ATE475061T1 - Verfahren für berührungslose kapazitive dickenmessungen - Google Patents

Verfahren für berührungslose kapazitive dickenmessungen

Info

Publication number
ATE475061T1
ATE475061T1 AT08785625T AT08785625T ATE475061T1 AT E475061 T1 ATE475061 T1 AT E475061T1 AT 08785625 T AT08785625 T AT 08785625T AT 08785625 T AT08785625 T AT 08785625T AT E475061 T1 ATE475061 T1 AT E475061T1
Authority
AT
Austria
Prior art keywords
flat material
capacitor
thickness
thickness measurements
contact capacitive
Prior art date
Application number
AT08785625T
Other languages
English (en)
Inventor
Stefan Konermann
Markus Stein
Original Assignee
Plast Control Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Plast Control Gmbh filed Critical Plast Control Gmbh
Application granted granted Critical
Publication of ATE475061T1 publication Critical patent/ATE475061T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/08—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means
    • G01B7/087—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means for measuring of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
AT08785625T 2007-08-30 2008-08-19 Verfahren für berührungslose kapazitive dickenmessungen ATE475061T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102007040940A DE102007040940B4 (de) 2007-08-30 2007-08-30 Verfahren und Vorrichtung zur berührungslosen kapazitiven Dickenmessung
PCT/EP2008/006811 WO2009027037A1 (en) 2007-08-30 2008-08-19 Method for contactless capacitive thickness measurements

Publications (1)

Publication Number Publication Date
ATE475061T1 true ATE475061T1 (de) 2010-08-15

Family

ID=39824824

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08785625T ATE475061T1 (de) 2007-08-30 2008-08-19 Verfahren für berührungslose kapazitive dickenmessungen

Country Status (9)

Country Link
US (1) US8315833B2 (de)
EP (1) EP2089668B1 (de)
CN (1) CN101790672B (de)
AT (1) ATE475061T1 (de)
CA (1) CA2689060C (de)
DE (2) DE102007040940B4 (de)
ES (1) ES2347304T3 (de)
PL (1) PL2089668T3 (de)
WO (1) WO2009027037A1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005051675B3 (de) * 2005-10-28 2007-04-19 Windmöller & Hölscher Kg Foliendickensensor mit porösem Bläser
DE102009052585B4 (de) 2009-11-10 2014-10-23 Plast-Control Gmbh Sensorkopf für Messungen an einer Folie
ES2423592T3 (es) 2010-04-29 2013-09-23 Plast-Control Gmbh Dispositivo para hacer mediciones en burbujas de lámina
TWI463110B (zh) * 2011-05-11 2014-12-01 Ind Tech Res Inst 金屬薄膜量測方法
CN102539028B (zh) * 2012-01-04 2014-10-15 天津大学 基于静电力原理的垂直式超微力值测量装置及其溯源方法
WO2014037383A1 (en) * 2012-09-04 2014-03-13 Oce-Technologies B.V. Method for determining a characteristic of a surface layer of a fuser element
CN102997834B (zh) * 2012-12-12 2016-05-25 山东建筑大学 一种共面电容传感器的非导电介质薄膜厚度在线检测装置
ITMI20131703A1 (it) * 2013-10-15 2015-04-16 Syncro S R L Metodo di misura dello spessore di un film di materiale dielettrico noto e relativo dispositivo di misura
CN104613879B (zh) * 2015-01-19 2018-03-20 无锡名谷科技有限公司 一种硅片厚度测量装置及测量方法
CN105158582B (zh) * 2015-09-29 2018-03-09 北京工业大学 一种变间距叉指型相邻电容传感器
DE102016205546A1 (de) 2016-04-04 2017-10-05 Zf Friedrichshafen Ag Getriebe sowie Kraftfahrzeug
US10209054B2 (en) 2016-04-20 2019-02-19 Duke University Non-invasive thickness measurement using capacitance measurement
DE102016012469A1 (de) 2016-10-18 2018-04-19 Reifenhäuser GmbH & Co. KG Maschinenfabrik Verfahren und Vorrichtung zum Bestimmen einer Dickenverteilungssystematik einer doppelt flachgelegten Folienbahn, Verfahren zum Anpassen des Foliendickenprofils einer doppelt flachgelegten Folienbahn, Verwendung eines Verfahrens zum Anpassen eines Foliendickenprofils und Blasfolienanlage zum Herstellen einer doppelt flachgelegten Folienbahn
EP3615885A4 (de) * 2017-06-05 2021-05-12 Duke University Nichtinvasive dickenmessung mit fester frequenz
CN107402407B (zh) * 2017-07-31 2023-12-29 广东美的暖通设备有限公司 管路沉积物检测装置、热泵系统和运行控制方法
CN107782280B (zh) * 2017-10-20 2020-09-01 维沃移动通信有限公司 一种贴膜厚度的检测方法和移动终端
CN112729093A (zh) * 2020-12-08 2021-04-30 广东化一环境科技有限公司 介质厚度检测方法、控制装置及存储介质
JP7852437B2 (ja) * 2022-08-29 2026-04-28 セイコーエプソン株式会社 誘電加熱装置、および、液体吐出システム
CN119306177B (zh) * 2024-10-11 2026-03-24 中芯集成电路（宁波）有限公司 用于检测金属键合强度的半导体结构和测试方法

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AT211565B (de) * 1958-05-09 1960-10-25 Zellweger Uster Ag Vorrichtung zur Feststellung von spontanen Querschnittsänderungen in Textilmaterial
US5742167A (en) * 1991-05-23 1998-04-21 Sussex Instruments Plc. Film thickness measuring capacitive sensors
DE19634979C2 (de) * 1996-08-29 1998-11-05 Siemens Ag Verfahren zur Bestimmung der geometrischen Strukturen von Oberflächenwellenbauelementen
AU1405199A (en) * 1997-11-14 1999-06-07 Jentek Sensors, Inc. Multiple frequency quantitative coating characterization
DE19839816A1 (de) * 1998-09-01 2000-03-02 Basf Ag Verfahren zur kontinuierlichen Überwachung der Beschichtung eines fadenartigen dielektrischen Materials mit Hilfsstoffen
EP1205293B1 (de) * 2000-11-10 2006-07-12 Plast-Control Gerätebau GmbH Verfahren zur Dickenmessung an Mehrschichtfolien
ITMI20012583A1 (it) 2001-12-10 2003-06-10 Electronic Systems Spa Sensore capacitivo per misurare lo spessore di materiali dielettrici in film
JP4217161B2 (ja) * 2002-03-08 2009-01-28 アークレイ株式会社 情報認識機能を有する分析装置、これに用いる分析用具、および分析装置と分析用具のユニット
EP1681531B1 (de) 2005-01-13 2008-04-23 Plast-Control GmbH Vorrichtung und Verfahren zur kapazitiven Vermessung von Materialien
JP2007013051A (ja) * 2005-07-04 2007-01-18 Shinko Electric Ind Co Ltd 基板及びその製造方法
CN1737490A (zh) * 2005-09-01 2006-02-22 太原理工大学 电容式冰层厚度传感器及其检测方法
US8174258B2 (en) * 2006-03-29 2012-05-08 Dolphin Measurement Systems Llc Method and system for measurement of parameters of a flat material

Also Published As

Publication number Publication date
EP2089668A1 (de) 2009-08-19
CA2689060A1 (en) 2009-03-05
WO2009027037A1 (en) 2009-03-05
US20100256951A1 (en) 2010-10-07
ES2347304T3 (es) 2010-10-27
PL2089668T3 (pl) 2010-12-31
CA2689060C (en) 2012-10-23
DE102007040940A1 (de) 2009-03-05
CN101790672B (zh) 2011-11-02
CN101790672A (zh) 2010-07-28
DE102007040940B4 (de) 2010-08-12
US8315833B2 (en) 2012-11-20
EP2089668B1 (de) 2010-07-21
DE602008001871D1 (de) 2010-09-02

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