ATE467132T1 - Verfahren zur bestimmung der derzeitigen rückwegintegrität in einer elektrischen einrichtung, die mit einer weiteren einrichtung verbunden oder verbindbar ist - Google Patents

Verfahren zur bestimmung der derzeitigen rückwegintegrität in einer elektrischen einrichtung, die mit einer weiteren einrichtung verbunden oder verbindbar ist

Info

Publication number
ATE467132T1
ATE467132T1 AT07847223T AT07847223T ATE467132T1 AT E467132 T1 ATE467132 T1 AT E467132T1 AT 07847223 T AT07847223 T AT 07847223T AT 07847223 T AT07847223 T AT 07847223T AT E467132 T1 ATE467132 T1 AT E467132T1
Authority
AT
Austria
Prior art keywords
signal
electric device
near end
end crosstalk
connectable
Prior art date
Application number
AT07847223T
Other languages
English (en)
Inventor
Roland Frech
Erich Klink
Juergen Saalmueller
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of ATE467132T1 publication Critical patent/ATE467132T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/16—Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/31855—Interconnection testing, e.g. crosstalk, shortcircuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/70—Testing of connections between components and printed circuit boards
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B3/00—Line transmission systems
    • H04B3/02—Details
    • H04B3/46—Monitoring; Testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B3/00—Line transmission systems
    • H04B3/02—Details
    • H04B3/46—Monitoring; Testing
    • H04B3/487—Testing crosstalk effects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Control Of Direct Current Motors (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
AT07847223T 2007-01-17 2007-11-20 Verfahren zur bestimmung der derzeitigen rückwegintegrität in einer elektrischen einrichtung, die mit einer weiteren einrichtung verbunden oder verbindbar ist ATE467132T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07100678 2007-01-17
PCT/EP2007/062542 WO2008086908A1 (en) 2007-01-17 2007-11-20 A method for determining the current return path integrity in an electric device connected or connectable to a further device

Publications (1)

Publication Number Publication Date
ATE467132T1 true ATE467132T1 (de) 2010-05-15

Family

ID=39247276

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07847223T ATE467132T1 (de) 2007-01-17 2007-11-20 Verfahren zur bestimmung der derzeitigen rückwegintegrität in einer elektrischen einrichtung, die mit einer weiteren einrichtung verbunden oder verbindbar ist

Country Status (7)

Country Link
US (5) US8248082B2 (de)
EP (1) EP2104863B1 (de)
JP (1) JP4639263B2 (de)
KR (1) KR20090097855A (de)
AT (1) ATE467132T1 (de)
DE (1) DE602007006347D1 (de)
WO (1) WO2008086908A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2104863B1 (de) 2007-01-17 2010-05-05 International Business Machines Corporation Verfahren zur bestimmung der derzeitigen rückwegintegrität in einer elektrischen einrichtung, die mit einer weiteren einrichtung verbunden oder verbindbar ist
TR201810919T4 (tr) * 2008-03-07 2018-08-27 Rte Reseau De Transp Delectricite Bir elektrik bağlantısı üzerinde bir arızanın yerinin saptanması için yöntem, cihaz ve donanım.
US10705134B2 (en) * 2017-12-04 2020-07-07 International Business Machines Corporation High speed chip substrate test fixture
JP6410915B1 (ja) * 2017-12-19 2018-10-24 馬鞍山市明珠電子科技有限公司 電気機器及び電気機器の接地状態検知方法
CN111277291A (zh) * 2018-11-16 2020-06-12 英业达科技有限公司 电路装置

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2065312B (en) 1979-11-16 1983-06-08 Post Office Location of croos-talk faults by correlation
US4620282A (en) * 1984-02-03 1986-10-28 Shelley Marlin C System and method for documenting and checking cable interconnections
JP2763793B2 (ja) * 1989-07-15 1998-06-11 富士通株式会社 プリント配線板検査装置
US5513188A (en) * 1991-09-10 1996-04-30 Hewlett-Packard Company Enhanced interconnect testing through utilization of board topology data
JPH06194401A (ja) * 1992-04-01 1994-07-15 Pentek Inc 電線・ケーブル系統の異常検知装置
JP3399630B2 (ja) * 1993-09-27 2003-04-21 株式会社日立製作所 バスシステム
US5570029A (en) 1994-03-30 1996-10-29 Fluke Corporation Cable crosstalk measurement system
JP3397957B2 (ja) * 1996-01-10 2003-04-21 株式会社オートネットワーク技術研究所 ワイヤーハーネスの故障位置検出方法及び同方法に用いるワイヤーハーネス
US5821760A (en) 1996-07-31 1998-10-13 Fluke Corporation Method and apparatus for measuring near-end cross-talk in patch cords
JPH1090337A (ja) * 1996-09-13 1998-04-10 Tokyo Electric Power Co Inc:The ケーブルの劣化測定方法
US6040770A (en) * 1997-09-05 2000-03-21 Britton; Rick A. Communication path integrity supervision in a network system for automatic alarm data communication
JP4248627B2 (ja) * 1998-07-30 2009-04-02 関西電力株式会社 地絡検査装置
JP3880286B2 (ja) * 1999-05-12 2007-02-14 エルピーダメモリ株式会社 方向性結合式メモリシステム
JP2003050256A (ja) * 2001-08-08 2003-02-21 Hitachi Ltd プリント基板検査装置
US20030182640A1 (en) * 2002-03-20 2003-09-25 Alani Alaa F. Signal integrity analysis system
US6954076B2 (en) * 2002-09-06 2005-10-11 Northrop Grumman Corporation Aircraft multi-function wire and insulation tester
US7071705B2 (en) * 2004-01-08 2006-07-04 Panduit Corp. Apparatus and method for communications testing
US7225420B2 (en) * 2005-02-10 2007-05-29 Honeywell International Inc. System and method for signal integrity testing of electronic circuits
US7472026B2 (en) * 2006-12-22 2008-12-30 General Electric Company Multi-ended fault location system
EP2104863B1 (de) 2007-01-17 2010-05-05 International Business Machines Corporation Verfahren zur bestimmung der derzeitigen rückwegintegrität in einer elektrischen einrichtung, die mit einer weiteren einrichtung verbunden oder verbindbar ist
EP2065312A1 (de) 2007-11-22 2009-06-03 Nodrops Aktiengesellschaft Einrichtung zum tropfenfreien Ausgiessen von Flüssigkeiten

Also Published As

Publication number Publication date
US20100109679A1 (en) 2010-05-06
US9304158B2 (en) 2016-04-05
KR20090097855A (ko) 2009-09-16
US8248082B2 (en) 2012-08-21
US20160216302A1 (en) 2016-07-28
EP2104863A1 (de) 2009-09-30
US9581631B2 (en) 2017-02-28
JP4639263B2 (ja) 2011-02-23
JP2010517002A (ja) 2010-05-20
US9134364B2 (en) 2015-09-15
DE602007006347D1 (de) 2010-06-17
US9891256B2 (en) 2018-02-13
US20170122993A1 (en) 2017-05-04
US20120293185A1 (en) 2012-11-22
WO2008086908A1 (en) 2008-07-24
EP2104863B1 (de) 2010-05-05
US20150309100A1 (en) 2015-10-29

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