ATE449144T1 - Siliziumbeschichtung mit niedriger dielektrizitätskonstante, herstellungsverfahren dafür und deren anwendung für integrierte schaltungen - Google Patents
Siliziumbeschichtung mit niedriger dielektrizitätskonstante, herstellungsverfahren dafür und deren anwendung für integrierte schaltungenInfo
- Publication number
- ATE449144T1 ATE449144T1 AT06792850T AT06792850T ATE449144T1 AT E449144 T1 ATE449144 T1 AT E449144T1 AT 06792850 T AT06792850 T AT 06792850T AT 06792850 T AT06792850 T AT 06792850T AT E449144 T1 ATE449144 T1 AT E449144T1
- Authority
- AT
- Austria
- Prior art keywords
- silicone
- low
- application
- production process
- integrated circuits
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/04—Polysiloxanes
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D5/00—Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6342—Liquid deposition, e.g. spin-coating, sol-gel techniques or spray coating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/66—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials
- H10P14/665—Porous materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/66—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials
- H10P14/668—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials
- H10P14/6681—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials the precursor containing a compound comprising Si
- H10P14/6684—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials the precursor containing a compound comprising Si the compound comprising silicon and oxygen
- H10P14/6686—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials the precursor containing a compound comprising Si the compound comprising silicon and oxygen the compound being a molecule comprising at least one silicon-oxygen bond and the compound having hydrogen or an organic group attached to the silicon or oxygen, e.g. a siloxane
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
- H10P14/6922—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/249921—Web or sheet containing structurally defined element or component
- Y10T428/249953—Composite having voids in a component [e.g., porous, cellular, etc.]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/26—Web or sheet containing structurally defined element or component, the element or component having a specified physical dimension
- Y10T428/263—Coating layer not in excess of 5 mils thick or equivalent
- Y10T428/264—Up to 3 mils
- Y10T428/265—1 mil or less
Landscapes
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Wood Science & Technology (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Formation Of Insulating Films (AREA)
- Paints Or Removers (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Silicon Polymers (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0508637A FR2889850B1 (fr) | 2005-08-19 | 2005-08-19 | Revetement silicone de faible constante dielectrique, procede de preparation et application aux circuits integres |
| PCT/EP2006/065370 WO2007020273A1 (fr) | 2005-08-19 | 2006-08-16 | Revetement silicone de faible constante dielectrique, procede de preparation et application aux circuits integres |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE449144T1 true ATE449144T1 (de) | 2009-12-15 |
Family
ID=36293770
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT06792850T ATE449144T1 (de) | 2005-08-19 | 2006-08-16 | Siliziumbeschichtung mit niedriger dielektrizitätskonstante, herstellungsverfahren dafür und deren anwendung für integrierte schaltungen |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US8080286B2 (de) |
| EP (1) | EP1915435B1 (de) |
| JP (1) | JP5219813B2 (de) |
| KR (1) | KR101270189B1 (de) |
| CN (1) | CN101283066B (de) |
| AT (1) | ATE449144T1 (de) |
| DE (1) | DE602006010568D1 (de) |
| FR (1) | FR2889850B1 (de) |
| WO (1) | WO2007020273A1 (de) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3251351B2 (ja) | 1992-09-30 | 2002-01-28 | 株式会社神戸製鋼所 | 肉盛溶接方法 |
| EP2513913A1 (de) * | 2009-12-14 | 2012-10-24 | 3M Innovative Properties Company | Dielektrisches material mit nichtlinearer dielektrischer konstante |
| WO2015111229A1 (ja) * | 2014-01-24 | 2015-07-30 | 住友化学株式会社 | シリコーン樹脂液状組成物 |
| EP3577660A4 (de) | 2017-01-31 | 2020-07-22 | 3M Innovative Properties Company | Mehrschichtiger spannungsregler und trockenabschluss für mittel- und hochspannungskabelanwendungen |
| EP3701549A1 (de) * | 2017-10-26 | 2020-09-02 | Syed Taymur Ahmad | Zusammensetzung mit nicht-newtonschen fluiden für hydrophobe, oleophobe und oleophile beschichtungen und verfahren zur verwendung davon |
| CN121645664A (zh) * | 2024-04-10 | 2026-03-10 | 华为技术有限公司 | 一种成膜组合物及其应用 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4255316A (en) * | 1979-04-26 | 1981-03-10 | Dow Corning Corporation | Ceramifiable silicone adhesives |
| JP2531906B2 (ja) * | 1991-09-13 | 1996-09-04 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 発泡重合体 |
| JP3435325B2 (ja) * | 1997-02-13 | 2003-08-11 | 株式会社東芝 | 低誘電率珪素酸化膜の形成方法 |
| EP0881668A3 (de) * | 1997-05-28 | 2000-11-15 | Dow Corning Toray Silicone Company, Ltd. | Abscheidung eines elektrisch isolierenden Dünnfilms mit einer niedrigen Dielektrizitätskonstante |
| JP2000119595A (ja) * | 1998-10-14 | 2000-04-25 | Shin Etsu Chem Co Ltd | 焼成皮膜形成用オルガノポリシロキサン組成物 |
| KR100683428B1 (ko) * | 1999-10-25 | 2007-02-20 | 다우 코닝 코포레이션 | 용액 용해도와 안정성이 우수한 실리콘 수지 조성물 |
| US6313045B1 (en) * | 1999-12-13 | 2001-11-06 | Dow Corning Corporation | Nanoporous silicone resins having low dielectric constants and method for preparation |
| US6107357A (en) * | 1999-11-16 | 2000-08-22 | International Business Machines Corporatrion | Dielectric compositions and method for their manufacture |
| JP2001214127A (ja) * | 2000-01-31 | 2001-08-07 | Dow Corning Toray Silicone Co Ltd | 電気絶縁性薄膜形成性樹脂組成物、および電気絶縁性薄膜の形成方法 |
| US6271273B1 (en) * | 2000-07-14 | 2001-08-07 | Shipley Company, L.L.C. | Porous materials |
| US6852648B2 (en) * | 2000-09-27 | 2005-02-08 | Agere Systems Inc. | Semiconductor device having a low dielectric constant dielectric material and process for its manufacture |
| JP4545973B2 (ja) * | 2001-03-23 | 2010-09-15 | 富士通株式会社 | シリコン系組成物、低誘電率膜、半導体装置および低誘電率膜の製造方法 |
| JP2003124207A (ja) * | 2001-10-12 | 2003-04-25 | Hitachi Chem Co Ltd | 被膜、被膜形成用塗布液、被膜の製造方法及びその被膜を有する電子部品 |
-
2005
- 2005-08-19 FR FR0508637A patent/FR2889850B1/fr not_active Expired - Fee Related
-
2006
- 2006-08-16 AT AT06792850T patent/ATE449144T1/de not_active IP Right Cessation
- 2006-08-16 EP EP20060792850 patent/EP1915435B1/de not_active Not-in-force
- 2006-08-16 JP JP2008526499A patent/JP5219813B2/ja not_active Expired - Fee Related
- 2006-08-16 WO PCT/EP2006/065370 patent/WO2007020273A1/fr not_active Ceased
- 2006-08-16 US US12/064,062 patent/US8080286B2/en not_active Expired - Fee Related
- 2006-08-16 CN CN2006800302503A patent/CN101283066B/zh not_active Expired - Fee Related
- 2006-08-16 KR KR1020087006683A patent/KR101270189B1/ko not_active Expired - Fee Related
- 2006-08-16 DE DE200660010568 patent/DE602006010568D1/de active Active
Also Published As
| Publication number | Publication date |
|---|---|
| FR2889850B1 (fr) | 2007-11-02 |
| US8080286B2 (en) | 2011-12-20 |
| EP1915435B1 (de) | 2009-11-18 |
| JP5219813B2 (ja) | 2013-06-26 |
| KR20080067613A (ko) | 2008-07-21 |
| EP1915435A1 (de) | 2008-04-30 |
| FR2889850A1 (fr) | 2007-02-23 |
| DE602006010568D1 (de) | 2009-12-31 |
| JP2009505811A (ja) | 2009-02-12 |
| CN101283066A (zh) | 2008-10-08 |
| KR101270189B1 (ko) | 2013-06-04 |
| WO2007020273A1 (fr) | 2007-02-22 |
| US20090309195A1 (en) | 2009-12-17 |
| CN101283066B (zh) | 2012-07-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Huang et al. | Organic field‐effect transistors and unipolar logic gates on charged electrets from spin‐on organosilsesquioxane resins | |
| JP2013504186A (ja) | 有機電子装置用の溶液加工性パッシベーション層 | |
| WO2008078516A1 (ja) | 酸化シリコン薄膜の製造装置及び形成方法 | |
| TW200634328A (en) | Inorganic coatings for optical and other applications | |
| WO2003063205A3 (en) | Poly(organosiloxane) materials and methods for hybrid organic-inorganic dielectrics for integrated circuit applications | |
| TW200506015A (en) | Coating composition for insulating film production, preparation method of insulation film by using the same, insulation film for semi-conductor device prepared therefrom, and semi-conductor device comprising the same | |
| HK1112564A2 (zh) | 加热装置及制造方法 | |
| ATE305057T1 (de) | Durch polymerabbau erhältliches nano-poröses material mit niedriger dielektrizitätskonstante | |
| ATE507257T1 (de) | Polyorgansiloxan, harzzusammensetzung und strukturierungsverfahren | |
| JP5226715B2 (ja) | 有機薄膜トランジスタ、その作製方法、および、それに使用されるゲート絶縁層 | |
| TW200613480A (en) | Termination coating | |
| Ko et al. | Electrically and thermally stable gate dielectrics from thiol–ene cross-linked systems for use in organic thin-film transistors | |
| US9459526B2 (en) | Process for manufacturing a self-assembled injection monolayer | |
| TW200802727A (en) | Electrical components for microelectronic devices and methods of forming the same | |
| ATE449144T1 (de) | Siliziumbeschichtung mit niedriger dielektrizitätskonstante, herstellungsverfahren dafür und deren anwendung für integrierte schaltungen | |
| WO2007025521A3 (de) | Verfahren zur herstellung eines halbleiterbauelements mit einer planaren kontaktierung und halbleiterbauelement | |
| DE602004001781D1 (de) | Elektrische leitung beschichtet mit einer haftenden schicht und herstellungsprozess davon | |
| TW200513494A (en) | Composition for resin of composite dielectric material, the material itself and electric circuit board using the same | |
| TW200604253A (en) | Method for forming organic silica-based film, organic silica-based film, wiring structure, semiconductor device and composition for forming film | |
| TW200500427A (en) | Composition for forming porous film, porous film and method for forming the same, interlevel insulator film and semiconductor device | |
| KR102259939B1 (ko) | 절연체 표면 개질용 조성물, 절연체의 표면 개질 방법, 절연체, 및 박막 트랜지스터 | |
| WO2006089420A3 (en) | Title: method and apparatus for automated coating of electrical insulators with a silicone composition | |
| TW200504164A (en) | Composition for forming porous film and method for forming the same, porous film and method for forming the same, interlevel insulator film, and semiconductor device | |
| WO2017060656A3 (fr) | Procede de greffage de film mince polymerique sur substrat et procede de metallisation de ce film mince | |
| WO2005023876A3 (de) | Integrierte schaltung und verfahren zur herstellung einer integrierten schaltung |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |