ATE483157T1 - Vorrichtung und verfahren zur automatischen inspektion von materialbahnen - Google Patents

Vorrichtung und verfahren zur automatischen inspektion von materialbahnen

Info

Publication number
ATE483157T1
ATE483157T1 AT04782319T AT04782319T ATE483157T1 AT E483157 T1 ATE483157 T1 AT E483157T1 AT 04782319 T AT04782319 T AT 04782319T AT 04782319 T AT04782319 T AT 04782319T AT E483157 T1 ATE483157 T1 AT E483157T1
Authority
AT
Austria
Prior art keywords
digital information
automatic inspection
material webs
anomalies
image information
Prior art date
Application number
AT04782319T
Other languages
English (en)
Inventor
Carl J Skeps
James A Masterman
Steven P Floeder
Brandon T Berg
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Application granted granted Critical
Publication of ATE483157T1 publication Critical patent/ATE483157T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/14—Picture signal circuitry for video frequency region
    • H04N5/21—Circuitry for suppressing or minimising disturbance, e.g. moiré or halo
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Treatment Of Fiber Materials (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT04782319T 2003-09-24 2004-08-27 Vorrichtung und verfahren zur automatischen inspektion von materialbahnen ATE483157T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/669,197 US7027934B2 (en) 2003-09-24 2003-09-24 Apparatus and method for automated web inspection
PCT/US2004/027821 WO2005036146A1 (en) 2003-09-24 2004-08-27 Apparatus and method for automated web inspection

Publications (1)

Publication Number Publication Date
ATE483157T1 true ATE483157T1 (de) 2010-10-15

Family

ID=34393428

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04782319T ATE483157T1 (de) 2003-09-24 2004-08-27 Vorrichtung und verfahren zur automatischen inspektion von materialbahnen

Country Status (9)

Country Link
US (1) US7027934B2 (de)
EP (1) EP1664749B1 (de)
JP (1) JP5043430B2 (de)
KR (1) KR20060060742A (de)
AT (1) ATE483157T1 (de)
BR (1) BRPI0414557B1 (de)
DE (1) DE602004029378D1 (de)
MX (1) MXPA06003027A (de)
WO (1) WO2005036146A1 (de)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005065305A2 (en) * 2003-12-31 2005-07-21 3M Innovative Properties Company Inventory control for web-based articles
US7623699B2 (en) * 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
US20060090319A1 (en) * 2004-11-01 2006-05-04 Howe Major K Defect locating system for moving web
US7545971B2 (en) * 2005-08-22 2009-06-09 Honeywell International Inc. Method and apparatus for measuring the crepe of a moving sheet
JP2009529810A (ja) 2006-01-13 2009-08-20 エルジー エレクトロニクス インコーポレイティド フィードバック情報に基づくアンテナ選択を使用して伝送ダイバーシティ及び空間多重化を達成するための方法及び装置
ATE425452T1 (de) * 2006-06-13 2009-03-15 Abb Oy Verfahren und vorrichtung zur erkennung von sich wiederholenden mustern
DE102006033663B4 (de) * 2006-07-20 2012-01-26 Airbus Operations Gmbh Verfahren zur Ermittlung eines charakteristischen Parameters einer Probe aus CFK
EP2126552A4 (de) * 2007-02-16 2016-04-20 3M Innovative Properties Co Verfahren und vorrichtung für die beleuchtung von material zur automatischen inspektion
KR100916615B1 (ko) * 2007-06-20 2009-09-14 건국대학교 산학협력단 롤투롤 공정에서의 웹 주름 측정 시스템
US7542821B2 (en) * 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
US8175739B2 (en) * 2007-07-26 2012-05-08 3M Innovative Properties Company Multi-unit process spatial synchronization
WO2009042638A2 (en) * 2007-09-27 2009-04-02 Abb Ltd. Accurate tracking of web features through converting processes
US7937233B2 (en) * 2008-04-17 2011-05-03 3M Innovative Properties Company Preferential defect marking on a web
US7797133B2 (en) * 2008-09-10 2010-09-14 3M Innovative Properties Company Multi-roller registered repeat defect detection of a web process line
US8270701B2 (en) 2010-01-08 2012-09-18 3M Innovative Properties Company Optical web-based defect detection using intrasensor uniformity correction
CN102792154B (zh) * 2010-03-10 2015-09-23 3M创新有限公司 幅材制备工艺中专用的重复缺陷检测
FR2958431B1 (fr) * 2010-03-30 2012-08-17 Solystic Dispositif de traitement d'objets avec un systeme pour surveiller en temps reel la qualite des images des objets
JP5912125B2 (ja) * 2010-11-12 2016-04-27 スリーエム イノベイティブ プロパティズ カンパニー ウェブベース材料における不均一性の高速処理と検出
CN103392125B (zh) * 2011-02-24 2015-09-09 3M创新有限公司 用于检测幅材型材料中的不均匀因素的系统
JP5637014B2 (ja) * 2011-03-03 2014-12-10 セントラル硝子株式会社 ガラス繊維物品の表面欠陥検出装置
WO2013032919A1 (en) * 2011-08-26 2013-03-07 Engagement Media Technologies, Inc. Systems and methods for automatic content communication
US20130091197A1 (en) 2011-10-11 2013-04-11 Microsoft Corporation Mobile device as a local server
US8958898B2 (en) 2011-11-07 2015-02-17 Nalco Company Method and apparatus to monitor and control sheet characteristics on a creping process
JP2013123812A (ja) * 2011-12-13 2013-06-24 Canon Inc 検査装置、検査方法、コンピュータプログラム
US20130159969A1 (en) * 2011-12-16 2013-06-20 Microsoft Corporation Digital signal processing with language integrated monads
CN104205159B (zh) 2012-01-06 2018-02-02 凯米拉公司 表征起皱材料的方法
US8983168B2 (en) * 2012-04-30 2015-03-17 Ncr Corporation System and method of categorising defects in a media item
FI128403B (en) * 2013-07-05 2020-04-30 Procemex Oy Ltd Synchronizing image capture
US9047723B2 (en) * 2013-10-31 2015-06-02 Ncr Corporation Defect categorization
US9518362B2 (en) 2014-04-15 2016-12-13 Georgia-Pacific Consumer Products Lp Methods and apparatuses for controlling a manufacturing line used to convert a paper web into paper products by reading marks on the paper web
CN105136733A (zh) * 2015-08-27 2015-12-09 李学新 胶囊近红外瑕疵分析系统
DE102016213111B4 (de) * 2016-07-19 2018-08-09 Koenig & Bauer Ag Inspektionssystem mit mehreren Erfassungsbereichen
US10043259B2 (en) 2016-07-25 2018-08-07 PT Papertech Inc. Facilitating anomaly detection for a product having a pattern
US10501274B2 (en) * 2017-07-06 2019-12-10 Honeywell International Inc. Continuous web sheet defect analytics, classification and remediation for enhancing equipment efficiency and throughput
US11906445B2 (en) * 2018-10-10 2024-02-20 Goodrich Corporation Automated defect detection for wire rope using image processing techniques
WO2020079567A1 (en) 2018-10-15 2020-04-23 3M Innovative Properties Company Automated inspection for sheet parts of arbitrary shape from manufactured film
US20210379783A1 (en) 2018-10-15 2021-12-09 3M Innovative Properties Company Slitter director for automated control of slit roll generation from manufactured web
CN109613008B (zh) * 2018-12-26 2021-10-22 武汉科技大学 一种利用机器视觉实现白酒微孔膜滤片质量检测的仪器
US12330329B2 (en) 2021-03-30 2025-06-17 Maxcess Americas, Inc. Rotary die cutting device and method for setting a gap dimension of a gap between a die cutting cylinder and a counter pressure cylinder of the rotary die cutting device
US20250091833A1 (en) * 2021-12-09 2025-03-20 Ibs Austria Gmbh Web position tracking
CN119894650A (zh) 2022-09-13 2025-04-25 麦克氏国际公司 用于设定轴向位置和间隙尺寸的刻划装置及方法

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5384793A (en) * 1976-12-29 1978-07-26 Ishikawajima Harima Heavy Ind Crack detecting method by television camera and apparatus for carrying out the method
US4173441A (en) * 1977-03-28 1979-11-06 E. I. Du Pont De Nemours And Company Web inspection system and method therefor
JPS59138904A (ja) * 1983-01-28 1984-08-09 Nippon Steel Corp 走行中板状体の表面欠陥検査方法
JPS6293637A (ja) 1985-10-21 1987-04-30 Hitachi Ltd 自動検反システム
IL99823A0 (en) * 1990-11-16 1992-08-18 Orbot Instr Ltd Optical inspection method and apparatus
US5544256A (en) * 1993-10-22 1996-08-06 International Business Machines Corporation Automated defect classification system
CN1149393C (zh) * 1996-08-20 2004-05-12 乌斯特技术股份公司 平面构型纺织品的疵点识别方法
US6092059A (en) * 1996-12-27 2000-07-18 Cognex Corporation Automatic classifier for real time inspection and classification
FR2761475B1 (fr) * 1997-03-28 1999-06-11 Lorraine Laminage Procede d'inspection de surface d'une bande en defilement par segmentation d'image en zones suspectes
KR100303608B1 (ko) * 1997-05-22 2001-11-22 박호군 혈구세포자동인식방법및장치
US6246472B1 (en) * 1997-07-04 2001-06-12 Hitachi, Ltd. Pattern inspecting system and pattern inspecting method
WO1999010833A1 (en) * 1997-08-27 1999-03-04 Datacube, Inc. Web inspection system for analysis of moving webs
JPH11248641A (ja) 1998-03-03 1999-09-17 Sumitomo Metal Ind Ltd 表面欠陥検査装置及び表面欠陥検査方法
JP2000009447A (ja) 1998-06-25 2000-01-14 Nippon Inter Connection Systems Kk テープキャリアの欠陥検出装置および欠陥検出方法
US6266437B1 (en) * 1998-09-04 2001-07-24 Sandia Corporation Sequential detection of web defects
US6266436B1 (en) * 1999-04-09 2001-07-24 Kimberly-Clark Worldwide, Inc. Process control using multiple detections
US6404910B1 (en) * 1998-12-31 2002-06-11 Kimberly-Clark Worldwide, Inc. Making absorbent articles using vision imaging system
US6496596B1 (en) * 1999-03-23 2002-12-17 Advanced Micro Devices, Inc. Method for detecting and categorizing defects
US6407373B1 (en) * 1999-06-15 2002-06-18 Applied Materials, Inc. Apparatus and method for reviewing defects on an object
US6484306B1 (en) * 1999-12-17 2002-11-19 The Regents Of The University Of California Multi-level scanning method for defect inspection
US7177458B1 (en) 2000-09-10 2007-02-13 Orbotech Ltd. Reduction of false alarms in PCB inspection
US6750466B2 (en) 2001-02-09 2004-06-15 Wintriss Engineering Corporation Web inspection system
US6950547B2 (en) * 2001-02-12 2005-09-27 3M Innovative Properties Company Web inspection method and device

Also Published As

Publication number Publication date
BRPI0414557B1 (pt) 2017-04-18
BRPI0414557A (pt) 2006-11-07
KR20060060742A (ko) 2006-06-05
JP5043430B2 (ja) 2012-10-10
US7027934B2 (en) 2006-04-11
JP2007506973A (ja) 2007-03-22
WO2005036146A1 (en) 2005-04-21
EP1664749A1 (de) 2006-06-07
EP1664749B1 (de) 2010-09-29
MXPA06003027A (es) 2006-06-23
US20050075801A1 (en) 2005-04-07
DE602004029378D1 (de) 2010-11-11

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Legal Events

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