ATE474330T1 - Bildaufnahmevorrichtung für photonenzählung - Google Patents
Bildaufnahmevorrichtung für photonenzählungInfo
- Publication number
- ATE474330T1 ATE474330T1 AT08172698T AT08172698T ATE474330T1 AT E474330 T1 ATE474330 T1 AT E474330T1 AT 08172698 T AT08172698 T AT 08172698T AT 08172698 T AT08172698 T AT 08172698T AT E474330 T1 ATE474330 T1 AT E474330T1
- Authority
- AT
- Austria
- Prior art keywords
- photodetector
- bias potential
- diode
- array
- aim
- Prior art date
Links
- 238000005513 bias potential Methods 0.000 abstract 4
- 238000003384 imaging method Methods 0.000 abstract 2
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
- H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
- H10F39/1895—X-ray, gamma-ray or corpuscular radiation imagers of the hybrid type
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
- H04N25/773—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Measurement Of Radiation (AREA)
- Holo Graphy (AREA)
- Optical Integrated Circuits (AREA)
- Devices For Conveying Motion By Means Of Endless Flexible Members (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP03000358 | 2003-01-10 | ||
| EP03000359 | 2003-01-10 | ||
| EP03001143 | 2003-01-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE474330T1 true ATE474330T1 (de) | 2010-07-15 |
Family
ID=32718497
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT08172698T ATE474330T1 (de) | 2003-01-10 | 2003-08-11 | Bildaufnahmevorrichtung für photonenzählung |
| AT03815050T ATE432535T1 (de) | 2003-01-10 | 2003-08-11 | Photonenzähl-abbildungseinrichtung |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT03815050T ATE432535T1 (de) | 2003-01-10 | 2003-08-11 | Photonenzähl-abbildungseinrichtung |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7514688B2 (de) |
| EP (2) | EP2037505B1 (de) |
| AT (2) | ATE474330T1 (de) |
| AU (1) | AU2003260400A1 (de) |
| DE (2) | DE60333410D1 (de) |
| ES (1) | ES2327835T3 (de) |
| WO (1) | WO2004064168A1 (de) |
Families Citing this family (68)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7403594B2 (en) * | 2004-03-31 | 2008-07-22 | Canon Kabushiki Kaisha | Radiation imaging apparatus and control method therefor |
| ES2253997B1 (es) | 2004-07-29 | 2007-07-16 | Udiat Centre Diagnostic, S.A. | Sistema digital para realizar biopsia estereotaxica. |
| EP1760787A1 (de) * | 2005-09-02 | 2007-03-07 | Paul Scherrer Institut | Bildaufnahmegerät zur Einzelphotonenzählung von Röntgenstrahlung |
| EP1788629A1 (de) * | 2005-11-21 | 2007-05-23 | Paul Scherrer Institut | Auslesechip für Einzelphotonenzählung |
| US8354650B2 (en) * | 2006-03-22 | 2013-01-15 | Endicott Interconnect Technologies, Inc. | Multi-window signal processing electronics architecture for photon counting with multi-element sensors |
| DE102008050838A1 (de) * | 2008-10-08 | 2009-10-15 | Siemens Aktiengesellschaft | Elektrische Baugruppe, Röntgenmesssystem, Computertomograph sowie Verfahren zur Fertigung einer elektrischen Baugruppe |
| DE102008050840A1 (de) * | 2008-10-08 | 2009-10-15 | Siemens Aktiengesellschaft | Verfahren zur Fertigung eines elektrischen Moduls, elektrisches Modul, Röntgenmesssystem sowie Computertomograh |
| CN101719971B (zh) * | 2009-11-18 | 2011-06-08 | 南京大学 | 光敏复合介质栅mosfet探测器的信号读出放大方法 |
| EP2290403A1 (de) | 2009-08-28 | 2011-03-02 | Paul Scherrer Institut | Röntgen-Detektor mit integrierendem Auslesechip für Einzelphotonauflösung |
| EP2348704A1 (de) | 2010-01-26 | 2011-07-27 | Paul Scherrer Institut | Auslesechip zur Einzelphotonenzählung mit geringfügiger Stillstandzeit |
| EP2437297A1 (de) | 2010-10-01 | 2012-04-04 | Paul Scherrer Institut | Verfahren zur Korrektur von hohen Ratenineffizienzen eines Einzelphotonenzählungserkennungssystems und Einzelphotonenzählungserkennungssystem |
| US9134431B2 (en) | 2010-12-09 | 2015-09-15 | Rigaku Corporation | Radiation detector |
| EP2650700A4 (de) | 2010-12-09 | 2014-06-25 | Rigaku Denki Co Ltd | Strahlungsdetektor |
| JP5568004B2 (ja) | 2010-12-27 | 2014-08-06 | 株式会社リガク | X線検出器 |
| EP2490441A1 (de) * | 2011-02-16 | 2012-08-22 | Paul Scherrer Institut | Einzelphoton-Zählerkennungssystem mit verbesserter Zählerarchitektur |
| US9310495B2 (en) * | 2011-05-04 | 2016-04-12 | Oy Ajat Ltd. | Photon/energy identifying X-ray and gamma ray imaging device (“PID”) with a two dimensional array of pixels and system therefrom |
| CN102323959B (zh) * | 2011-06-09 | 2013-04-17 | 中国科学院西安光学精密机械研究所 | 用于时间分辨光子计数成像的采集卡 |
| EP2734861B1 (de) | 2011-07-20 | 2017-12-20 | DECTRIS Ltd. | Photonenzählendes bildgebungsverfahren und vorrichtung mit sofortiger retrigger-funktion |
| KR101871361B1 (ko) | 2011-11-01 | 2018-08-03 | 삼성전자주식회사 | 고해상도 및 고대조도 영상을 동시에 생성하기 위한 광자 계수 검출 장치 및 방법 |
| US8488854B2 (en) * | 2011-12-07 | 2013-07-16 | Ge Medical Systems Israel, Ltd. | System and apparatus for classifying x-ray energy into discrete levels |
| US20130301799A1 (en) * | 2012-05-14 | 2013-11-14 | Samsung Electronics Co., Ltd. | X-ray imaging apparatus and control method therefor |
| ITPI20120060A1 (it) * | 2012-05-15 | 2013-11-16 | Ronaldo Bellazzini | Sensore radiologico digitale |
| FR2995439A1 (fr) | 2012-09-10 | 2014-03-14 | Commissariat Energie Atomique | Source de rayons x generant un faisceau de taille nanometrique et dispositif d'imagerie comportant au moins une telle source |
| WO2014181223A1 (en) * | 2013-05-10 | 2014-11-13 | Koninklijke Philips N.V. | Direct conversion radiation detector digital signal processing electronics |
| CN103685991B (zh) * | 2013-12-31 | 2017-10-24 | 北京唯迈医疗设备有限公司 | 一种串行读出光子计数芯片 |
| US10098595B2 (en) * | 2015-08-06 | 2018-10-16 | Texas Instruments Incorporated | Low power photon counting system |
| JP6644872B2 (ja) | 2015-08-27 | 2020-02-12 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 光子計数装置及び方法 |
| WO2017046929A1 (ja) * | 2015-09-17 | 2017-03-23 | 株式会社島津製作所 | 放射線装置 |
| US10117626B2 (en) * | 2015-09-29 | 2018-11-06 | General Electric Company | Apparatus and method for pile-up correction in photon-counting detector |
| EP3151545A1 (de) * | 2015-10-01 | 2017-04-05 | Paul Scherrer Institut | Verfahren zur erweiterung des dynamischen bereichs eines bildelementdetektorsystems durch automatische umschaltung der verstärkung |
| US10686996B2 (en) | 2017-06-26 | 2020-06-16 | Facebook Technologies, Llc | Digital pixel with extended dynamic range |
| US10151845B1 (en) | 2017-08-02 | 2018-12-11 | Texas Instruments Incorporated | Configurable analog-to-digital converter and processing for photon counting |
| US10598546B2 (en) | 2017-08-17 | 2020-03-24 | Facebook Technologies, Llc | Detecting high intensity light in photo sensor |
| US10024979B1 (en) | 2017-11-01 | 2018-07-17 | Texas Instruments Incorporated | Photon counting with coincidence detection |
| CN114866718A (zh) * | 2017-11-24 | 2022-08-05 | 浜松光子学株式会社 | 光子计数装置和光子计数方法 |
| US12034015B2 (en) | 2018-05-25 | 2024-07-09 | Meta Platforms Technologies, Llc | Programmable pixel array |
| US11906353B2 (en) | 2018-06-11 | 2024-02-20 | Meta Platforms Technologies, Llc | Digital pixel with extended dynamic range |
| US11463636B2 (en) | 2018-06-27 | 2022-10-04 | Facebook Technologies, Llc | Pixel sensor having multiple photodiodes |
| US10897586B2 (en) | 2018-06-28 | 2021-01-19 | Facebook Technologies, Llc | Global shutter image sensor |
| US10931884B2 (en) | 2018-08-20 | 2021-02-23 | Facebook Technologies, Llc | Pixel sensor having adaptive exposure time |
| US11956413B2 (en) | 2018-08-27 | 2024-04-09 | Meta Platforms Technologies, Llc | Pixel sensor having multiple photodiodes and shared comparator |
| US11595602B2 (en) | 2018-11-05 | 2023-02-28 | Meta Platforms Technologies, Llc | Image sensor post processing |
| US11888002B2 (en) | 2018-12-17 | 2024-01-30 | Meta Platforms Technologies, Llc | Dynamically programmable image sensor |
| US11962928B2 (en) * | 2018-12-17 | 2024-04-16 | Meta Platforms Technologies, Llc | Programmable pixel array |
| US10890674B2 (en) | 2019-01-15 | 2021-01-12 | Texas Instruments Incorporated | Dynamic noise shaping in a photon counting system |
| US11218660B1 (en) | 2019-03-26 | 2022-01-04 | Facebook Technologies, Llc | Pixel sensor having shared readout structure |
| US11943561B2 (en) | 2019-06-13 | 2024-03-26 | Meta Platforms Technologies, Llc | Non-linear quantization at pixel sensor |
| US12108141B2 (en) | 2019-08-05 | 2024-10-01 | Meta Platforms Technologies, Llc | Dynamically programmable image sensor |
| CN110687565B (zh) * | 2019-09-20 | 2023-01-20 | 天津大学 | 一种用于x射线探测器的光生电荷的快速计算方法 |
| EP3805806A1 (de) | 2019-10-07 | 2021-04-14 | Paul Scherrer Institut | Doppelmodusdetektor |
| US11936998B1 (en) | 2019-10-17 | 2024-03-19 | Meta Platforms Technologies, Llc | Digital pixel sensor having extended dynamic range |
| US11935291B2 (en) | 2019-10-30 | 2024-03-19 | Meta Platforms Technologies, Llc | Distributed sensor system |
| US11948089B2 (en) | 2019-11-07 | 2024-04-02 | Meta Platforms Technologies, Llc | Sparse image sensing and processing |
| US12141888B1 (en) | 2019-12-18 | 2024-11-12 | Meta Platforms Technologies, Llc | Dynamic and hierarchical image sensing and processing |
| US11902685B1 (en) | 2020-04-28 | 2024-02-13 | Meta Platforms Technologies, Llc | Pixel sensor having hierarchical memory |
| US11825228B2 (en) | 2020-05-20 | 2023-11-21 | Meta Platforms Technologies, Llc | Programmable pixel array having multiple power domains |
| US11729345B2 (en) * | 2020-05-29 | 2023-08-15 | Uchicago Argonne, Llc | Digital encoding algorithm for pixelated detectors |
| US11910114B2 (en) | 2020-07-17 | 2024-02-20 | Meta Platforms Technologies, Llc | Multi-mode image sensor |
| US12075175B1 (en) | 2020-09-08 | 2024-08-27 | Meta Platforms Technologies, Llc | Programmable smart sensor with adaptive readout |
| US11956560B2 (en) | 2020-10-09 | 2024-04-09 | Meta Platforms Technologies, Llc | Digital pixel sensor having reduced quantization operation |
| US11935575B1 (en) | 2020-12-23 | 2024-03-19 | Meta Platforms Technologies, Llc | Heterogeneous memory system |
| US12022218B2 (en) | 2020-12-29 | 2024-06-25 | Meta Platforms Technologies, Llc | Digital image sensor using a single-input comparator based quantizer |
| WO2023079360A1 (en) * | 2021-11-03 | 2023-05-11 | Kromek Limited | Stand off structures for electronic circuits |
| US12244936B2 (en) | 2022-01-26 | 2025-03-04 | Meta Platforms Technologies, Llc | On-sensor image processor utilizing contextual data |
| WO2025261783A1 (en) | 2024-06-21 | 2025-12-26 | Paul Scherrer Institut | System for 2d and 3d density imaging using atmospheric (cosmic) particles |
| EP4667978A1 (de) | 2024-06-21 | 2025-12-24 | Paul Scherrer Institut | System zur 2d- und 3d-dichtebildgebung unter verwendung atmosphärischer (kosmischer) partikel |
| CN118944607B (zh) * | 2024-10-12 | 2024-12-10 | 南京大学 | 复位式电荷灵敏放大电路、数据信号的放大及复位方法 |
| CN120293993A (zh) * | 2025-04-22 | 2025-07-11 | 常州工业职业技术学院 | 全自动刀具识别方法、系统及设备 |
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| US4700076A (en) * | 1983-09-02 | 1987-10-13 | Digital Imaging Company Of America, Inc. | Solid-state X-ray receptor and method of making same |
| US5107103A (en) * | 1990-01-26 | 1992-04-21 | Carnegie-Mellon University | Integrated circuit having at least a sensor and a processor thereon |
| US5236871A (en) * | 1992-04-29 | 1993-08-17 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Method for producing a hybridization of detector array and integrated circuit for readout |
| US5493122A (en) * | 1994-02-04 | 1996-02-20 | Nucleonics Development Company | Energy resolving x-ray detector |
| GB2289983B (en) | 1994-06-01 | 1996-10-16 | Simage Oy | Imaging devices,systems and methods |
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| GB2294540A (en) * | 1994-10-25 | 1996-05-01 | Stephen John Matcher | Determing position and time of scintillation event |
| US5665959A (en) | 1995-01-13 | 1997-09-09 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Adminstration | Solid-state image sensor with focal-plane digital photon-counting pixel array |
| US5629524A (en) | 1995-02-21 | 1997-05-13 | Advanced Scientific Concepts, Inc. | High speed crystallography detector |
| JP4063870B2 (ja) * | 1995-04-28 | 2008-03-19 | サニーブルック・ホスピタル | アクティブマトリックスx線撮像アレイ |
| GB9524560D0 (en) * | 1995-12-01 | 1996-01-31 | Philips Electronics Nv | Multiplexer circuit |
| GB2318411B (en) | 1996-10-15 | 1999-03-10 | Simage Oy | Imaging device for imaging radiation |
| US5909026A (en) * | 1996-11-12 | 1999-06-01 | California Institute Of Technology | Integrated sensor with frame memory and programmable resolution for light adaptive imaging |
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| US6538245B1 (en) | 2000-10-26 | 2003-03-25 | Rockwell Science Center, Llc. | Amplified CMOS transducer for single photon read-out of photodetectors |
-
2003
- 2003-08-11 AT AT08172698T patent/ATE474330T1/de active
- 2003-08-11 AU AU2003260400A patent/AU2003260400A1/en not_active Abandoned
- 2003-08-11 ES ES03815050T patent/ES2327835T3/es not_active Expired - Lifetime
- 2003-08-11 AT AT03815050T patent/ATE432535T1/de active
- 2003-08-11 EP EP08172698A patent/EP2037505B1/de not_active Expired - Lifetime
- 2003-08-11 US US10/539,837 patent/US7514688B2/en not_active Expired - Lifetime
- 2003-08-11 EP EP03815050A patent/EP1581971B1/de not_active Expired - Lifetime
- 2003-08-11 DE DE60333410T patent/DE60333410D1/de not_active Expired - Lifetime
- 2003-08-11 DE DE60327809T patent/DE60327809D1/de not_active Expired - Lifetime
- 2003-08-11 WO PCT/EP2003/008886 patent/WO2004064168A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| AU2003260400A1 (en) | 2004-08-10 |
| EP2037505A1 (de) | 2009-03-18 |
| ATE432535T1 (de) | 2009-06-15 |
| ES2327835T3 (es) | 2009-11-04 |
| US7514688B2 (en) | 2009-04-07 |
| EP2037505B1 (de) | 2010-07-14 |
| DE60327809D1 (de) | 2009-07-09 |
| DE60333410D1 (de) | 2010-08-26 |
| EP1581971A1 (de) | 2005-10-05 |
| US20060071170A1 (en) | 2006-04-06 |
| WO2004064168A1 (en) | 2004-07-29 |
| EP1581971B1 (de) | 2009-05-27 |
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| Date | Code | Title | Description |
|---|---|---|---|
| UEP | Publication of translation of european patent specification |
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