T1
ATE392044T1 AT03745492T AT03745492T ATE392044T1 AT E392044 T1 ATE392044 T1 AT E392044T1 AT 03745492 T AT03745492 T AT 03745492T AT 03745492 T AT03745492 T AT 03745492T AT E392044 T1 ATE392044 T1 AT E392044T1
Authority
AT
Austria
Prior art keywords
comparator
dac
ccu
array
converters
Prior art date
Application number
AT03745492T
Other languages
English (en)
Inventor
Bengt Jonsson
Christer Jansson
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from TW091106646A external-priority patent/TWI270255B/zh
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Application granted granted Critical
Publication of ATE392044T1 publication Critical patent/ATE392044T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1057—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values
    • H03M1/1061—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values using digitally programmable trimming circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/36—Analogue value compared with reference values simultaneously only, i.e. parallel type

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Measurement Of Current Or Voltage (AREA)
AT03745492T 2002-04-02 2003-02-24 Komparator-offsetkallibration für a/d-umsetzer ATE392044T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW091106646A TWI270255B (en) 2002-02-13 2002-04-02 Comparator offset calibration for A/D converters
PCT/SE2003/000297 WO2003084071A1 (en) 2002-04-02 2003-02-24 Comparator offset calibration for a/d converters

Publications (1)

Publication Number Publication Date
ATE392044T1 true ATE392044T1 (de) 2008-04-15

Family

ID=28673310

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03745492T ATE392044T1 (de) 2002-04-02 2003-02-24 Komparator-offsetkallibration für a/d-umsetzer

Country Status (6)

Country Link
US (1) US7075465B2 (de)
EP (1) EP1614219B1 (de)
CN (1) CN100517974C (de)
AT (1) ATE392044T1 (de)
AU (1) AU2003210085A1 (de)
WO (1) WO2003084071A1 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7196552B2 (en) * 2005-04-12 2007-03-27 Hewlett-Packard Development Company, L.P. Comparator circuit with offset cancellation
US7280064B2 (en) * 2005-09-08 2007-10-09 Realtek Semiconductor Corp. Pipeline ADC with minimum overhead digital error correction
US7352307B2 (en) * 2006-02-09 2008-04-01 Atmel Corporation Comparator chain offset reduction
US7688237B2 (en) * 2006-12-21 2010-03-30 Broadcom Corporation Apparatus and method for analog-to-digital converter calibration
US7589650B2 (en) * 2006-12-29 2009-09-15 Industrial Technology Research Institute Analog-to-digital converter with calibration
US8098087B1 (en) * 2007-03-05 2012-01-17 Altera Corporation Method and apparatus for standby voltage offset cancellation
KR101448917B1 (ko) * 2007-09-11 2014-10-13 삼성전자주식회사 의사 멀티플 샘플링 방법을 사용하는 아날로그-디지털 변환장치 및 방법
US7511652B1 (en) 2007-12-31 2009-03-31 Industrial Technology Research Institute Comparison device and analog-to-digital converter
US7750830B2 (en) * 2008-10-22 2010-07-06 Industrial Technology Research Institute Calibration device and method thereof for pipelined analog-to-digital converter
EP2351225B1 (de) * 2008-10-22 2013-05-15 Integrated Device Technology, Inc. Kalibrierung von A/D-Wandler nach dem Fliessbandverfahren
US7880658B2 (en) * 2009-02-26 2011-02-01 Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. Interpolation accuracy improvement in motion encoder systems, devices and methods
US7880657B2 (en) * 2009-02-26 2011-02-01 Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. Interpolation accuracy improvement in motion encoder systems, devices and methods
JP2011040911A (ja) * 2009-08-07 2011-02-24 Renesas Electronics Corp アナログ／デジタル変換回路及び補正方法
US8836549B2 (en) * 2011-12-20 2014-09-16 Analog Devices, Inc. Use of logic circuit embedded into comparator for foreground offset cancellation
CN103546152B (zh) * 2012-07-13 2016-12-21 奇景光电股份有限公司 管线架构模拟数字转换器及其偏移电压影响校正方法
US8878713B1 (en) * 2013-06-20 2014-11-04 Fujitsu Limited Crossbar switch calibration system for facilitating analog-to-digital conversion monotonicity
CN103346793B (zh) * 2013-07-19 2016-12-28 深圳创维－Rgb电子有限公司 一种adc自动校正的方法及装置
CN104348486B (zh) * 2014-11-13 2017-11-17 复旦大学 一种带冗余位单级折叠内插流水线型模数转换器
US9557756B2 (en) * 2015-02-10 2017-01-31 Infineon Technologies Ag Bias drift compensation
CN105971976A (zh) * 2016-05-25 2016-09-28 广西柳工机械股份有限公司 利用电压型压力传感器测量工程机械液压压力的方法
US11671286B2 (en) 2018-12-12 2023-06-06 Rambus Inc. Live offset cancellation of the decision feedback equalization data slicers
KR102811626B1 (ko) * 2020-07-01 2025-05-22 에스케이하이닉스 주식회사 반도체 장치 및 반도체 장치의 구동 방법
CN113328748B (zh) * 2021-04-30 2023-12-15 澳门大学 模数转换电路
CN115642914B (zh) * 2022-11-17 2023-03-21 湖南进芯电子科技有限公司 流水线型模数转换器校正电路、模数转换电路及方法
US12362760B2 (en) * 2023-01-23 2025-07-15 Texas Instruments Incorporated Indirect comparator offset estimation

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2333171A (en) 1998-01-08 1999-07-14 Fujitsu Microelectronics Ltd Thermometer coding circuitry
JP3169884B2 (ja) * 1998-02-26 2001-05-28 日本電気アイシーマイコンシステム株式会社 ディジタル・アナログ変換器及びそのテスト方法
US6052325A (en) * 1998-05-22 2000-04-18 Micron Technology, Inc. Method and apparatus for translating signals
US6127955A (en) * 1998-11-20 2000-10-03 Telefonaktiebolaget Lm Ericsson (Publ) Method and system for calibrating analog-to-digital conversion
FI107482B (fi) * 1999-09-20 2001-08-15 Nokia Networks Oy Menetelmä analogia-digitaalimuuntimen kalibroimiseksi sekä kalibrointilaite
US6515464B1 (en) * 2000-09-29 2003-02-04 Microchip Technology Incorporated Input voltage offset calibration of an analog device using a microcontroller
DE60119476T2 (de) 2000-10-26 2006-11-23 Fujitsu Ltd., Kawasaki Segmentierte Schaltungsanordnung
TW521505B (en) * 2000-12-18 2003-02-21 Kai Hsiu Electronics Co Ltd Self-calibration circuit of high-speed comparator
SE522569C2 (sv) * 2001-02-27 2004-02-17 Ericsson Telefon Ab L M Dynamisk elemetanpassning i a/d-omvandlare
SE518900C2 (sv) * 2001-03-26 2002-12-03 Ericsson Telefon Ab L M Metod och anordning för kalibrering av A/D-omvandlare med bubbelhantering
US6720757B2 (en) 2002-03-26 2004-04-13 Broadcom Corporation Variable gain received signal strength indicator

Also Published As

Publication number Publication date
EP1614219A1 (de) 2006-01-11
US20050219090A1 (en) 2005-10-06
EP1614219B1 (de) 2008-04-09
US7075465B2 (en) 2006-07-11
CN100517974C (zh) 2009-07-22
WO2003084071A1 (en) 2003-10-09
AU2003210085A1 (en) 2003-10-13
CN1647388A (zh) 2005-07-27

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