ATE450924T1 - Integriertes schaltungsbauelement zur berwachung der stromversorgung - Google Patents

Integriertes schaltungsbauelement zur berwachung der stromversorgung

Info

Publication number
ATE450924T1
ATE450924T1 AT04754223T AT04754223T ATE450924T1 AT E450924 T1 ATE450924 T1 AT E450924T1 AT 04754223 T AT04754223 T AT 04754223T AT 04754223 T AT04754223 T AT 04754223T AT E450924 T1 ATE450924 T1 AT E450924T1
Authority
AT
Austria
Prior art keywords
integrated circuit
external
voltage
low
digital integrated
Prior art date
Application number
AT04754223T
Other languages
English (en)
Inventor
Ruan Lourens
Miguel Moreno
Original Assignee
Microchip Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=33493528&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE450924(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Microchip Tech Inc filed Critical Microchip Tech Inc
Application granted granted Critical
Publication of ATE450924T1 publication Critical patent/ATE450924T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/28—Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K3/00—Thermometers giving results other than momentary value of temperature
    • G01K3/005—Circuits arrangements for indicating a predetermined temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16542—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies for batteries
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/01—Shaping pulses
    • H03K5/04—Shaping pulses by increasing duration; by decreasing duration
    • H03K5/06—Shaping pulses by increasing duration; by decreasing duration by the use of delay lines or other analogue delay elements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/01—Shaping pulses
    • H03K5/08—Shaping pulses by limiting; by thresholding; by slicing, i.e. combined limiting and thresholding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K2215/00—Details concerning sensor power supply
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/3644—Constructional arrangements
    • G01R31/3648—Constructional arrangements comprising digital calculation means, e.g. for performing an algorithm

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Electronic Switches (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Circuits Of Receivers In General (AREA)
  • Secondary Cells (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Measurement Of Predetermined Time Intervals (AREA)
AT04754223T 2003-06-06 2004-06-03 Integriertes schaltungsbauelement zur berwachung der stromversorgung ATE450924T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US47632303P 2003-06-06 2003-06-06
US10/764,919 US6922084B2 (en) 2003-06-06 2004-01-26 Ultra-low power programmable timer and low voltage detection circuits
PCT/US2004/017570 WO2004111662A2 (en) 2003-06-06 2004-06-03 Integrated circuit device for monitoring power supply

Publications (1)

Publication Number Publication Date
ATE450924T1 true ATE450924T1 (de) 2009-12-15

Family

ID=33493528

Family Applications (2)

Application Number Title Priority Date Filing Date
AT07010698T ATE489607T1 (de) 2003-06-06 2004-06-03 Programmierbarer timer mit extrem niedriger leistung und schaltungen zur erkennung niedriger spannungen
AT04754223T ATE450924T1 (de) 2003-06-06 2004-06-03 Integriertes schaltungsbauelement zur berwachung der stromversorgung

Family Applications Before (1)

Application Number Title Priority Date Filing Date
AT07010698T ATE489607T1 (de) 2003-06-06 2004-06-03 Programmierbarer timer mit extrem niedriger leistung und schaltungen zur erkennung niedriger spannungen

Country Status (7)

Country Link
US (1) US6922084B2 (de)
EP (2) EP1843139B1 (de)
KR (2) KR20070100426A (de)
CN (1) CN100356684C (de)
AT (2) ATE489607T1 (de)
DE (2) DE602004024392D1 (de)
WO (1) WO2004111662A2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2612373A1 (en) * 2005-07-13 2007-01-18 Sca Hygiene Products Ab Automated dispenser
CN101150689B (zh) * 2007-10-25 2011-05-25 康佳集团股份有限公司 液晶电视vga唤醒功能的实现方法及其电路
CN101655516B (zh) * 2008-08-20 2012-08-22 力博特公司 一种主路输入电流检测装置
CN101893866B (zh) * 2009-05-20 2014-12-24 Vega格里沙贝两合公司 用于现场设备的控制设备、现场设备及控制现场设备的方法
JP5736744B2 (ja) * 2010-01-26 2015-06-17 セイコーエプソン株式会社 熱センサーデバイス及び電子機器
CN102870320B (zh) * 2010-03-17 2016-11-02 电力系统技术有限公司 功率转换器的控制系统及其操作方法
CN104244381B (zh) * 2013-06-17 2018-06-05 华为终端（东莞）有限公司 唤醒控制方法、装置和终端设备
US9696353B2 (en) * 2013-07-29 2017-07-04 Atmel Corporation Measuring power consumption of circuit component operating in run mode
US9470725B2 (en) * 2013-07-29 2016-10-18 Atmel Corporation Measuring power consumption of circuit component operating in ultra-low power mode
DE102016206958A1 (de) * 2016-04-25 2017-10-26 Continental Automotive Gmbh Verfahren zum Bestimmen eines Laststroms und Batteriesensor
CN109976436B (zh) * 2017-12-27 2021-03-23 瑞昱半导体股份有限公司 电压检测器与通信电路
CN110086230B (zh) * 2019-05-29 2021-01-08 维沃移动通信有限公司 充电装置及充电方法
US10705152B1 (en) * 2019-06-05 2020-07-07 Xilectric, Inc. Systems and apparatus of cyclic coulometry
CN111766913B (zh) * 2020-05-27 2023-12-22 北京新忆科技有限公司 集成电路的控制系统和集成电路
KR102581053B1 (ko) 2021-04-28 2023-09-20 현대로템 주식회사 Mr댐퍼 온도 측정방법
CN114325407B (zh) * 2021-12-31 2023-08-22 珠海冠宇电池股份有限公司 电池自放电测试方法、装置、设备及计算机存储介质

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2226666B1 (de) * 1973-04-17 1976-05-28 Aerospatiale
GB2224846A (en) 1988-11-14 1990-05-16 Philips Electronic Associated Temperature sensing circuit
US5093584A (en) 1989-08-30 1992-03-03 International Business Machines Corporation Self calibrating timing circuit
US6014030A (en) * 1996-05-03 2000-01-11 National Semiconductor Corp. Current-level monitor with hierarchical precision
US5862170A (en) 1996-11-06 1999-01-19 Lockheed Martin Energy Research Corporation Temperature measurement method using temperature coefficient timing for resistive or capacitive sensors
JP3916279B2 (ja) 1997-01-10 2007-05-16 ローム株式会社 電源監視ｉｃ
SG86389A1 (en) 1999-04-21 2002-02-19 Em Microelectronic Marin Sa Temperature level detection circuit
HU227141B1 (en) * 1999-07-15 2010-08-30 Andras Fazakas Method and apparatus for sensing small and slow changing of voltage signals with proper sign
GB0011541D0 (en) 2000-05-12 2000-06-28 Sgs Thomson Microelectronics Generation of a voltage proportional to temperature with a negative variation
US6346848B1 (en) 2000-06-29 2002-02-12 International Business Machines Corporation Apparatus and method for generating current linearly dependent on temperature
WO2002008708A1 (en) 2000-07-26 2002-01-31 Stmicroelectronics Asia Pacifc Pte Ltd A thermal sensor circuit
US6483372B1 (en) 2000-09-13 2002-11-19 Analog Devices, Inc. Low temperature coefficient voltage output circuit and method

Also Published As

Publication number Publication date
EP1632020A2 (de) 2006-03-08
WO2004111662A3 (en) 2005-04-14
EP1843139A2 (de) 2007-10-10
CN100356684C (zh) 2007-12-19
US6922084B2 (en) 2005-07-26
EP1632020B1 (de) 2009-12-02
KR20070100426A (ko) 2007-10-10
DE602004030287D1 (de) 2011-01-05
EP1843139B1 (de) 2010-11-24
WO2004111662A8 (en) 2008-07-24
ATE489607T1 (de) 2010-12-15
KR20060032585A (ko) 2006-04-17
DE602004024392D1 (de) 2010-01-14
CN1723604A (zh) 2006-01-18
WO2004111662A2 (en) 2004-12-23
KR100819868B1 (ko) 2008-04-07
EP1843139A3 (de) 2007-11-07
US20040246031A1 (en) 2004-12-09

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