ATE426896T1 - Stromeffizienter speicher und karten - Google Patents

Stromeffizienter speicher und karten

Info

Publication number
ATE426896T1
ATE426896T1 AT05790390T AT05790390T ATE426896T1 AT E426896 T1 ATE426896 T1 AT E426896T1 AT 05790390 T AT05790390 T AT 05790390T AT 05790390 T AT05790390 T AT 05790390T AT E426896 T1 ATE426896 T1 AT E426896T1
Authority
AT
Austria
Prior art keywords
cards
power efficient
efficient storage
voltage
internal
Prior art date
Application number
AT05790390T
Other languages
English (en)
Inventor
Frankie Roohparvar
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Application granted granted Critical
Publication of ATE426896T1 publication Critical patent/ATE426896T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/143—Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Power Sources (AREA)
  • Read Only Memory (AREA)
  • Dc-Dc Converters (AREA)
  • Electrically Operated Instructional Devices (AREA)
  • Control Of Eletrric Generators (AREA)
  • Credit Cards Or The Like (AREA)
AT05790390T 2004-08-31 2005-08-24 Stromeffizienter speicher und karten ATE426896T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/930,524 US7196958B2 (en) 2004-08-31 2004-08-31 Power efficient memory and cards

Publications (1)

Publication Number Publication Date
ATE426896T1 true ATE426896T1 (de) 2009-04-15

Family

ID=35478684

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05790390T ATE426896T1 (de) 2004-08-31 2005-08-24 Stromeffizienter speicher und karten

Country Status (9)

Country Link
US (2) US7196958B2 (de)
EP (1) EP1784832B1 (de)
JP (1) JP4843796B2 (de)
KR (1) KR100904341B1 (de)
CN (1) CN101031976B (de)
AT (1) ATE426896T1 (de)
DE (1) DE602005013534D1 (de)
TW (1) TWI313873B (de)
WO (1) WO2006026282A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7196958B2 (en) * 2004-08-31 2007-03-27 Micron Technology, Inc. Power efficient memory and cards
WO2006057049A1 (ja) 2004-11-26 2006-06-01 Kabushiki Kaisha Toshiba カードおよびホスト機器
US8060142B2 (en) * 2006-05-24 2011-11-15 Lg Electronics Inc. Method for reducing power consumption for detachable card and mobile communication terminal thereof
US7512029B2 (en) * 2006-06-09 2009-03-31 Micron Technology, Inc. Method and apparatus for managing behavior of memory devices
US8615467B2 (en) 2007-11-07 2013-12-24 International Business Machines Corporation Electronic system for selecting the best card from a collection of consumer credit, debit, and discount cards
JP5386931B2 (ja) * 2007-11-15 2014-01-15 株式会社リコー メモリカード制御装置およびメモリカード制御方法
CN102395988B (zh) * 2009-04-27 2015-04-29 日本电气株式会社 卡装置以及卡装置的供电方法
TWI416313B (zh) * 2009-07-31 2013-11-21 Via Tech Inc 可省電之電腦系統及其省電方法、可省電之電源管理單元
KR102133962B1 (ko) 2019-04-23 2020-07-15 주식회사 에프이씨 무선 컨트롤이 가능한 다목적 개인 이동 시스템
KR102133955B1 (ko) 2019-04-23 2020-07-15 주식회사 에프이씨 조향기능을 갖는 다목적 개인 이동장치

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JP2923985B2 (ja) 1989-07-26 1999-07-26 日本電気株式会社 Ｅｅｐｒｏｍ装置
US5291584A (en) * 1991-07-23 1994-03-01 Nexcom Technology, Inc. Methods and apparatus for hard disk emulation
US5267218A (en) 1992-03-31 1993-11-30 Intel Corporation Nonvolatile memory card with a single power supply input
JP3053301B2 (ja) * 1992-09-11 2000-06-19 三菱電機株式会社 半導体集積回路及びｉｃカード
US5530640A (en) 1992-10-13 1996-06-25 Mitsubishi Denki Kabushiki Kaisha IC substrate and boosted voltage generation circuits
US5664231A (en) * 1994-04-29 1997-09-02 Tps Electronics PCMCIA interface card for coupling input devices such as barcode scanning engines to personal digital assistants and palmtop computers
CN1109347C (zh) * 1994-10-19 2003-05-21 英特尔公司 快速存储器的电源
US5495453A (en) * 1994-10-19 1996-02-27 Intel Corporation Low power voltage detector circuit including a flash memory cell
US5483486A (en) * 1994-10-19 1996-01-09 Intel Corporation Charge pump circuit for providing multiple output voltages for flash memory
US5594360A (en) * 1994-10-19 1997-01-14 Intel Corporation Low current reduced area programming voltage detector for flash memory
US5671179A (en) * 1994-10-19 1997-09-23 Intel Corporation Low power pulse generator for smart voltage flash eeprom
US5651011A (en) * 1995-06-01 1997-07-22 Micron Technology, Inc. Method and apparatus for initiating and controlling test modes within an integrated circuit
US5657284A (en) * 1995-09-19 1997-08-12 Micron Technology, Inc. Apparatus and method for testing for defects between memory cells in packaged semiconductor memory devices
US5965902A (en) * 1995-09-19 1999-10-12 Micron Technology Method and apparatus for testing of dielectric defects in a packaged semiconductor memory device
KR0179852B1 (ko) 1995-10-25 1999-04-15 문정환 차지 펌프 회로
US5874849A (en) 1996-07-19 1999-02-23 Texas Instruments Incorporated Low voltage, high current pump for flash memory
US6037792A (en) * 1996-12-21 2000-03-14 Stmicroelectronics, Inc. Burn-in stress test mode
US5991851A (en) * 1997-05-02 1999-11-23 Enhanced Memory Systems, Inc. Enhanced signal processing random access memory device utilizing a DRAM memory array integrated with an associated SRAM cache and internal refresh control
US6154851A (en) * 1997-08-05 2000-11-28 Micron Technology, Inc. Memory repair
US6208542B1 (en) * 1998-06-30 2001-03-27 Sandisk Corporation Techniques for storing digital data in an analog or multilevel memory
KR100272511B1 (ko) * 1998-08-10 2000-11-15 김영환 반도체 메모리소자의 고전압 발생회로
US6166961A (en) 1999-08-19 2000-12-26 Aplus Flash Technology, Inc. Approach to provide high external voltage for flash memory erase
FR2800214B1 (fr) * 1999-10-22 2001-12-28 St Microelectronics Sa Circuit elevateur de tension de type pompe de charge
US7073014B1 (en) * 2000-07-28 2006-07-04 Micron Technology, Inc. Synchronous non-volatile memory system
US6469474B2 (en) * 2000-09-08 2002-10-22 Compaq Information Technologies Group, L.P. Battery gauge using a resettable decrementer in a DIMM
US6515901B2 (en) 2000-12-29 2003-02-04 Intel Corporation Method and apparatus for allowing continuous application of high voltage to a flash memory device power pin
JP2002296515A (ja) * 2001-03-30 2002-10-09 Ngk Insulators Ltd ディスプレイの光学系
JP2003085484A (ja) * 2001-09-11 2003-03-20 Ricoh Co Ltd Ｉｃカードシステム
WO2003036722A1 (fr) * 2001-10-26 2003-05-01 Fujitsu Limited Circuit integre a semi-conducteur, dispositif electronique dans lequel ce circuit integre est incorpore et procede d'economie d'energie
JP2003187596A (ja) * 2001-12-14 2003-07-04 Mitsubishi Electric Corp 半導体記憶装置
JP2003208794A (ja) * 2002-01-10 2003-07-25 Seiko Epson Corp 不揮発性半導体記憶装置
JP2003316664A (ja) 2002-04-24 2003-11-07 Mitsubishi Electric Corp 不揮発性半導体記憶装置
JP4133166B2 (ja) * 2002-09-25 2008-08-13 株式会社ルネサステクノロジ 不揮発性半導体記憶装置
US6870774B2 (en) * 2002-12-10 2005-03-22 Micron, Technology, Inc. Flash memory architecture for optimizing performance of memory having multi-level memory cells
US7196958B2 (en) * 2004-08-31 2007-03-27 Micron Technology, Inc. Power efficient memory and cards

Also Published As

Publication number Publication date
US20060044887A1 (en) 2006-03-02
JP2008511921A (ja) 2008-04-17
EP1784832B1 (de) 2009-03-25
CN101031976B (zh) 2010-05-26
TWI313873B (en) 2009-08-21
DE602005013534D1 (de) 2009-05-07
KR20070054718A (ko) 2007-05-29
JP4843796B2 (ja) 2011-12-21
CN101031976A (zh) 2007-09-05
WO2006026282A1 (en) 2006-03-09
US20070189099A1 (en) 2007-08-16
US7483330B2 (en) 2009-01-27
KR100904341B1 (ko) 2009-06-23
EP1784832A1 (de) 2007-05-16
US7196958B2 (en) 2007-03-27
TW200623142A (en) 2006-07-01

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties