ATE420372T1 - Testpräparierte integrierte hf-schaltung - Google Patents

Testpräparierte integrierte hf-schaltung

Info

Publication number
ATE420372T1
ATE420372T1 AT06727743T AT06727743T ATE420372T1 AT E420372 T1 ATE420372 T1 AT E420372T1 AT 06727743 T AT06727743 T AT 06727743T AT 06727743 T AT06727743 T AT 06727743T AT E420372 T1 ATE420372 T1 AT E420372T1
Authority
AT
Austria
Prior art keywords
circuit
local oscillator
signal
oscillator signal
integrated circuit
Prior art date
Application number
AT06727743T
Other languages
English (en)
Inventor
Cicero S Vaucher
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE420372T1 publication Critical patent/ATE420372T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Polysaccharides And Polysaccharide Derivatives (AREA)
  • Bipolar Transistors (AREA)
AT06727743T 2005-03-30 2006-03-27 Testpräparierte integrierte hf-schaltung ATE420372T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP05102523 2005-03-30

Publications (1)

Publication Number Publication Date
ATE420372T1 true ATE420372T1 (de) 2009-01-15

Family

ID=36607483

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06727743T ATE420372T1 (de) 2005-03-30 2006-03-27 Testpräparierte integrierte hf-schaltung

Country Status (7)

Country Link
US (1) US7739069B2 (de)
EP (1) EP1866658B1 (de)
JP (1) JP2008534952A (de)
CN (1) CN101151545A (de)
AT (1) ATE420372T1 (de)
DE (1) DE602006004721D1 (de)
WO (1) WO2006103617A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2343564A1 (de) 2009-12-23 2011-07-13 Nxp B.V. Integierte Chip-Selbttestvorrichtung und -verfahren
US8614584B2 (en) * 2011-03-02 2013-12-24 Sandisk Technologies Inc. System and method for bonded configuration pad continuity check
US8463224B2 (en) * 2011-10-12 2013-06-11 Tektronix, Inc. Arbitrary multiband overlay mixer apparatus and method for bandwidth multiplication
US20140167795A1 (en) * 2012-12-14 2014-06-19 Texas Instruments Incorporated Active feedback silicon failure analysis die temperature control system

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4219770A (en) * 1979-01-11 1980-08-26 Weinschel Engineering Co., Inc. Insertion loss and phase shift measurement system and method
US6966021B2 (en) * 1998-06-16 2005-11-15 Janusz Rajski Method and apparatus for at-speed testing of digital circuits
CN1204408C (zh) 2000-03-24 2005-06-01 汤姆森许可公司 采用可控制和可测试振荡器的集成电路
US6400188B1 (en) * 2000-06-30 2002-06-04 Cypress Semiconductor Corp. Test mode clock multiplication
JP4115676B2 (ja) * 2001-03-16 2008-07-09 株式会社東芝 半導体記憶装置
US20060111072A1 (en) * 2002-05-31 2006-05-25 Silicon Laboratories Inc. Wireless communication system and method using clock swapping during image rejection calibration
US6898543B2 (en) * 2002-07-23 2005-05-24 Adc Dsl Systems, Inc. In-system testing of an oscillator

Also Published As

Publication number Publication date
CN101151545A (zh) 2008-03-26
US20080208508A1 (en) 2008-08-28
DE602006004721D1 (de) 2009-02-26
EP1866658B1 (de) 2009-01-07
WO2006103617A1 (en) 2006-10-05
JP2008534952A (ja) 2008-08-28
US7739069B2 (en) 2010-06-15
EP1866658A1 (de) 2007-12-19

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties