ATE441869T1 - Versorgungsspannungsüberwachung - Google Patents

Versorgungsspannungsüberwachung

Info

Publication number
ATE441869T1
ATE441869T1 AT06727974T AT06727974T ATE441869T1 AT E441869 T1 ATE441869 T1 AT E441869T1 AT 06727974 T AT06727974 T AT 06727974T AT 06727974 T AT06727974 T AT 06727974T AT E441869 T1 ATE441869 T1 AT E441869T1
Authority
AT
Austria
Prior art keywords
supply voltage
integrated circuit
voltage monitoring
circuit
realized
Prior art date
Application number
AT06727974T
Other languages
English (en)
Inventor
Marcel Pelgrom
Violeta Petrescu
Hendricus Veendrick
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE441869T1 publication Critical patent/ATE441869T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/28—Arrangements for measuring currents or voltages or for indicating presence or sign thereof adapted for measuring in circuits having distributed constants

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Stand-By Power Supply Arrangements (AREA)
  • Valve-Gear Or Valve Arrangements (AREA)
  • Continuous Casting (AREA)
  • Analogue/Digital Conversion (AREA)
  • Control Of Voltage And Current In General (AREA)
AT06727974T 2005-04-25 2006-04-20 Versorgungsspannungsüberwachung ATE441869T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP05103336 2005-04-25
PCT/IB2006/051214 WO2006114727A1 (en) 2005-04-25 2006-04-20 Supply voltage monitoring

Publications (1)

Publication Number Publication Date
ATE441869T1 true ATE441869T1 (de) 2009-09-15

Family

ID=36658784

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06727974T ATE441869T1 (de) 2005-04-25 2006-04-20 Versorgungsspannungsüberwachung

Country Status (7)

Country Link
US (1) US7538570B2 (de)
EP (1) EP1877806B1 (de)
JP (1) JP2008538863A (de)
CN (1) CN101185003B (de)
AT (1) ATE441869T1 (de)
DE (1) DE602006008920D1 (de)
WO (1) WO2006114727A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008522148A (ja) * 2004-11-29 2008-06-26 エヌエックスピー ビー ヴィ 集積回路のセルフテストアーキテクチャ
CN102047133A (zh) * 2008-05-29 2011-05-04 Nxp股份有限公司 用于周期抖动测量的延迟锁定环
TWI381261B (zh) * 2008-07-18 2013-01-01 Asia Optical Co Inc 電源管理裝置以及電源管理方法
CN102232192A (zh) * 2008-12-05 2011-11-02 Nxp股份有限公司 用于电阻压降和电源噪声测量的简单而稳定的参考
CN101552548B (zh) * 2008-12-15 2011-01-26 伊博电源（杭州）有限公司 一种电源控制系统
CN103148885B (zh) * 2013-03-18 2016-01-20 核工业理化工程研究院 便携式测试仪
CN104345757B (zh) * 2013-07-26 2016-08-24 台达电子电源(东莞)有限公司 电源侦测及校正装置与电源侦测及校正方法
US9523722B2 (en) 2014-06-02 2016-12-20 Winbond Electronics Corporation Method and apparatus for supply voltage glitch detection in a monolithic integrated circuit device
EP2982997B1 (de) * 2014-08-04 2024-05-08 Winbond Electronics Corp. Verfahren und vorrichtung zur versorgungsspannungs-störsignaldetektion in einer monolithischen integrierten schaltvorrichtung
DE102015105090A1 (de) * 2015-04-01 2016-10-06 Krohne Messtechnik Gmbh Verfahren zum Betreiben eines Feldgerätes und entsprechendes Feldgerät
CN104931100A (zh) * 2015-06-17 2015-09-23 核工业理化工程研究院 基于单片机的盘装转速功耗测试仪
JP7197318B2 (ja) * 2018-09-26 2022-12-27 ファナック株式会社 ノイズ検出装置及びノイズ検出方法
US12166445B2 (en) 2022-09-19 2024-12-10 Hamilton Sundstrand Corporation Motor drive direct current link voltage measurement resolution improvement with fault detection
EP4357805A1 (de) * 2022-10-17 2024-04-24 Nxp B.V. Hybrides versorgungsüberwachungssystem für eine radarvorrichtung
WO2026065721A1 (zh) * 2024-09-25 2026-04-02 惠州亿纬锂能股份有限公司 电压检测电路和电压检测方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07159496A (ja) * 1993-10-12 1995-06-23 At & T Global Inf Solutions Internatl Inc 集積回路の検査のための装置及びその方法
JP3274287B2 (ja) * 1994-08-25 2002-04-15 矢崎総業株式会社 電池残存容量測定装置
GB2313004A (en) * 1996-05-07 1997-11-12 Advanced Risc Mach Ltd Digital to analogue converter
US6262567B1 (en) * 1997-08-01 2001-07-17 Lsi Logic Corporation Automatic power supply sensing with on-chip regulation
DE19814696C1 (de) * 1998-04-01 1999-07-08 Siemens Ag Spannungs-Überwachungseinrichtung für zwei unterschiedliche Versorgungsspannungen eines elektronischen Geräts
DE10319157A1 (de) * 2003-04-29 2004-11-25 Infineon Technologies Ag Integrierte Schaltung mit einer Spannungsüberwachungsschaltung sowie ein Verfahren zum Überwachen einer bereitgestellten internen Burn-In-Spannung
GB0425800D0 (en) 2004-11-24 2004-12-22 Koninkl Philips Electronics Nv Montoring physical operating parameters of an integrated circuit
KR100859832B1 (ko) * 2006-09-21 2008-09-23 주식회사 하이닉스반도체 반도체 메모리 장치의 내부전위 모니터 장치 및 모니터방법

Also Published As

Publication number Publication date
EP1877806A1 (de) 2008-01-16
US7538570B2 (en) 2009-05-26
WO2006114727A1 (en) 2006-11-02
DE602006008920D1 (de) 2009-10-15
CN101185003B (zh) 2010-10-27
EP1877806B1 (de) 2009-09-02
CN101185003A (zh) 2008-05-21
JP2008538863A (ja) 2008-11-06
US20080191732A1 (en) 2008-08-14

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Legal Events

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