ATE455288T1 - Verfahren und einrichtung zur messung der dicke einer materialschicht - Google Patents

Verfahren und einrichtung zur messung der dicke einer materialschicht

Info

Publication number
ATE455288T1
ATE455288T1 AT06809225T AT06809225T ATE455288T1 AT E455288 T1 ATE455288 T1 AT E455288T1 AT 06809225 T AT06809225 T AT 06809225T AT 06809225 T AT06809225 T AT 06809225T AT E455288 T1 ATE455288 T1 AT E455288T1
Authority
AT
Austria
Prior art keywords
measuring
thickness
layer
microwave sensor
reference data
Prior art date
Application number
AT06809225T
Other languages
English (en)
Inventor
Giovanni Cristini
Original Assignee
Giuseppe Cristini S P A Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Giuseppe Cristini S P A Sa filed Critical Giuseppe Cristini S P A Sa
Application granted granted Critical
Publication of ATE455288T1 publication Critical patent/ATE455288T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AT06809225T 2006-01-19 2006-11-06 Verfahren und einrichtung zur messung der dicke einer materialschicht ATE455288T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT000084A ITMI20060084A1 (it) 2006-01-19 2006-01-19 Metodo e dispositivo per misurare lo spessore di uno strato di materiale
PCT/IB2006/003207 WO2007083178A1 (en) 2006-01-19 2006-11-06 Method and device for measuring the thickness of a layer of material

Publications (1)

Publication Number Publication Date
ATE455288T1 true ATE455288T1 (de) 2010-01-15

Family

ID=38068598

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06809225T ATE455288T1 (de) 2006-01-19 2006-11-06 Verfahren und einrichtung zur messung der dicke einer materialschicht

Country Status (9)

Country Link
US (1) US8138769B2 (de)
EP (1) EP1974181B1 (de)
CN (1) CN101421583B (de)
AT (1) ATE455288T1 (de)
CA (1) CA2637788C (de)
DE (1) DE602006011788D1 (de)
ES (1) ES2339596T3 (de)
IT (1) ITMI20060084A1 (de)
WO (1) WO2007083178A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8269509B2 (en) * 2008-11-17 2012-09-18 General Electric Company System and method for measuring thickness of a refractory wall of a gasifier using electromagnetic energy
CN102478395B (zh) * 2010-11-26 2013-05-29 宝山钢铁股份有限公司 在线检测带钢表面无铬涂层厚度的方法
CN102095395B (zh) * 2010-11-29 2012-10-03 沈阳工业大学 大块金属玻璃形成厚度预测方法
CN102221337B (zh) * 2011-03-23 2012-07-04 大连海事大学 船载微波散射计反演油膜厚度装置
GB201113715D0 (en) * 2011-08-09 2011-09-21 Renishaw Plc Method and apparatus for inspecting workpieces
CN102564361B (zh) * 2011-11-18 2013-10-23 北京金自天正智能控制股份有限公司 一种射线式测厚仪及其校正方法
GB201308467D0 (en) 2013-05-10 2013-06-19 Renishaw Plc Method and Apparatus for Inspecting Workpieces
CN103743362B (zh) * 2013-12-25 2016-03-30 武汉钢铁(集团)公司 电工钢表面绝缘涂层涂布量的测量方法
US9880110B2 (en) 2014-03-26 2018-01-30 Paneratech, Inc. Material erosion monitoring system and method
US9488601B2 (en) * 2014-03-26 2016-11-08 Paneratech, Inc. Material erosion monitoring system and method
JP6644137B2 (ja) 2015-10-29 2020-02-12 パネラテック・インコーポレイテッドＰａｎｅｒａＴｅｃｈ， Ｉｎｃ． 資産耐用年数の最適化および監視システム
CN107504909A (zh) * 2017-08-17 2017-12-22 中国计量大学 基于贝叶斯正则化算法的白光反射率测量薄膜厚度自适应方法
CN112578358B (zh) * 2020-12-29 2024-07-09 深圳承泰科技有限公司 一种毫米波雷达的校准方法及装置
CN114264259B (zh) * 2021-04-02 2023-03-10 湖南国戎科技有限公司 等效观冰方法及系统
CN119197427B (zh) * 2024-11-28 2025-05-16 宁德时代新能源科技股份有限公司 测量装置、测量方法及电池生产设备

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1118096A (en) 1966-07-04 1968-06-26 British Iron Steel Research Method and apparatus for measuring material thickness
US4255709A (en) * 1978-09-22 1981-03-10 Zatsepin Nikolai N Device for providing an electrical signal proportional to the thickness of a measured coating with an automatic range switch and sensitivity control
ATE288581T1 (de) 1998-08-31 2005-02-15 Malcam Ltd Mikrowellenresonator zur kontinuierlichen auswertung von faserigen stoffen
DE10214955B9 (de) 2002-04-04 2017-06-29 Rieter Ingolstadt Gmbh Spinnereivorbereitungsmaschine
ITFI20060019A1 (it) * 2006-01-19 2007-07-20 Advanced Microwave Engineering Dispositivo per la valutazione per contatto di caratteristiche chimico-fisiche dei materiali e metodo ad esso associato
US7794142B2 (en) * 2006-05-09 2010-09-14 Tsi Technologies Llc Magnetic element temperature sensors

Also Published As

Publication number Publication date
DE602006011788D1 (de) 2010-03-04
CN101421583B (zh) 2011-01-19
US20090302865A1 (en) 2009-12-10
EP1974181B1 (de) 2010-01-13
ITMI20060084A1 (it) 2007-07-20
US8138769B2 (en) 2012-03-20
WO2007083178A1 (en) 2007-07-26
CN101421583A (zh) 2009-04-29
ES2339596T3 (es) 2010-05-21
EP1974181A1 (de) 2008-10-01
CA2637788C (en) 2015-07-07
CA2637788A1 (en) 2007-07-26

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