ATE465419T1 - Prüfbare integrierte schaltung und ic- prüfverfahren - Google Patents

Prüfbare integrierte schaltung und ic- prüfverfahren

Info

Publication number
ATE465419T1
ATE465419T1 AT07826254T AT07826254T ATE465419T1 AT E465419 T1 ATE465419 T1 AT E465419T1 AT 07826254 T AT07826254 T AT 07826254T AT 07826254 T AT07826254 T AT 07826254T AT E465419 T1 ATE465419 T1 AT E465419T1
Authority
AT
Austria
Prior art keywords
circuit portion
integrated circuit
power supply
coupling
conductive tracks
Prior art date
Application number
AT07826254T
Other languages
English (en)
Inventor
Vazquez Josep Rius
Luis Elvira Villagra
Rinze I Meijer
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE465419T1 publication Critical patent/ATE465419T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
AT07826254T 2006-09-06 2007-09-04 Prüfbare integrierte schaltung und ic- prüfverfahren ATE465419T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP06120187 2006-09-06
PCT/IB2007/053558 WO2008029348A2 (en) 2006-09-06 2007-09-04 Testable integrated circuit and ic test method

Publications (1)

Publication Number Publication Date
ATE465419T1 true ATE465419T1 (de) 2010-05-15

Family

ID=39095968

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07826254T ATE465419T1 (de) 2006-09-06 2007-09-04 Prüfbare integrierte schaltung und ic- prüfverfahren

Country Status (6)

Country Link
US (1) US8138783B2 (de)
EP (1) EP2064562B1 (de)
CN (1) CN101512361B (de)
AT (1) ATE465419T1 (de)
DE (1) DE602007006031D1 (de)
WO (1) WO2008029348A2 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7898278B2 (en) * 2007-11-05 2011-03-01 Arm Limited Power control circuitry, circuitry for analysing a switched power rail, and method of controlling connection of a power source to a switched power rail
US8476917B2 (en) * 2010-01-29 2013-07-02 Freescale Semiconductor, Inc. Quiescent current (IDDQ) indication and testing apparatus and methods
TWI408390B (zh) * 2010-06-25 2013-09-11 Princeton Technology Corp 用於類比量測模組之控制電路與相關控制模組
CN102375113B (zh) * 2010-08-11 2014-08-27 普诚科技股份有限公司 用于模拟测试模块的控制电路及控制系统
CN102288898A (zh) * 2011-05-17 2011-12-21 上海华岭集成电路技术股份有限公司 源复用测试方法
TW201248383A (en) * 2011-05-25 2012-12-01 Hon Hai Prec Ind Co Ltd Power supplying circuit
US9103877B2 (en) 2012-04-03 2015-08-11 Sandisk Technologies Inc. Apparatus and method for IDDQ tests
CN103115752B (zh) * 2013-01-29 2015-11-18 杭州远方光电信息股份有限公司 一种光源在线检测装置
KR101536111B1 (ko) * 2013-12-20 2015-07-13 동부대우전자 주식회사 오전압 검출장치 및 방법
CN104931759B (zh) * 2014-03-21 2018-07-06 中芯国际集成电路制造(上海)有限公司 一种标准单元漏电流的测试电路及测试方法
US9704862B2 (en) 2014-09-18 2017-07-11 Samsung Electronics Co., Ltd. Semiconductor devices and methods for manufacturing the same
US9767248B2 (en) 2014-09-18 2017-09-19 Samsung Electronics, Co., Ltd. Semiconductor having cross coupled structure and layout verification method thereof
US9811626B2 (en) 2014-09-18 2017-11-07 Samsung Electronics Co., Ltd. Method of designing layout of semiconductor device
US10026661B2 (en) 2014-09-18 2018-07-17 Samsung Electronics Co., Ltd. Semiconductor device for testing large number of devices and composing method and test method thereof
US10095825B2 (en) 2014-09-18 2018-10-09 Samsung Electronics Co., Ltd. Computer based system for verifying layout of semiconductor device and layout verify method thereof
US10304500B2 (en) * 2017-06-29 2019-05-28 Taiwan Semiconductor Manufacturing Co., Ltd. Power switch control for dual power supply
CN113051853B (zh) * 2021-03-05 2022-05-31 奥特斯科技(重庆)有限公司 受损部件载体确定方法、计算机程序、计算机可读介质以及检测系统
US20240230720A1 (en) * 2023-01-05 2024-07-11 Mediatek Inc. Detection device and detection method
US20250155500A1 (en) * 2023-11-15 2025-05-15 Advanced Micro Devices, Inc. Supply Chain Security for Chiplets

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5428297A (en) * 1993-06-15 1995-06-27 Grace; James W. Precision integrated resistors
EP0672911A1 (de) * 1994-02-25 1995-09-20 ALCATEL BELL Naamloze Vennootschap Prüfeinrichtung für Ruheversorgungsstrom
US5789933A (en) 1996-10-30 1998-08-04 Hewlett-Packard Co. Method and apparatus for determining IDDQ
JPH10206499A (ja) 1997-01-17 1998-08-07 Sony Corp 半導体素子
US6043672A (en) 1998-05-13 2000-03-28 Lsi Logic Corporation Selectable power supply lines for isolating defects in integrated circuits
JP3187019B2 (ja) * 1998-12-10 2001-07-11 沖電気工業株式会社 半導体集積回路及びその試験方法
US6628126B2 (en) * 2001-06-14 2003-09-30 International Business Machines Corporation Optical voltage measurement circuit and method for monitoring voltage supplies utilizing imaging circuit analysis
US6677774B2 (en) * 2001-06-26 2004-01-13 International Business Machines Corporation Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester
US20040085059A1 (en) * 2002-10-31 2004-05-06 Smith Edward E. Method and apparatus to provide accurate high speed wide range current measurement in automated testing equipment
CN100547425C (zh) * 2003-02-10 2009-10-07 Nxp股份有限公司 集成电路的测试
JP4262996B2 (ja) 2003-02-14 2009-05-13 パナソニック株式会社 半導体装置
US7376001B2 (en) * 2005-10-13 2008-05-20 International Business Machines Corporation Row circuit ring oscillator method for evaluating memory cell performance

Also Published As

Publication number Publication date
WO2008029348A3 (en) 2008-05-29
CN101512361B (zh) 2011-10-05
CN101512361A (zh) 2009-08-19
US8138783B2 (en) 2012-03-20
EP2064562B1 (de) 2010-04-21
WO2008029348A2 (en) 2008-03-13
DE602007006031D1 (de) 2010-06-02
EP2064562A2 (de) 2009-06-03
US20090315583A1 (en) 2009-12-24

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Legal Events

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