ATE422285T1 - Phasenbestimmung in einem phasenabbildungsverfahren - Google Patents

Phasenbestimmung in einem phasenabbildungsverfahren

Info

Publication number
ATE422285T1
ATE422285T1 AT97948656T AT97948656T ATE422285T1 AT E422285 T1 ATE422285 T1 AT E422285T1 AT 97948656 T AT97948656 T AT 97948656T AT 97948656 T AT97948656 T AT 97948656T AT E422285 T1 ATE422285 T1 AT E422285T1
Authority
AT
Austria
Prior art keywords
radiation
phase
values
penetrating
obtaining
Prior art date
Application number
AT97948656T
Other languages
English (en)
Inventor
Stephen Wilkins
Andrew Stevenson
Andrew Pogany
Timur Gureyev
Original Assignee
Xrt Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AUPO4344A external-priority patent/AUPO434496A0/en
Priority claimed from AUPO8991A external-priority patent/AUPO899197A0/en
Application filed by Xrt Ltd filed Critical Xrt Ltd
Application granted granted Critical
Publication of ATE422285T1 publication Critical patent/ATE422285T1/de

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/02—Constructional details
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/482—Diagnostic techniques involving multiple energy imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Surgery (AREA)
  • Optics & Photonics (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Biophysics (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Theoretical Computer Science (AREA)
  • Pulmonology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AT97948656T 1996-12-24 1997-12-24 Phasenbestimmung in einem phasenabbildungsverfahren ATE422285T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AUPO4344A AUPO434496A0 (en) 1996-12-24 1996-12-24 Deriving a phase-contrast image with a point source
AUPO8991A AUPO899197A0 (en) 1997-09-05 1997-09-05 Deriving a phase-contrast image with a point source

Publications (1)

Publication Number Publication Date
ATE422285T1 true ATE422285T1 (de) 2009-02-15

Family

ID=25645337

Family Applications (1)

Application Number Title Priority Date Filing Date
AT97948656T ATE422285T1 (de) 1996-12-24 1997-12-24 Phasenbestimmung in einem phasenabbildungsverfahren

Country Status (12)

Country Link
US (2) US6226353B1 (de)
EP (1) EP0954951B1 (de)
JP (1) JP4436459B2 (de)
KR (1) KR100511470B1 (de)
CN (1) CN1214698C (de)
AT (1) ATE422285T1 (de)
AU (1) AU716800B2 (de)
CA (1) CA2276051C (de)
DE (1) DE69739243D1 (de)
IL (1) IL130628A0 (de)
RU (1) RU2214697C2 (de)
WO (1) WO1998028950A1 (de)

Families Citing this family (56)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE422285T1 (de) * 1996-12-24 2009-02-15 Xrt Ltd Phasenbestimmung in einem phasenabbildungsverfahren
AUPP690098A0 (en) * 1998-11-02 1998-11-26 University Of Melbourne, The Phase determination of a radiation wave field
DE60036161T3 (de) * 1999-07-16 2012-04-19 Konica Corp. Verfahren zur Aufnahme von Röntgenstrahlen-Bildern
US6526121B1 (en) * 2000-03-29 2003-02-25 Yeu-Kuang Hwu Apparatus and method for imaging an object with real-time response
US6349128B1 (en) * 2000-04-27 2002-02-19 Philips Electronics North America Corporation Method and device using x-rays to measure thickness and composition of thin films
JP2001299733A (ja) * 2000-04-27 2001-10-30 Konica Corp Ｐｃｉ放射線画像処理装置、ｐｃｉ放射線画像検出処理装置、ｐｃｉ放射線画像出力装置及びｐｃｉ画像診断支援装置
US6870896B2 (en) 2000-12-28 2005-03-22 Osmic, Inc. Dark-field phase contrast imaging
US6804324B2 (en) * 2001-03-01 2004-10-12 Osmo, Inc. X-ray phase contrast imaging using a fabry-perot interferometer concept
JP2002336232A (ja) * 2001-05-16 2002-11-26 Fuji Photo Film Co Ltd 位相コントラスト画像生成方法および装置並びにプログラム
US6792070B2 (en) * 2001-10-16 2004-09-14 Fuji Photo Film Co., Ltd. Radiation image recording method and apparatus
JP4137499B2 (ja) * 2002-04-23 2008-08-20 富士フイルム株式会社 位相情報復元方法及び位相情報復元装置、並びに、位相情報復元プログラム
US7171031B2 (en) * 2002-04-30 2007-01-30 Fuji Photo Film Co., Ltd. Method, apparatus, and program for restoring phase information
JP4137514B2 (ja) * 2002-05-16 2008-08-20 富士フイルム株式会社 放射線画像構成方法及びこれを使用する放射線撮像装置、並びに、放射線撮像プログラム
US20040052426A1 (en) * 2002-09-12 2004-03-18 Lockheed Martin Corporation Non-iterative method and system for phase retrieval
US7424173B2 (en) * 2002-09-30 2008-09-09 Fujifilm Corporation Method, apparatus and program for restoring phase information
JP4137580B2 (ja) * 2002-10-04 2008-08-20 富士フイルム株式会社 位相情報復元方法及び位相情報復元装置、並びに、位相情報復元プログラム
US7103140B2 (en) * 2002-11-26 2006-09-05 Konica Minolta Medical & Graphic Inc. Radiation image radiographic apparatus
JP2004248736A (ja) * 2003-02-18 2004-09-09 Konica Minolta Holdings Inc 放射線画像撮影装置
US8319975B2 (en) * 2004-03-11 2012-11-27 Nano-Or Technologies (Israel) Ltd. Methods and apparatus for wavefront manipulations and improved 3-D measurements
US7412024B1 (en) * 2004-04-09 2008-08-12 Xradia, Inc. X-ray mammography
US7286640B2 (en) * 2004-04-09 2007-10-23 Xradia, Inc. Dual-band detector system for x-ray imaging of biological samples
GB0409572D0 (en) * 2004-04-29 2004-06-02 Univ Sheffield High resolution imaging
CN100442044C (zh) * 2004-12-15 2008-12-10 中国科学院上海光学精密机械研究所 中子干涉仪中位相恢复方法
US7634152B2 (en) * 2005-03-07 2009-12-15 Hewlett-Packard Development Company, L.P. System and method for correcting image vignetting
EP1943605A1 (de) * 2005-11-04 2008-07-16 Christian Hogl Verfahren und system zum übertragen von daten von einer ersten datenverarbeitungseinrichtung an eine zweite datenverarbeitungseinrichtung
JP4788887B2 (ja) * 2005-11-11 2011-10-05 独立行政法人物質・材料研究機構 透過電子顕微鏡
DE102006015356B4 (de) * 2006-02-01 2016-09-22 Siemens Healthcare Gmbh Verfahren zur Erzeugung projektiver und tomographischer Phasenkontrastaufnahmen mit einem Röntgen-System
CN101622526A (zh) * 2006-02-27 2010-01-06 罗切斯特大学 相衬锥束ct成像
US7564545B2 (en) * 2007-03-15 2009-07-21 Kla-Tencor Technologies Corp. Inspection methods and systems for lithographic masks
EP2214558B1 (de) * 2007-11-26 2017-08-30 Koninklijke Philips N.V. Erkennungskonfiguration für eine röntgenphasenkontrastbildgebung
US7693256B2 (en) * 2008-03-19 2010-04-06 C-Rad Innovation Ab Phase-contrast X-ray imaging
JP4737724B2 (ja) * 2008-04-21 2011-08-03 コニカミノルタホールディングス株式会社 放射線画像処理装置
GB0817650D0 (en) * 2008-09-26 2008-11-05 Phase Focus Ltd Improvements in the field of imaging
US8913714B2 (en) 2009-04-17 2014-12-16 Siemens Aktiengesellschaft Detector arrangement and X-ray tomography device for performing phase-contrast measurements and method for performing a phase-contrast measurement
EP2442722B1 (de) * 2009-06-16 2017-03-29 Koninklijke Philips N.V. Korrekturverfahren für differenzielle phasenkontrastbildgebung
US8705694B2 (en) * 2009-11-11 2014-04-22 Physical Optics Corporation X-ray imaging system and method
GB201020516D0 (en) * 2010-12-03 2011-01-19 Univ Sheffield Improvements in providing image data
DE102011077982B4 (de) * 2011-06-22 2017-11-30 Hochschule Bremen Verfahren und Vorrichtung zur optischen Analyse eines Prüflings
CN104039227B (zh) * 2012-01-12 2018-02-02 皇家飞利浦有限公司 在x射线系统中生成衰减图像数据和相位图像数据
CN102867294B (zh) * 2012-05-28 2015-06-17 天津大学 基于傅里叶和小波正则化的同轴相衬图像恢复方法
DE102012211146A1 (de) * 2012-06-28 2014-01-02 Siemens Aktiengesellschaft Verfahren und Röntgensystem zur Erzeugung einer Phasenkontrastdarstellung
AU2012258412A1 (en) * 2012-11-30 2014-06-19 Canon Kabushiki Kaisha Combining differential images by inverse Riesz transformation
US9364191B2 (en) 2013-02-11 2016-06-14 University Of Rochester Method and apparatus of spectral differential phase-contrast cone-beam CT and hybrid cone-beam CT
KR20140109192A (ko) * 2013-03-05 2014-09-15 삼성전자주식회사 엑스선 영상 장치 및 그 제어 방법
KR20140111818A (ko) * 2013-03-12 2014-09-22 삼성전자주식회사 엑스선 영상 장치 및 그 제어 방법
CN103559686B (zh) * 2013-10-16 2016-07-06 中国科学院深圳先进技术研究院 一种基于多面图像信息的同轴相衬成像相位恢复方法及系统
GB2519955B (en) * 2013-11-01 2015-09-30 Paragon Inspection Ltd Apparatus and method for radiological pipe inspection
JP2016538978A (ja) * 2013-11-05 2016-12-15 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． フォトン束の高速空間変調を用いるｘ線撮像装置
TWI629474B (zh) * 2014-05-23 2018-07-11 財團法人工業技術研究院 Ｘ光光源以及ｘ光成像的方法
CN104323790B (zh) * 2014-10-27 2016-09-21 中国科学院深圳先进技术研究院 同轴相衬成像方法及系统和相衬ct方法及系统
EP3312619B1 (de) 2016-10-19 2022-03-30 Rohde & Schwarz GmbH & Co. KG Testsystem und verfahren zum testen einer zu testenden vorrichtung
JP2019007802A (ja) * 2017-06-22 2019-01-17 株式会社東芝 光学検査装置及び光学検査方法
CN107432749B (zh) * 2017-07-05 2019-05-21 天津大学 一种x射线相衬成像的相位抽取方法
JP2021067456A (ja) * 2018-02-22 2021-04-30 株式会社ニコン Ｘ線画像生成方法、ｘ線装置および構造物の製造方法
US11033243B2 (en) * 2019-04-18 2021-06-15 Prismatic Sensors Ab In-line x-ray focusing optics used for manipulation of x-rays in medical transmission radiography
CN114325810B (zh) * 2022-01-12 2025-08-15 深圳技术大学 一种寻找聚变中子入射点位置的方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5005200A (en) * 1988-02-12 1991-04-02 Fischer Addison M Public key/signature cryptosystem with enhanced digital signature certification
US5241364A (en) 1990-10-19 1993-08-31 Fuji Photo Film Co., Ltd. Confocal scanning type of phase contrast microscope and scanning microscope
RU2012872C1 (ru) * 1991-05-14 1994-05-15 Виктор Натанович Ингал Способ получения изображения внутренней структуры объекта
US5802137A (en) * 1993-08-16 1998-09-01 Commonwealth Scientific And Industrial Research X-ray optics, especially for phase contrast imaging
WO1995008174A1 (de) * 1993-09-15 1995-03-23 Carl-Zeiss-Stiftung Handelnd Als Carl Zeiss Phasenkontrast-röntgenmikroskop
JP3449791B2 (ja) * 1994-08-23 2003-09-22 理化学研究所 撮像方法及び撮像装置
US5646997A (en) * 1994-12-14 1997-07-08 Barton; James M. Method and apparatus for embedding authentication information within digital data
AU4973596A (en) * 1995-02-10 1996-08-27 Cardiac Mariners Incorporated Scanning-beam x-ray imaging system
EP2110732A3 (de) * 1995-02-13 2009-12-09 Intertrust Technologies Corporation Systeme und Verfahren für die sichere Transaktionsverwaltung und elektronischen Rechtsschutz
AUPN201295A0 (en) * 1995-03-28 1995-04-27 Commonwealth Scientific And Industrial Research Organisation Simplified conditions and configurations for phase-contrast imaging with hard x-rays
US6011874A (en) * 1995-04-28 2000-01-04 Forskningscenter Riso (Danish National Laboratory) Phase contrast imaging
EP0799600B1 (de) * 1996-03-29 2004-09-08 Hitachi, Ltd. Bilderzeugungssystem mit Phasenkontrast für Röntgenstrahlen
US5844986A (en) * 1996-09-30 1998-12-01 Intel Corporation Secure BIOS
ATE422285T1 (de) * 1996-12-24 2009-02-15 Xrt Ltd Phasenbestimmung in einem phasenabbildungsverfahren

Also Published As

Publication number Publication date
CA2276051A1 (en) 1998-07-02
IL130628A0 (en) 2000-06-01
HK1026565A1 (en) 2000-12-15
AU716800B2 (en) 2000-03-09
DE69739243D1 (de) 2009-03-19
US6493422B2 (en) 2002-12-10
KR100511470B1 (ko) 2005-08-31
EP0954951A4 (de) 2005-02-16
CN1214698C (zh) 2005-08-10
WO1998028950A1 (en) 1998-07-02
RU2214697C2 (ru) 2003-10-20
EP0954951A1 (de) 1999-11-10
US6226353B1 (en) 2001-05-01
US20020041653A1 (en) 2002-04-11
JP2001506160A (ja) 2001-05-15
JP4436459B2 (ja) 2010-03-24
CA2276051C (en) 2005-10-18
KR20000069718A (ko) 2000-11-25
EP0954951B1 (de) 2009-02-04
AU7876798A (en) 1998-07-17
CN1247687A (zh) 2000-03-15

Similar Documents

Publication Publication Date Title
ATE422285T1 (de) Phasenbestimmung in einem phasenabbildungsverfahren
RU99116264A (ru) Способ нахождения фазы при получении фазовых контрастных изображений
ATE2863T1 (de) Vorrichtung und verfahren zur akustischen pruefung eines mikroskopisch kleinen teils eines objekts.
SE421669B (sv) Apparat for att bilda en bild av en tunn skiva av ett foremal, som granskas medelst genomtrengande stralning
GB2359716B (en) An imaging apparatus and method
JPS55157233A (en) Method and apparatus for monitoring etching
JPS5794627A (en) Stress distribution measuring instrument
EP0361770A3 (de) Verfahren und Vorrichtung zur Messung von Partikeln
ITGE970086A1 (it) Termografia ad impulso costante.
ATE39028T1 (de) Auswahl eines energiefensters fuer eine vorrichtung zur behandlung eines strahlungssignals.
CA2122782A1 (en) Apparatus for Measuring an Ambient Physical Parameter Applied to a Highly Birefringent Sensing Fiber and Method
EP0003527A3 (en) Method and apparatus for focus adjustment in an electron beam system
EP0178069A3 (de) Verfahren und Vorrichtung zur Untersuchung der Verteilung der Radioaktivität in einem Behälter
GB2186363A (en) Determining crystal orientation
WO2003077724A3 (en) Method for improving the accuracy of data obtained in a laser imaging apparatus
TW200517677A (en) Irradiation system having cybernetic parameter acquisition system
JPS56153228A (en) Method and device for measurement of stress
O’Neill et al. External beam profiles measured with film or ionization chamber
JPS5410791A (en) Measurement of electron-spin resonance
GAMO Imaging of incoherent objects by intensity correlation interferometry[Final Report, Oct. 1971- Sep. 1976]
Harrison et al. The design of a non-destructive single-shot longitudinal bunch profile monitor using smith-purcell radiation
Valente et al. Design of an integral radiation dosimetry system optimized for modern medical applications
Vladimirov et al. Biological Activity of the Human Skin Studied by Method of Speckle Counting.
JPS5418293A (en) X-ray tomogram image acquisition device
Milton et al. MEASUREIvlENT AND SIMULATION OF BEAM-BEAM EFFECTS INTHE WEAK/STRONG REGIME

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties