ATE469435T1 - Bandlücken plasma-massenfilter - Google Patents

Bandlücken plasma-massenfilter

Info

Publication number
ATE469435T1
ATE469435T1 AT03075734T AT03075734T ATE469435T1 AT E469435 T1 ATE469435 T1 AT E469435T1 AT 03075734 T AT03075734 T AT 03075734T AT 03075734 T AT03075734 T AT 03075734T AT E469435 T1 ATE469435 T1 AT E469435T1
Authority
AT
Austria
Prior art keywords
phi
ions
axis
orbits
chamber
Prior art date
Application number
AT03075734T
Other languages
English (en)
Inventor
Ohkawa Tihiro
Original Assignee
Archimedes Operating Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Archimedes Operating Llc filed Critical Archimedes Operating Llc
Application granted granted Critical
Publication of ATE469435T1 publication Critical patent/ATE469435T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing
    • H01J49/328—Static spectrometers using double focusing with a cycloidal trajectory by using crossed electric and magnetic fields, e.g. trochoidal type

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Physical Vapour Deposition (AREA)
  • Chemical Vapour Deposition (AREA)
  • Plasma Technology (AREA)
  • Nonmetallic Welding Materials (AREA)
  • Thermistors And Varistors (AREA)
AT03075734T 2002-04-02 2003-03-12 Bandlücken plasma-massenfilter ATE469435T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/114,900 US6719909B2 (en) 2002-04-02 2002-04-02 Band gap plasma mass filter

Publications (1)

Publication Number Publication Date
ATE469435T1 true ATE469435T1 (de) 2010-06-15

Family

ID=28041063

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03075734T ATE469435T1 (de) 2002-04-02 2003-03-12 Bandlücken plasma-massenfilter

Country Status (6)

Country Link
US (1) US6719909B2 (de)
EP (1) EP1351273B1 (de)
JP (2) JP2003297281A (de)
AT (1) ATE469435T1 (de)
DE (1) DE60332685D1 (de)
ES (1) ES2348502T3 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6939469B2 (en) * 2002-12-16 2005-09-06 Archimedes Operating, Llc Band gap mass filter with induced azimuthal electric field
US20060273020A1 (en) * 2005-06-03 2006-12-07 BAGLEY David Method for tuning water
US7347944B2 (en) * 2005-06-03 2008-03-25 BAGLEY David Method for making and conditioning super-oxygenated and structured water
US20060272993A1 (en) * 2005-06-03 2006-12-07 BAGLEY David Water preconditioning system
US20060272991A1 (en) * 2005-06-03 2006-12-07 BAGLEY David System for tuning water to target certain pathologies in mammals
US20070095726A1 (en) * 2005-10-28 2007-05-03 Tihiro Ohkawa Chafftron
US7621985B1 (en) * 2008-05-24 2009-11-24 Adventix Technologies Inc. Plasma torch implemented air purifier
CN104520453A (zh) 2011-11-10 2015-04-15 先进磁工艺股份有限公司 用于分离的磁电-等离子体分离器及方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3334225A (en) * 1964-04-24 1967-08-01 California Inst Res Found Quadrupole mass filter with means to generate a noise spectrum exclusive of the resonant frequency of the desired ions to deflect stable ions
SE338962B (de) 1970-06-04 1971-09-27 B Lehnert
JPS6274441A (ja) * 1985-09-27 1987-04-06 Tokai Univ シ−トプラズマを利用した気体の同位体分離法
DE4324233C1 (de) * 1993-07-20 1995-01-19 Bruker Franzen Analytik Gmbh Verfahren zur Auswahl der Reaktionspfade in Ionenfallen
US5525084A (en) 1994-03-25 1996-06-11 Hewlett Packard Company Universal quadrupole and method of manufacture
JP3523358B2 (ja) * 1995-02-28 2004-04-26 日本原子力研究所 同位体の分離方法及び分離装置
US5598001A (en) * 1996-01-30 1997-01-28 Hewlett-Packard Company Mass selective multinotch filter with orthogonal excision fields
WO1998052209A1 (en) * 1997-05-12 1998-11-19 Mds Inc. Rf-only mass spectrometer with auxiliary excitation
US6258216B1 (en) 1997-11-14 2001-07-10 Archimedes Technology Group, Inc. Charged particle separator with drift compensation
US6251281B1 (en) 1998-11-16 2001-06-26 Archimedes Technology Group, Inc. Negative ion filter
US6251282B1 (en) 1998-11-16 2001-06-26 Archimedes Technology Group, Inc. Plasma filter with helical magnetic field
US6248240B1 (en) * 1998-11-16 2001-06-19 Archimedes Technology Group, Inc. Plasma mass filter
US6096220A (en) 1998-11-16 2000-08-01 Archimedes Technology Group, Inc. Plasma mass filter
US6204510B1 (en) 1998-12-18 2001-03-20 Archimedes Technology Group, Inc. Device and method for ion acceleration
US6515281B1 (en) * 2000-06-23 2003-02-04 Archimedes Technology Group, Inc. Stochastic cyclotron ion filter (SCIF)

Also Published As

Publication number Publication date
DE60332685D1 (de) 2010-07-08
EP1351273B1 (de) 2010-05-26
JP2003297281A (ja) 2003-10-17
US20030183567A1 (en) 2003-10-02
EP1351273A1 (de) 2003-10-08
US6719909B2 (en) 2004-04-13
ES2348502T3 (es) 2010-12-07
JP2007258191A (ja) 2007-10-04

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Legal Events

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