ATE427529T1 - Merkmalorientierte testprogrammentwicklung und ausfuhrung - Google Patents

Merkmalorientierte testprogrammentwicklung und ausfuhrung

Info

Publication number
ATE427529T1
ATE427529T1 AT04791187T AT04791187T ATE427529T1 AT E427529 T1 ATE427529 T1 AT E427529T1 AT 04791187 T AT04791187 T AT 04791187T AT 04791187 T AT04791187 T AT 04791187T AT E427529 T1 ATE427529 T1 AT E427529T1
Authority
AT
Austria
Prior art keywords
test
execution
target
management unit
test system
Prior art date
Application number
AT04791187T
Other languages
English (en)
Inventor
Eyck Jan Van
Original Assignee
Verigy Pte Ltd Singapore
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Verigy Pte Ltd Singapore filed Critical Verigy Pte Ltd Singapore
Application granted granted Critical
Publication of ATE427529T1 publication Critical patent/ATE427529T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/70—Software maintenance or management
    • G06F8/71—Version control; Configuration management
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for program control, e.g. control units
    • G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/44—Arrangements for executing specific programs
    • G06F9/445—Program loading or initiating
    • G06F9/44505—Configuring for program initiating, e.g. using registry, configuration files

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Computer Security & Cryptography (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Debugging And Monitoring (AREA)
  • Devices For Executing Special Programs (AREA)
  • Stored Programmes (AREA)
AT04791187T 2004-10-08 2004-10-08 Merkmalorientierte testprogrammentwicklung und ausfuhrung ATE427529T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2004/052487 WO2006037379A1 (en) 2004-10-08 2004-10-08 Feature-oriented test program development and execution

Publications (1)

Publication Number Publication Date
ATE427529T1 true ATE427529T1 (de) 2009-04-15

Family

ID=34958908

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04791187T ATE427529T1 (de) 2004-10-08 2004-10-08 Merkmalorientierte testprogrammentwicklung und ausfuhrung

Country Status (7)

Country Link
US (1) US7930603B2 (de)
EP (2) EP1815328B1 (de)
JP (1) JP2008516205A (de)
CN (1) CN100573449C (de)
AT (1) ATE427529T1 (de)
DE (1) DE602004020401D1 (de)
WO (1) WO2006037379A1 (de)

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US20090265703A1 (en) * 2008-04-22 2009-10-22 Electronic Data Systems Corporation System and method for application portability
DE102008039380A1 (de) * 2008-08-22 2010-02-25 It-Designers Gmbh Prüfsystem
US9164859B2 (en) * 2009-09-25 2015-10-20 Qualcomm Incorporated Computing device for enabling concurrent testing
US8954933B2 (en) 2011-05-31 2015-02-10 International Business Machines Corporation Interactive semi-automatic test case maintenance
US8799866B2 (en) 2011-05-31 2014-08-05 International Business Machines Corporation Automatic generation of user interfaces
US20130117005A1 (en) * 2011-11-08 2013-05-09 International Business Machines Corporation Coverage analysis for multiple test methodologies
US9959186B2 (en) * 2012-11-19 2018-05-01 Teradyne, Inc. Debugging in a semiconductor device test environment
US9785542B2 (en) * 2013-04-16 2017-10-10 Advantest Corporation Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing
US9689922B2 (en) * 2013-12-20 2017-06-27 Advantest Corporation Online design validation for electronic devices
AU2018200643A1 (en) * 2017-03-09 2018-09-27 Accenture Global Solutions Limited Smart advisory for distributed and composite testing teams based on production data and analytics
CN111190406B (zh) * 2019-12-25 2022-11-18 中国航空工业集团公司西安飞机设计研究所 一种起落架控制系统软件的测试方法
US20240004776A1 (en) * 2020-10-22 2024-01-04 Arizona Board Of Regents On Behalf Of Arizona State University User-space emulation framework for heterogeneous soc design
TW202236053A (zh) 2020-10-22 2022-09-16 美國亞利桑那州立大學亞利桑那州評議委員會 Ｈｉｌｉｔｅ﹔用於嵌入式系統單晶片（ｓｏｃ）之電源管理的分層及輕量級模仿學習
KR102881740B1 (ko) * 2020-11-10 2025-11-04 삼성전자주식회사 동작 파라미터에 대한 다수의 파라미터 코드들을 저장하는 장치, 메모리 장치 및 방법
CN113138852A (zh) * 2021-04-06 2021-07-20 Oppo广东移动通信有限公司 资源加载方法、装置、芯片以及电子设备
US12571841B2 (en) * 2021-06-04 2026-03-10 Tektronix, Inc. General digital signal processing waveform machine learning control application
CN116341427A (zh) * 2022-12-21 2023-06-27 珠海一微半导体股份有限公司 适用不同ate平台的芯片测试方法、装置、系统和存储介质

Family Cites Families (10)

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NZ220423A (en) * 1986-05-30 1989-07-27 Honeywell Bull Multiprocessor system; shared resource status appears on bus
US5951639A (en) * 1996-02-14 1999-09-14 Powertv, Inc. Multicast downloading of software and data modules and their compatibility requirements
US6473794B1 (en) * 1999-05-27 2002-10-29 Accenture Llp System for establishing plan to test components of web based framework by displaying pictorial representation and conveying indicia coded components of existing network framework
CN1155212C (zh) * 1999-12-22 2004-06-23 深圳市中兴通讯股份有限公司 一种自动规程测试系统及测试方法
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Also Published As

Publication number Publication date
DE602004020401D1 (de) 2009-05-14
JP2008516205A (ja) 2008-05-15
US20070250570A1 (en) 2007-10-25
CN100573449C (zh) 2009-12-23
WO2006037379A1 (en) 2006-04-13
EP1850230A3 (de) 2009-05-13
CN101095107A (zh) 2007-12-26
EP1815328A1 (de) 2007-08-08
EP1850230A2 (de) 2007-10-31
EP1815328B1 (de) 2009-04-01
US7930603B2 (en) 2011-04-19

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