ATE428174T1 - Magnetwiderstands-speicherelement - Google Patents

Magnetwiderstands-speicherelement

Info

Publication number
ATE428174T1
ATE428174T1 AT01272327T AT01272327T ATE428174T1 AT E428174 T1 ATE428174 T1 AT E428174T1 AT 01272327 T AT01272327 T AT 01272327T AT 01272327 T AT01272327 T AT 01272327T AT E428174 T1 ATE428174 T1 AT E428174T1
Authority
AT
Austria
Prior art keywords
storage element
magnetic resistance
magnetoresistive element
resistance storage
magnetic field
Prior art date
Application number
AT01272327T
Other languages
English (en)
Inventor
Akihiro Odagawa
Masayoshi Hiramoto
Nozomu Matukawa
Original Assignee
Panasonic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corp filed Critical Panasonic Corp
Application granted granted Critical
Publication of ATE428174T1 publication Critical patent/ATE428174T1/de

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
    • H10B61/20—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors
    • H10B61/22—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors of the field-effect transistor [FET] type
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165—Auxiliary circuits
    • G11C11/1659—Cell access
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165—Auxiliary circuits
    • G11C11/1675—Writing or programming circuits or methods
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00—Galvanomagnetic devices
    • H10N50/10—Magnetoresistive devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Semiconductor Memories (AREA)
  • Hall/Mr Elements (AREA)
  • Mram Or Spin Memory Techniques (AREA)
  • Magnetic Heads (AREA)
AT01272327T 2000-12-26 2001-12-26 Magnetwiderstands-speicherelement ATE428174T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000394319 2000-12-26

Publications (1)

Publication Number Publication Date
ATE428174T1 true ATE428174T1 (de) 2009-04-15

Family

ID=18859964

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01272327T ATE428174T1 (de) 2000-12-26 2001-12-26 Magnetwiderstands-speicherelement

Country Status (7)

Country Link
US (1) US6778427B2 (de)
EP (1) EP1359621B1 (de)
CN (1) CN1245762C (de)
AT (1) ATE428174T1 (de)
DE (1) DE60138310D1 (de)
TW (1) TW544677B (de)
WO (1) WO2002052650A1 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1717743B (zh) * 2002-11-28 2014-05-14 Nxp股份有限公司 用于在磁致电阻存储器件的写操作期间改善磁场产生的方法和设备
JP2004289100A (ja) * 2003-01-31 2004-10-14 Japan Science & Technology Agency Ｃｐｐ型巨大磁気抵抗素子及びそれを用いた磁気部品並びに磁気装置
JP2004246994A (ja) * 2003-02-14 2004-09-02 Fuji Electric Holdings Co Ltd マスタディスクの製造方法
US20040257861A1 (en) * 2003-06-17 2004-12-23 Berndt Dale F. Method of incorporating magnetic materials in a semiconductor manufacturing process
US7390529B2 (en) * 2004-05-26 2008-06-24 Headway Technologies, Inc. Free layer for CPP GMR having iron rich NiFe
WO2006022197A1 (ja) * 2004-08-25 2006-03-02 Nec Corporation メモリセル及び磁気ランダムアクセスメモリ
US7813164B2 (en) * 2004-08-26 2010-10-12 Nec Corporation Magneto resistance element and magnetic random access memory
CN100495567C (zh) * 2004-10-28 2009-06-03 中国科学院物理研究所 外围电路平衡驱动的磁随机存取存储器
US7390530B2 (en) * 2004-11-30 2008-06-24 Headway Technologies, Inc. Structure and process for composite free layer in CPP GMR device
JP2006179109A (ja) * 2004-12-22 2006-07-06 Matsushita Electric Ind Co Ltd メモリ回路
US7602590B2 (en) 2005-01-12 2009-10-13 Headway Technologies, Inc. Tunneling magneto-resistive spin valve sensor with novel composite free layer
US7742261B2 (en) * 2005-01-12 2010-06-22 Headway Technologies, Inc. Tunneling magneto-resistive spin valve sensor with novel composite free layer
US7918014B2 (en) * 2005-07-13 2011-04-05 Headway Technologies, Inc. Method of manufacturing a CPP structure with enhanced GMR ratio
CN101546598B (zh) * 2008-03-27 2011-12-14 台湾积体电路制造股份有限公司 磁阻随机存取存储器装置与其切换方法与存储器阵列
US8686484B2 (en) 2011-06-10 2014-04-01 Everspin Technologies, Inc. Spin-torque magnetoresistive memory element and method of fabricating same
US10483320B2 (en) 2015-12-10 2019-11-19 Everspin Technologies, Inc. Magnetoresistive stack with seed region and method of manufacturing the same
EP4514109A3 (de) 2015-12-10 2025-04-30 Everspin Technologies, Inc. Magnetoresistiver stapel, seed-region dafür und verfahren zur herstellung davon
US10361361B2 (en) * 2016-04-08 2019-07-23 International Business Machines Corporation Thin reference layer for STT MRAM
JP6822301B2 (ja) * 2017-04-27 2021-01-27 Tdk株式会社 磁気抵抗効果デバイス及び高周波デバイス
US12402327B2 (en) * 2022-01-13 2025-08-26 Taiwan Semiconductor Manufaturing Company, Ltd. Memory devices and methods of forming the same

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5587943A (en) * 1995-02-13 1996-12-24 Integrated Microtransducer Electronics Corporation Nonvolatile magnetoresistive memory with fully closed flux operation
US5640343A (en) * 1996-03-18 1997-06-17 International Business Machines Corporation Magnetic memory array using magnetic tunnel junction devices in the memory cells
US5894447A (en) * 1996-09-26 1999-04-13 Kabushiki Kaisha Toshiba Semiconductor memory device including a particular memory cell block structure
US6028786A (en) * 1997-04-28 2000-02-22 Canon Kabushiki Kaisha Magnetic memory element having coupled magnetic layers forming closed magnetic circuit
JP3679593B2 (ja) * 1998-01-28 2005-08-03 キヤノン株式会社 磁性薄膜素子および磁性薄膜メモリ素子およびその記録再生方法
DE69923386T2 (de) * 1998-05-13 2005-12-22 Sony Corp. Bauelement mit magnetischem Material und Adressierverfahren dafür
US6436526B1 (en) * 1999-06-17 2002-08-20 Matsushita Electric Industrial Co., Ltd. Magneto-resistance effect element, magneto-resistance effect memory cell, MRAM and method for performing information write to or read from the magneto-resistance effect memory cell
JP3758933B2 (ja) * 2000-03-27 2006-03-22 シャープ株式会社 磁気メモリおよびその記録方法
JP3653442B2 (ja) * 2000-03-29 2005-05-25 シャープ株式会社 磁気メモリおよびその記録方法
EP1115164B1 (de) * 2000-01-07 2005-05-25 Sharp Kabushiki Kaisha Magnetoresistive Anordnung und diese verwendendes magnetisches Speicherelement
JP4472122B2 (ja) * 2000-06-19 2010-06-02 株式会社ルネサステクノロジ 磁気ランダムアクセスメモリおよびその製造方法
JP4050446B2 (ja) * 2000-06-30 2008-02-20 株式会社東芝 固体磁気メモリ
US6594175B2 (en) * 2000-07-11 2003-07-15 Integrated Magnetoelectronics Corp High density giant magnetoresistive memory cell
US6413788B1 (en) * 2001-02-28 2002-07-02 Micron Technology, Inc. Keepers for MRAM electrodes

Also Published As

Publication number Publication date
EP1359621B1 (de) 2009-04-08
US6778427B2 (en) 2004-08-17
CN1483222A (zh) 2004-03-17
EP1359621A1 (de) 2003-11-05
TW544677B (en) 2003-08-01
CN1245762C (zh) 2006-03-15
WO2002052650A1 (en) 2002-07-04
EP1359621A4 (de) 2006-11-29
US20040047190A1 (en) 2004-03-11
DE60138310D1 (de) 2009-05-20

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