ATE418806T1 - Nitrid-halbleiterlaservorrichtung - Google Patents
Nitrid-halbleiterlaservorrichtungInfo
- Publication number
- ATE418806T1 ATE418806T1 AT05252041T AT05252041T ATE418806T1 AT E418806 T1 ATE418806 T1 AT E418806T1 AT 05252041 T AT05252041 T AT 05252041T AT 05252041 T AT05252041 T AT 05252041T AT E418806 T1 ATE418806 T1 AT E418806T1
- Authority
- AT
- Austria
- Prior art keywords
- nitride semiconductor
- laser device
- semiconductor laser
- conductivity type
- sub
- Prior art date
Links
- 150000004767 nitrides Chemical class 0.000 title abstract 6
- 239000004065 semiconductor Substances 0.000 title abstract 6
- 239000000758 substrate Substances 0.000 abstract 2
- 239000013078 crystal Substances 0.000 abstract 1
- 229910052738 indium Inorganic materials 0.000 abstract 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 abstract 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/223—Buried stripe structure
- H01S5/2231—Buried stripe structure with inner confining structure only between the active layer and the upper electrode
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- E—FIXED CONSTRUCTIONS
- E06—DOORS, WINDOWS, SHUTTERS, OR ROLLER BLINDS IN GENERAL; LADDERS
- E06B—FIXED OR MOVABLE CLOSURES FOR OPENINGS IN BUILDINGS, VEHICLES, FENCES OR LIKE ENCLOSURES IN GENERAL, e.g. DOORS, WINDOWS, BLINDS, GATES
- E06B7/00—Special arrangements or measures in connection with doors or windows
- E06B7/28—Other arrangements on doors or windows, e.g. door-plates, windows adapted to carry plants, hooks for window cleaners
- E06B7/32—Serving doors; Passing-through doors ; Pet-doors
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
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- E—FIXED CONSTRUCTIONS
- E06—DOORS, WINDOWS, SHUTTERS, OR ROLLER BLINDS IN GENERAL; LADDERS
- E06B—FIXED OR MOVABLE CLOSURES FOR OPENINGS IN BUILDINGS, VEHICLES, FENCES OR LIKE ENCLOSURES IN GENERAL, e.g. DOORS, WINDOWS, BLINDS, GATES
- E06B5/00—Doors, windows, or like closures for special purposes; Border constructions therefor
- E06B5/10—Doors, windows, or like closures for special purposes; Border constructions therefor for protection against air-raid or other war-like action; for other protective purposes
- E06B5/11—Doors, windows, or like closures for special purposes; Border constructions therefor for protection against air-raid or other war-like action; for other protective purposes against burglary
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2301/00—Functional characteristics
- H01S2301/17—Semiconductor lasers comprising special layers
- H01S2301/176—Specific passivation layers on surfaces other than the emission facet
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2304/00—Special growth methods for semiconductor lasers
- H01S2304/04—MOCVD or MOVPE
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2304/00—Special growth methods for semiconductor lasers
- H01S2304/12—Pendeo epitaxial lateral overgrowth [ELOG], e.g. for growing GaN based blue laser diodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/0014—Measuring characteristics or properties thereof
- H01S5/0021—Degradation or life time measurements
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0201—Separation of the wafer into individual elements, e.g. by dicing, cleaving, etching or directly during growth
- H01S5/0202—Cleaving
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/026—Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/028—Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04252—Electrodes, e.g. characterised by the structure characterised by the material
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04254—Electrodes, e.g. characterised by the structure characterised by the shape
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/1082—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region with a special facet structure, e.g. structured, non planar, oblique
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2004—Confining in the direction perpendicular to the layer structure
- H01S5/2009—Confining in the direction perpendicular to the layer structure by using electron barrier layers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2201—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure in a specific crystallographic orientation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
- H01S5/2214—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers based on oxides or nitrides
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
- H01S5/3054—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure p-doping
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/3202—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures grown on specifically orientated substrates, or using orientation dependent growth
- H01S5/320275—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures grown on specifically orientated substrates, or using orientation dependent growth semi-polar orientation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34333—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Geometry (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Structural Engineering (AREA)
- Civil Engineering (AREA)
- Semiconductor Lasers (AREA)
- Led Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004110019 | 2004-04-02 | ||
| JP2004223755 | 2004-07-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE418806T1 true ATE418806T1 (de) | 2009-01-15 |
Family
ID=34889465
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT05252041T ATE418806T1 (de) | 2004-04-02 | 2005-03-31 | Nitrid-halbleiterlaservorrichtung |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US7408199B2 (de) |
| EP (1) | EP1583190B1 (de) |
| KR (1) | KR101337689B1 (de) |
| CN (1) | CN100499299C (de) |
| AT (1) | ATE418806T1 (de) |
| DE (1) | DE602005011881C5 (de) |
Families Citing this family (50)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100964399B1 (ko) * | 2003-03-08 | 2010-06-17 | 삼성전자주식회사 | 반도체 레이저 다이오드 및 이를 채용한 반도체 레이저다이오드 조립체 |
| US8368183B2 (en) * | 2004-11-02 | 2013-02-05 | Sharp Kabushiki Kaisha | Nitride semiconductor device |
| JP2006179565A (ja) | 2004-12-21 | 2006-07-06 | Sony Corp | 半導体レーザ素子 |
| JP4525353B2 (ja) * | 2005-01-07 | 2010-08-18 | 住友電気工業株式会社 | Iii族窒化物基板の製造方法 |
| JP2007073761A (ja) * | 2005-09-07 | 2007-03-22 | Sumitomo Electric Ind Ltd | 窒化物半導体基板及び窒化物半導体基板の加工方法 |
| JP2007207827A (ja) * | 2006-01-31 | 2007-08-16 | Toshiba Corp | 半導体レーザ装置 |
| JP4905125B2 (ja) * | 2006-01-26 | 2012-03-28 | 日亜化学工業株式会社 | 窒化物半導体レーザ素子及びその製造方法 |
| KR100755649B1 (ko) * | 2006-04-05 | 2007-09-04 | 삼성전기주식회사 | GaN계 반도체 발광소자 및 그 제조방법 |
| US8357243B2 (en) * | 2008-06-12 | 2013-01-22 | Sixpoint Materials, Inc. | Method for testing group III-nitride wafers and group III-nitride wafers with test data |
| WO2007149487A2 (en) * | 2006-06-21 | 2007-12-27 | The Regents Of The University Of California | Opto-electronic and electronic devices using n-face or m-plane gan substrate prepared with ammonothermal growth |
| JP4884866B2 (ja) * | 2006-07-25 | 2012-02-29 | 三菱電機株式会社 | 窒化物半導体装置の製造方法 |
| JP2008109066A (ja) * | 2006-09-29 | 2008-05-08 | Rohm Co Ltd | 発光素子 |
| US8080833B2 (en) * | 2007-01-26 | 2011-12-20 | Crystal Is, Inc. | Thick pseudomorphic nitride epitaxial layers |
| WO2008101625A1 (de) * | 2007-02-23 | 2008-08-28 | Freiberger Compounds Materials Gmbh | Verfahren zur herstellung von (al,ga)n kristallen |
| JP4232837B2 (ja) * | 2007-03-28 | 2009-03-04 | 住友電気工業株式会社 | 窒化物半導体発光素子を作製する方法 |
| KR101509834B1 (ko) * | 2007-08-03 | 2015-04-14 | 니치아 카가쿠 고교 가부시키가이샤 | 반도체 발광 소자 및 그 제조 방법 |
| JP5022136B2 (ja) * | 2007-08-06 | 2012-09-12 | 三洋電機株式会社 | 半導体素子の製造方法および半導体素子 |
| JP5225639B2 (ja) * | 2007-09-06 | 2013-07-03 | 浜松ホトニクス株式会社 | 半導体レーザ素子の製造方法 |
| KR20100064383A (ko) | 2007-09-19 | 2010-06-14 | 더 리전츠 오브 더 유니버시티 오브 캘리포니아 | 패터닝 된 기판 상의 (Al,In,GA,B)N 장치구조 |
| DE102008009108A1 (de) * | 2008-02-14 | 2009-08-20 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines Halbleiterlasers sowie Halbleiterlaser |
| WO2009108700A1 (en) * | 2008-02-25 | 2009-09-03 | Sixpoint Materials, Inc. | Method for producing group iii nitride wafers and group iii nitride wafers |
| JP4539752B2 (ja) * | 2008-04-09 | 2010-09-08 | 住友電気工業株式会社 | 量子井戸構造の形成方法および半導体発光素子の製造方法 |
| EP3330413B1 (de) * | 2008-06-04 | 2020-09-09 | SixPoint Materials, Inc. | Verfahren zur züchtung von gruppe-iii-nitrid-kristallen mithilfe eines hochdruckgefässes |
| WO2009149299A1 (en) * | 2008-06-04 | 2009-12-10 | Sixpoint Materials | Methods for producing improved crystallinty group iii-nitride crystals from initial group iii-nitride seed by ammonothermal growth |
| JP5077303B2 (ja) * | 2008-10-07 | 2012-11-21 | 住友電気工業株式会社 | 窒化ガリウム系半導体発光素子、窒化ガリウム系半導体発光素子を作製する方法、窒化ガリウム系発光ダイオード、エピタキシャルウエハ、及び窒化ガリウム系発光ダイオードを作製する方法 |
| WO2010045567A1 (en) * | 2008-10-16 | 2010-04-22 | Sixpoint Materials, Inc. | Reactor design for growing group iii nitride crystals and method of growing group iii nitride crystals |
| JP2010135733A (ja) * | 2008-11-07 | 2010-06-17 | Panasonic Corp | 窒化物半導体レーザ装置及びその製造方法 |
| US8852341B2 (en) * | 2008-11-24 | 2014-10-07 | Sixpoint Materials, Inc. | Methods for producing GaN nutrient for ammonothermal growth |
| JP4775455B2 (ja) * | 2009-02-17 | 2011-09-21 | 住友電気工業株式会社 | Iii族窒化物半導体レーザ、及びiii族窒化物半導体レーザを作製する方法 |
| WO2010129718A2 (en) | 2009-05-05 | 2010-11-11 | Sixpoint Materials, Inc. | Growth reactor for gallium-nitride crystals using ammonia and hydrogen chloride |
| PL217437B1 (pl) * | 2009-05-30 | 2014-07-31 | Inst Wysokich Ciśnień Polskiej Akademii Nauk | Dioda laserowa i sposób wytwarzania diody laserowej |
| TW201121100A (en) * | 2009-06-09 | 2011-06-16 | Sinmat Inc | High light extraction efficiency solid state light sources |
| JP2011023473A (ja) * | 2009-07-14 | 2011-02-03 | Sumitomo Electric Ind Ltd | Iii族窒化物半導体レーザダイオード |
| JP4905514B2 (ja) * | 2009-07-15 | 2012-03-28 | 住友電気工業株式会社 | 窒化物系半導体発光素子 |
| JP4978667B2 (ja) * | 2009-07-15 | 2012-07-18 | 住友電気工業株式会社 | 窒化ガリウム系半導体レーザダイオード |
| US7965752B1 (en) * | 2009-11-30 | 2011-06-21 | Corning Incorporated | Native green laser semiconductor devices |
| US8866153B2 (en) * | 2010-01-19 | 2014-10-21 | Sharp Kabushiki Kaisha | Functional element and manufacturing method of same |
| EP2541624A4 (de) * | 2010-04-01 | 2013-05-15 | Panasonic Corp | Nitridhalbleiterelement und herstellungsverfahren dafür |
| US8451876B1 (en) * | 2010-05-17 | 2013-05-28 | Soraa, Inc. | Method and system for providing bidirectional light sources with broad spectrum |
| WO2012165108A1 (ja) * | 2011-06-02 | 2012-12-06 | 住友電気工業株式会社 | 炭化珪素基板の製造方法 |
| CN103608986B (zh) * | 2011-07-05 | 2016-02-10 | 日亚化学工业株式会社 | 半导体激光元件 |
| JP2013038394A (ja) * | 2011-07-14 | 2013-02-21 | Rohm Co Ltd | 半導体レーザ素子 |
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| JP3471700B2 (ja) | 1999-03-17 | 2003-12-02 | 三菱電線工業株式会社 | 半導体基材 |
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| JP3929008B2 (ja) * | 2000-01-14 | 2007-06-13 | シャープ株式会社 | 窒化物系化合物半導体発光素子およびその製造方法 |
| JP2002016000A (ja) | 2000-06-27 | 2002-01-18 | Sanyo Electric Co Ltd | 窒化物系半導体素子および窒化物系半導体基板 |
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| US6576932B2 (en) * | 2001-03-01 | 2003-06-10 | Lumileds Lighting, U.S., Llc | Increasing the brightness of III-nitride light emitting devices |
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| JP3910043B2 (ja) | 2001-10-29 | 2007-04-25 | シャープ株式会社 | 窒化物半導体レーザ素子、その製造方法および半導体光学装置 |
| JP2003133587A (ja) | 2001-10-29 | 2003-05-09 | Kyocera Corp | 発光ダイオード |
| WO2003038957A1 (fr) * | 2001-10-29 | 2003-05-08 | Sharp Kabushiki Kaisha | Dispositif a semi-conducteur au nitrure, son procede de fabrication et appareil optique a semi-conducteur |
| JP2004071657A (ja) | 2002-08-01 | 2004-03-04 | Nec Corp | Iii族窒化物半導体素子、iii族窒化物半導体基板およびiii族窒化物半導体素子の製造方法 |
| TWI347054B (en) * | 2003-07-11 | 2011-08-11 | Nichia Corp | Nitride semiconductor laser device and method of manufacturing the nitride semiconductor laser device |
| JP4276020B2 (ja) * | 2003-08-01 | 2009-06-10 | 豊田合成株式会社 | Iii族窒化物系化合物半導体の製造方法 |
| JP4540347B2 (ja) * | 2004-01-05 | 2010-09-08 | シャープ株式会社 | 窒化物半導体レーザ素子及び、その製造方法 |
| JP4830315B2 (ja) * | 2004-03-05 | 2011-12-07 | 日亜化学工業株式会社 | 半導体レーザ素子 |
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2005
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- 2005-03-31 EP EP05252041A patent/EP1583190B1/de not_active Expired - Lifetime
- 2005-03-31 US US10/907,398 patent/US7408199B2/en not_active Expired - Lifetime
- 2005-03-31 DE DE602005011881.0T patent/DE602005011881C5/de not_active Expired - Lifetime
- 2005-04-01 KR KR1020050027647A patent/KR101337689B1/ko not_active Expired - Lifetime
- 2005-04-04 CN CNB2005100562813A patent/CN100499299C/zh not_active Expired - Lifetime
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2008
- 2008-04-09 US US12/100,247 patent/US7813397B2/en not_active Expired - Lifetime
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|---|---|
| US7813397B2 (en) | 2010-10-12 |
| DE602005011881D1 (de) | 2009-02-05 |
| US20080192788A1 (en) | 2008-08-14 |
| KR101337689B1 (ko) | 2013-12-06 |
| EP1583190A1 (de) | 2005-10-05 |
| EP1583190B1 (de) | 2008-12-24 |
| KR20060045438A (ko) | 2006-05-17 |
| US20050224783A1 (en) | 2005-10-13 |
| CN1677778A (zh) | 2005-10-05 |
| DE602005011881C5 (de) | 2016-07-28 |
| CN100499299C (zh) | 2009-06-10 |
| US7408199B2 (en) | 2008-08-05 |
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