ATE413017T1 - Mehrstufiges komparatorsystem und -verfahren mit schneller erholungszeit und geringem offset - Google Patents

Mehrstufiges komparatorsystem und -verfahren mit schneller erholungszeit und geringem offset

Info

Publication number
ATE413017T1
ATE413017T1 AT00307335T AT00307335T ATE413017T1 AT E413017 T1 ATE413017 T1 AT E413017T1 AT 00307335 T AT00307335 T AT 00307335T AT 00307335 T AT00307335 T AT 00307335T AT E413017 T1 ATE413017 T1 AT E413017T1
Authority
AT
Austria
Prior art keywords
comparator system
recovery time
zeroing
fast recovery
multi stage
Prior art date
Application number
AT00307335T
Other languages
English (en)
Inventor
Bruce Edward Amazeen
Michael C W Coln
Scott Wayne
Gerald A Miller
Mick Mueck
Original Assignee
Analog Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analog Devices Inc filed Critical Analog Devices Inc
Application granted granted Critical
Publication of ATE413017T1 publication Critical patent/ATE413017T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
    • H03K5/249—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors using clock signals
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
    • H03F3/45183—Long tailed pairs
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
    • H03F3/45632—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
    • H03F3/45744—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by offset reduction
    • H03F3/45748—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by offset reduction by using a feedback circuit
    • H03F3/45753—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by offset reduction by using a feedback circuit using switching means, e.g. sample and hold
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
    • H03F3/45928—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit
    • H03F3/45968—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction
    • H03F3/45973—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction by using a feedback circuit
    • H03F3/45977—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction by using a feedback circuit using switching means, e.g. sample and hold
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
    • H03K5/2481—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors with at least one differential stage
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45702—Indexing scheme relating to differential amplifiers the LC comprising two resistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Amplifiers (AREA)
  • Manipulation Of Pulses (AREA)
  • Analogue/Digital Conversion (AREA)
  • Measurement Of Current Or Voltage (AREA)
AT00307335T 1999-10-05 2000-08-25 Mehrstufiges komparatorsystem und -verfahren mit schneller erholungszeit und geringem offset ATE413017T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/412,659 US6429697B1 (en) 1999-10-05 1999-10-05 Multi-stage, low-offset, fast-recovery, comparator system and method

Publications (1)

Publication Number Publication Date
ATE413017T1 true ATE413017T1 (de) 2008-11-15

Family

ID=23633883

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00307335T ATE413017T1 (de) 1999-10-05 2000-08-25 Mehrstufiges komparatorsystem und -verfahren mit schneller erholungszeit und geringem offset

Country Status (5)

Country Link
US (1) US6429697B1 (de)
EP (1) EP1091489B1 (de)
JP (1) JP3683486B2 (de)
AT (1) ATE413017T1 (de)
DE (1) DE60040643D1 (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002084862A1 (en) * 2001-04-11 2002-10-24 Koninklijke Philips Electronics N.V. High duty cycle offset compensation for operational amplifiers
US6583660B2 (en) * 2001-05-25 2003-06-24 Infineon Technologies Ag Active auto zero circuit for time continuous open loop amplifiers
US7054609B2 (en) * 2002-04-04 2006-05-30 Telefonaktiebolaget Lm Ericsson (Publ) Linearity improvement of Gilbert mixers
US6753727B2 (en) * 2002-06-13 2004-06-22 Skyworks Solutions, Inc. Sequential DC offset correction for amplifier chain
US6819172B2 (en) * 2002-12-13 2004-11-16 Intel Corporation DC offset cancellation techniques
JP2004312556A (ja) * 2003-04-09 2004-11-04 Sony Corp 差動増幅器及び同差動増幅器を具備する２段増幅器並びに同２段増幅器を具備するアナログ／ディジタル変換器
US7155185B2 (en) * 2004-06-09 2006-12-26 Theta Microelectronics, Inc. Apparatus and methods for eliminating DC offset in a wireless communication device
US7917114B2 (en) * 2005-03-30 2011-03-29 Broadcom Corp. DC cancellation circuit
US7630464B1 (en) * 2005-04-19 2009-12-08 Lattice Semiconductor Corporation Analog-to-digital systems and methods
JP2007006566A (ja) * 2005-06-22 2007-01-11 Hitachi Ltd モータ制御装置
US7336214B2 (en) * 2005-12-16 2008-02-26 Alexander Krymski Analog to digital converter circuit with offset reduction and image sensor using the same
TWI316786B (en) * 2006-01-24 2009-11-01 Realtek Semiconductor Corp Circuit utilizing op-sharing technique
JP2009081749A (ja) * 2007-09-27 2009-04-16 Hitachi Ltd 低オフセット入力回路
US20090134914A1 (en) * 2007-11-27 2009-05-28 Himax Technologies Limited Low offset comparator and offset cancellation method thereof
WO2010044012A1 (en) 2008-10-15 2010-04-22 Nxp B.V. Low-voltage self-calibrated cmos peak detector
KR101201893B1 (ko) * 2008-12-22 2012-11-16 한국전자통신연구원 고속 다단 전압 비교기
US7764215B2 (en) * 2008-12-31 2010-07-27 Hong Kong Applied Science And Technology Research Institute Co., Ltd. Multi-stage comparator with offset canceling capacitor across secondary differential inputs for high-speed low-gain compare and high-gain auto-zeroing
JP5427663B2 (ja) * 2010-03-24 2014-02-26 スパンション エルエルシー Ａ／ｄ変換器
US8508257B2 (en) * 2011-04-28 2013-08-13 Analog Devices, Inc. Noise cancellation system and method for amplifiers
US8258864B1 (en) 2011-09-21 2012-09-04 Hong Kong Applied Science And Technology Research Institute Co., Ltd. Ultra low voltage multi-stage high-speed CMOS comparator with autozeroing
US8493098B1 (en) 2012-03-14 2013-07-23 Honeywell International Inc. Systems and methods for compensating the input offset voltage of a comparator
US9602062B2 (en) 2014-06-30 2017-03-21 Qualcomm Incorporated Audio switching amplifier
US11005469B1 (en) * 2019-11-27 2021-05-11 Robert Bosch Gmbh Two step high speed auto-zero and self-calibration comparator
CN110995213B (zh) * 2019-11-27 2023-07-07 芯创智创新设计服务中心(宁波)有限公司 一种低失调高精度静态比较器
US11444580B2 (en) * 2020-04-01 2022-09-13 Stmicroelectronics International N.V. Devices and methods for offset cancellation
US12261578B2 (en) 2020-04-01 2025-03-25 Stmicroelectronics International N.V. Devices and methods for offset cancellation
US11742843B2 (en) * 2020-04-23 2023-08-29 Silicon Laboratories Inc. Apparatus for offset cancellation in comparators and associated methods
US11764759B2 (en) 2020-04-23 2023-09-19 Silicon Laboratories Inc. Apparatus for offset cancellation in comparators and associated methods
CN115189657A (zh) * 2022-07-29 2022-10-14 普源精电科技股份有限公司 一种失调电压校准电路及校准方法
EP4462676A1 (de) 2023-05-12 2024-11-13 Nxp B.V. Verstärkerschaltung

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH659745A5 (de) * 1983-06-08 1987-02-13 Landis & Gyr Ag Verstaerker mit niedriger offset-spannung.
US4599602A (en) * 1983-08-03 1986-07-08 Matsushita Electric Industrial Co., Ltd. Serial-type A/D converter utilizing folding circuit cells
US4883987A (en) 1988-05-04 1989-11-28 Texas Instruments Incorporated Comparator circuit having a fast recovery time
IT1225620B (it) * 1988-10-06 1990-11-22 Sgs Thomson Microelectronics Comparatore cmos interamente differenziale a grande risoluzione
US4962323A (en) * 1989-07-12 1990-10-09 National Semiconductor Corporation High speed auto zero comparator
US5600275A (en) 1994-04-29 1997-02-04 Analog Devices, Inc. Low-voltage CMOS comparator with offset cancellation

Also Published As

Publication number Publication date
EP1091489A3 (de) 2004-06-09
EP1091489B1 (de) 2008-10-29
US6429697B1 (en) 2002-08-06
EP1091489A2 (de) 2001-04-11
DE60040643D1 (de) 2008-12-11
JP2001144556A (ja) 2001-05-25
JP3683486B2 (ja) 2005-08-17

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