ATE422676T1 - Architektur zur selbstprüfung einer integrierten schaltung - Google Patents

Architektur zur selbstprüfung einer integrierten schaltung

Info

Publication number
ATE422676T1
ATE422676T1 AT05807208T AT05807208T ATE422676T1 AT E422676 T1 ATE422676 T1 AT E422676T1 AT 05807208 T AT05807208 T AT 05807208T AT 05807208 T AT05807208 T AT 05807208T AT E422676 T1 ATE422676 T1 AT E422676T1
Authority
AT
Austria
Prior art keywords
integrated circuit
self
monitor
operable
architecture
Prior art date
Application number
AT05807208T
Other languages
English (en)
Inventor
Marcel Pelgrom
Hendricus Veendrick
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE422676T1 publication Critical patent/ATE422676T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
AT05807208T 2004-11-29 2005-11-23 Architektur zur selbstprüfung einer integrierten schaltung ATE422676T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP04106128 2004-11-29

Publications (1)

Publication Number Publication Date
ATE422676T1 true ATE422676T1 (de) 2009-02-15

Family

ID=36165377

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05807208T ATE422676T1 (de) 2004-11-29 2005-11-23 Architektur zur selbstprüfung einer integrierten schaltung

Country Status (7)

Country Link
US (1) US7710136B2 (de)
EP (1) EP1820037B1 (de)
JP (1) JP2008522148A (de)
CN (1) CN101065680B (de)
AT (1) ATE422676T1 (de)
DE (1) DE602005012723D1 (de)
WO (1) WO2006056951A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8281158B2 (en) * 2007-05-30 2012-10-02 Lapis Semiconductor Co., Ltd. Semiconductor integrated circuit
CN102047133A (zh) 2008-05-29 2011-05-04 Nxp股份有限公司 用于周期抖动测量的延迟锁定环
JP2010066019A (ja) * 2008-09-08 2010-03-25 Nec Electronics Corp テスト回路およびテスト方法
US10145882B2 (en) * 2010-09-24 2018-12-04 Infineon Technologies Ag Sensor self-diagnostics using multiple signal paths
US9346441B2 (en) * 2010-09-24 2016-05-24 Infineon Technologies Ag Sensor self-diagnostics using multiple signal paths
CN103335597B (zh) * 2013-07-02 2015-12-02 中国科学院长春光学精密机械与物理研究所 光栅尺光电传感器
CN104701299A (zh) * 2013-12-06 2015-06-10 上海北京大学微电子研究院 Qfn封装-高速ic协同设计信号完整性分析方法
CN108872830A (zh) * 2018-06-07 2018-11-23 苏州纳芯微电子股份有限公司 一种用于传感器调理芯片的单线测试方法
CN111025132B (zh) * 2018-10-09 2022-02-15 瑞昱半导体股份有限公司 系统芯片、以及其内建自我测试电路与自我测试方法
EP4279930A1 (de) * 2022-05-18 2023-11-22 B/E Aerospace, Inc. Boundary-scan-test für echtzeitstatusüberwachung

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5563524A (en) * 1989-05-19 1996-10-08 A.T.E. Solutions, Inc. Apparatus for testing electric circuits
US5528600A (en) * 1991-01-28 1996-06-18 Actel Corporation Testability circuits for logic arrays
US5285152A (en) * 1992-03-23 1994-02-08 Ministar Peripherals International Limited Apparatus and methods for testing circuit board interconnect integrity
JPH07209381A (ja) * 1993-12-10 1995-08-11 Internatl Business Mach Corp <Ibm> 回路ネットワークにおけるバウンダリ・スキャン検査システム及び方法
US6556021B1 (en) * 2000-11-29 2003-04-29 Lsi Logic Corporation Device frequency measurement system
US7285948B2 (en) * 2002-12-17 2007-10-23 Tektronix, Inc. Method and apparatus providing single cable bi-directional triggering between instruments
KR20050089889A (ko) * 2003-01-28 2005-09-08 코닌클리즈케 필립스 일렉트로닉스 엔.브이. 물리적 동작 파라미터 감지용 집적 센서를 갖는 집적 회로장치와 이러한 장치를 갖는 전자 시스템의 테스트 방법 및이를 포함하는 전자 장치
JP3632692B2 (ja) * 2003-01-30 2005-03-23 セイコーエプソン株式会社 テスト回路、集積回路及びテスト方法
JP2008538863A (ja) * 2005-04-25 2008-11-06 エヌエックスピー ビー ヴィ 電源電圧の監視

Also Published As

Publication number Publication date
JP2008522148A (ja) 2008-06-26
US20080272797A1 (en) 2008-11-06
EP1820037B1 (de) 2009-02-11
CN101065680B (zh) 2011-08-31
EP1820037A1 (de) 2007-08-22
DE602005012723D1 (de) 2009-03-26
US7710136B2 (en) 2010-05-04
CN101065680A (zh) 2007-10-31
WO2006056951A1 (en) 2006-06-01

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Legal Events

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