ATE481647T1 - Verfahren und system zur verfolgung der streuparameter-prüfsystemkalibrierung - Google Patents

Verfahren und system zur verfolgung der streuparameter-prüfsystemkalibrierung

Info

Publication number
ATE481647T1
ATE481647T1 AT09150811T AT09150811T ATE481647T1 AT E481647 T1 ATE481647 T1 AT E481647T1 AT 09150811 T AT09150811 T AT 09150811T AT 09150811 T AT09150811 T AT 09150811T AT E481647 T1 ATE481647 T1 AT E481647T1
Authority
AT
Austria
Prior art keywords
calibration
tracking
test system
parameters
generating
Prior art date
Application number
AT09150811T
Other languages
English (en)
Inventor
Xavier M H Albert-Lebrun
Mario Lisi
Lingen Charles Van
Robert Christopher Peach
Original Assignee
Com Dev Int Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Com Dev Int Ltd filed Critical Com Dev Int Ltd
Application granted granted Critical
Publication of ATE481647T1 publication Critical patent/ATE481647T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Radar Systems Or Details Thereof (AREA)
AT09150811T 2008-01-17 2009-01-16 Verfahren und system zur verfolgung der streuparameter-prüfsystemkalibrierung ATE481647T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/015,931 US7777497B2 (en) 2008-01-17 2008-01-17 Method and system for tracking scattering parameter test system calibration

Publications (1)

Publication Number Publication Date
ATE481647T1 true ATE481647T1 (de) 2010-10-15

Family

ID=40560195

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09150811T ATE481647T1 (de) 2008-01-17 2009-01-16 Verfahren und system zur verfolgung der streuparameter-prüfsystemkalibrierung

Country Status (6)

Country Link
US (1) US7777497B2 (de)
EP (1) EP2081031B1 (de)
AT (1) ATE481647T1 (de)
CA (1) CA2650359A1 (de)
DE (1) DE602009000165D1 (de)
ES (1) ES2353049T3 (de)

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Also Published As

Publication number Publication date
EP2081031A1 (de) 2009-07-22
US7777497B2 (en) 2010-08-17
ES2353049T3 (es) 2011-02-24
EP2081031B1 (de) 2010-09-15
US20090184721A1 (en) 2009-07-23
CA2650359A1 (en) 2009-07-17
DE602009000165D1 (de) 2010-10-28

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