ATE425445T1 - Optische heterodyne-sampling-einrichtung - Google Patents

Optische heterodyne-sampling-einrichtung

Info

Publication number
ATE425445T1
ATE425445T1 AT06831000T AT06831000T ATE425445T1 AT E425445 T1 ATE425445 T1 AT E425445T1 AT 06831000 T AT06831000 T AT 06831000T AT 06831000 T AT06831000 T AT 06831000T AT E425445 T1 ATE425445 T1 AT E425445T1
Authority
AT
Austria
Prior art keywords
signal
sampling device
optical heterodyne
probe beam
pulses
Prior art date
Application number
AT06831000T
Other languages
English (en)
Inventor
Stefan Dilhaire
Wilfrid Claeys
Jean-Michel Rampnoux
Clement Rossignol
Original Assignee
Centre Nat Rech Scient
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre Nat Rech Scient filed Critical Centre Nat Rech Scient
Application granted granted Critical
Publication of ATE425445T1 publication Critical patent/ATE425445T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F13/00—Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00
    • G04F13/02—Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00 using optical means
    • G04F13/026—Measuring duration of ultra-short light pulses, e.g. in the pico-second range; particular detecting devices therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/04—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1734—Sequential different kinds of measurements; Combining two or more methods
    • G01N2021/1736—Sequential different kinds of measurements; Combining two or more methods with two or more light sources
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1789—Time resolved
    • G01N2021/1791—Time resolved stroboscopic; pulse gated; time range gated
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
    • H01S3/139—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length
    • H01S3/1394—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length by using an active reference, e.g. second laser, klystron or other standard frequency source

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
AT06831000T 2005-10-21 2006-10-20 Optische heterodyne-sampling-einrichtung ATE425445T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0510776A FR2892511B1 (fr) 2005-10-21 2005-10-21 Dispositif d'echantillonnage optique heterodyne

Publications (1)

Publication Number Publication Date
ATE425445T1 true ATE425445T1 (de) 2009-03-15

Family

ID=36615627

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06831000T ATE425445T1 (de) 2005-10-21 2006-10-20 Optische heterodyne-sampling-einrichtung

Country Status (7)

Country Link
US (1) US7728317B2 (de)
EP (1) EP1949055B1 (de)
JP (1) JP4897821B2 (de)
AT (1) ATE425445T1 (de)
DE (1) DE602006005708D1 (de)
FR (1) FR2892511B1 (de)
WO (1) WO2007045773A1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8120778B2 (en) 2009-03-06 2012-02-21 Imra America, Inc. Optical scanning and imaging systems based on dual pulsed laser systems
US8264693B2 (en) * 2007-12-06 2012-09-11 The Regents Of The University Of Michigan Method and system for measuring at least one property including a magnetic property of a material using pulsed laser sources
JP5148381B2 (ja) * 2008-06-18 2013-02-20 株式会社アドバンテスト 光測定装置
WO2011041472A1 (en) 2009-10-02 2011-04-07 Imra America, Inc. Optical signal processing with modelocked lasers
FR2977320B1 (fr) 2011-06-29 2014-11-21 Ecole Polytech Dispositif de gestion d'impulsions en spectroscopie pompe-sonde.
US8446587B2 (en) * 2011-08-16 2013-05-21 Alex Gusev Flash photolysis system
US8724111B2 (en) 2011-08-16 2014-05-13 Alex Gusev Flash photolysis system
DE102011112893A1 (de) * 2011-09-06 2013-03-07 Philipp Kubina Verfahren und Vorrichtung zur zeitaufgelösten Messung von Messsignalen
US9846120B2 (en) * 2012-09-24 2017-12-19 Advantest Corporation Light measurement apparatus, method, program and recording medium
JP5865946B2 (ja) * 2014-05-22 2016-02-17 株式会社ユニソク 過渡吸収測定方法及び過渡吸収測定装置
US20170299512A1 (en) * 2016-04-14 2017-10-19 Boyd V. Hunter Differential Excitation Raman Spectroscopy
FR3096781B1 (fr) 2019-05-28 2021-06-04 Univ Bordeaux système de mesure acoustique picoseconde à double faisceaux sondes
FR3103896B1 (fr) 2019-11-29 2024-03-08 Neta Dispositif de mesure photo-acoustique multipoints
CN116879208B (zh) * 2023-09-08 2023-11-28 星元极光(苏州)光电科技有限公司 瞬态吸收光谱测量方法和装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3131621B2 (ja) * 1991-09-27 2001-02-05 工業技術院長 炭化水素類の分離法
US5778016A (en) * 1994-04-01 1998-07-07 Imra America, Inc. Scanning temporal ultrafast delay methods and apparatuses therefor
US5604592A (en) * 1994-09-19 1997-02-18 Textron Defense Systems, Division Of Avco Corporation Laser ultrasonics-based material analysis system and method using matched filter processing
US5814820A (en) * 1996-02-09 1998-09-29 The Board Of Trustees Of The University Of Illinois Pump probe cross correlation fluorescence frequency domain microscope and microscopy
US5978074A (en) * 1997-07-03 1999-11-02 Therma-Wave, Inc. Apparatus for evaluating metalized layers on semiconductors
US7009695B2 (en) * 2003-04-01 2006-03-07 Applied Materials, Inc. Full frame thermal pump probe technique for detecting subsurface defects

Also Published As

Publication number Publication date
WO2007045773A1 (fr) 2007-04-26
JP4897821B2 (ja) 2012-03-14
US20080251740A1 (en) 2008-10-16
JP2009512848A (ja) 2009-03-26
FR2892511B1 (fr) 2008-05-09
EP1949055A1 (de) 2008-07-30
FR2892511A1 (fr) 2007-04-27
DE602006005708D1 (de) 2009-04-23
EP1949055B1 (de) 2009-03-11
US7728317B2 (en) 2010-06-01

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