ATE406582T1 - Elektronische schaltung mit prüfeinheit zur prüfung von verbindungsleitungen - Google Patents

Elektronische schaltung mit prüfeinheit zur prüfung von verbindungsleitungen

Info

Publication number
ATE406582T1
ATE406582T1 AT03738449T AT03738449T ATE406582T1 AT E406582 T1 ATE406582 T1 AT E406582T1 AT 03738449 T AT03738449 T AT 03738449T AT 03738449 T AT03738449 T AT 03738449T AT E406582 T1 ATE406582 T1 AT E406582T1
Authority
AT
Austria
Prior art keywords
electronic circuit
test unit
nodes
test
selection
Prior art date
Application number
AT03738449T
Other languages
English (en)
Inventor
De Logt Leon Van
Jong Franciscus De
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE406582T1 publication Critical patent/ATE406582T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/022—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in I/O circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/025—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in signal lines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/31855—Interconnection testing, e.g. crosstalk, shortcircuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
AT03738449T 2002-07-08 2003-06-20 Elektronische schaltung mit prüfeinheit zur prüfung von verbindungsleitungen ATE406582T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP02077733 2002-07-08

Publications (1)

Publication Number Publication Date
ATE406582T1 true ATE406582T1 (de) 2008-09-15

Family

ID=30011175

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03738449T ATE406582T1 (de) 2002-07-08 2003-06-20 Elektronische schaltung mit prüfeinheit zur prüfung von verbindungsleitungen

Country Status (9)

Country Link
US (1) US7199573B2 (de)
EP (1) EP1521974B1 (de)
JP (1) JP4176716B2 (de)
CN (1) CN100401086C (de)
AT (1) ATE406582T1 (de)
AU (1) AU2003244975A1 (de)
DE (1) DE60323232D1 (de)
TW (1) TWI287638B (de)
WO (1) WO2004005946A2 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7567521B2 (en) * 2006-06-06 2009-07-28 Litepoint Corp. Apparatus for capturing multiple data packets in a data signal for analysis
US20090021383A1 (en) * 2007-07-16 2009-01-22 International Business Machines Corporation Method for redundant control of service indicator leds
JP4365433B2 (ja) * 2007-09-11 2009-11-18 Ｏｋｉセミコンダクタ株式会社 半導体集積回路
US7928755B2 (en) * 2008-02-21 2011-04-19 Verigy (Singapore) Pte. Ltd. Methods and apparatus that selectively use or bypass a remote pin electronics block to test at least one device under test

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4556840A (en) * 1981-10-30 1985-12-03 Honeywell Information Systems Inc. Method for testing electronic assemblies
US4575648A (en) * 1983-12-23 1986-03-11 At&T Bell Laboratories Complementary field effect transistor EXCLUSIVE OR logic gates
US4789951A (en) * 1986-05-16 1988-12-06 Advanced Micro Devices, Inc. Programmable array logic cell
JPS635272A (ja) * 1986-06-25 1988-01-11 Fujitsu Ten Ltd 出力異常検出機能付きロジツク回路装置
ATE125386T1 (de) * 1989-05-31 1995-08-15 Siemens Ag Verfahren und vorrichtung zum internen paralleltest von halbleiterspeichern.
GB2244364B (en) * 1990-05-24 1994-03-09 Coin Controls Coin discrimination apparatus
US5241265A (en) * 1992-03-26 1993-08-31 Northern Telecom Limited Logic function circuit with an array of data stores and their circuit testing
JP3865828B2 (ja) * 1995-11-28 2007-01-10 株式会社ルネサステクノロジ 半導体記憶装置
JPH10303737A (ja) * 1997-04-23 1998-11-13 Mitsubishi Electric Corp ３入力排他的否定論理和回路
EP0979418B1 (de) 1998-02-02 2003-11-05 Koninklijke Philips Electronics N.V. Schaltkreis mit einer einheit zum testen von verbindungen und ein verfahren zum testen von verbindungen zwischen einem ersten und zweiten elektronischen schaltkreis
JP4044663B2 (ja) * 1998-02-25 2008-02-06 富士通株式会社 半導体装置
DE10066260B4 (de) * 1999-04-30 2013-11-14 Fujitsu Semiconductor Ltd. Halbleiter-Speicheranordnung, Leiterplatte, auf welcher eine Halbleiter-Speicheranordnung montiert ist, und Verfahren zum Testen der Zwischenverbindung zwischen einer Halbleiter-Speicheranordnung und einer Leiterplatte
TW444127B (en) * 1999-08-20 2001-07-01 Taiwan Semiconductor Mfg Comparing circuit, testing circuit and testing method for the parallel test of DRAM devices

Also Published As

Publication number Publication date
JP4176716B2 (ja) 2008-11-05
WO2004005946A3 (en) 2004-06-03
CN1666110A (zh) 2005-09-07
WO2004005946A2 (en) 2004-01-15
AU2003244975A8 (en) 2004-01-23
DE60323232D1 (de) 2008-10-09
TW200403444A (en) 2004-03-01
EP1521974A2 (de) 2005-04-13
US7199573B2 (en) 2007-04-03
EP1521974B1 (de) 2008-08-27
TWI287638B (en) 2007-10-01
US20060061376A1 (en) 2006-03-23
AU2003244975A1 (en) 2004-01-23
CN100401086C (zh) 2008-07-09
JP2005532548A (ja) 2005-10-27

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