ATE489615T1 - Vorrichtung zur erzeugung elektromagnetischer wellen, integrierte elektromagnetische wellenvorrichtung und elektromagnetischer wellendetektor - Google Patents

Vorrichtung zur erzeugung elektromagnetischer wellen, integrierte elektromagnetische wellenvorrichtung und elektromagnetischer wellendetektor

Info

Publication number
ATE489615T1
ATE489615T1 AT08170511T AT08170511T ATE489615T1 AT E489615 T1 ATE489615 T1 AT E489615T1 AT 08170511 T AT08170511 T AT 08170511T AT 08170511 T AT08170511 T AT 08170511T AT E489615 T1 ATE489615 T1 AT E489615T1
Authority
AT
Austria
Prior art keywords
terahertz wave
electromagnetic wave
region
propagates
integrated
Prior art date
Application number
AT08170511T
Other languages
English (en)
Inventor
Takeaki Itsuji
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Application granted granted Critical
Publication of ATE489615T1 publication Critical patent/ATE489615T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S1/00—Masers, i.e. devices using stimulated emission of electromagnetic radiation in the microwave range
    • H01S1/02—Masers, i.e. devices using stimulated emission of electromagnetic radiation in the microwave range solid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Light Receiving Elements (AREA)
  • Burglar Alarm Systems (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Inspection Of Paper Currency And Valuable Securities (AREA)
AT08170511T 2007-12-07 2008-12-02 Vorrichtung zur erzeugung elektromagnetischer wellen, integrierte elektromagnetische wellenvorrichtung und elektromagnetischer wellendetektor ATE489615T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007316807 2007-12-07

Publications (1)

Publication Number Publication Date
ATE489615T1 true ATE489615T1 (de) 2010-12-15

Family

ID=40481978

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08170511T ATE489615T1 (de) 2007-12-07 2008-12-02 Vorrichtung zur erzeugung elektromagnetischer wellen, integrierte elektromagnetische wellenvorrichtung und elektromagnetischer wellendetektor

Country Status (5)

Country Link
US (1) US8003961B2 (de)
EP (1) EP2068140B1 (de)
JP (1) JP4975000B2 (de)
AT (1) ATE489615T1 (de)
DE (1) DE602008003653D1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4807707B2 (ja) * 2007-11-30 2011-11-02 キヤノン株式会社 波形情報取得装置
JP4975001B2 (ja) * 2007-12-28 2012-07-11 キヤノン株式会社 波形情報取得装置及び波形情報取得方法
JP5341488B2 (ja) 2008-01-18 2013-11-13 キヤノン株式会社 テラヘルツ波を測定するための装置及び方法
JP5419411B2 (ja) * 2008-10-08 2014-02-19 キヤノン株式会社 テラヘルツ波発生素子
JP5632599B2 (ja) 2009-09-07 2014-11-26 キヤノン株式会社 発振器
JP5214806B2 (ja) * 2009-09-29 2013-06-19 株式会社東芝 検体認証システム及び検体認証素子
JP5735824B2 (ja) 2011-03-04 2015-06-17 キヤノン株式会社 情報取得装置及び情報取得方法
JP5799538B2 (ja) * 2011-03-18 2015-10-28 セイコーエプソン株式会社 テラヘルツ波発生装置、カメラ、イメージング装置、計測装置および光源装置
RU2011140310A (ru) * 2011-09-16 2013-04-10 Конинклейке Филипс Электроникс Н.В. Высокочастотная волоноводная структура
JP2015141111A (ja) * 2014-01-29 2015-08-03 パイオニア株式会社 テラヘルツ波出力装置、テラヘルツ波出力方法、コンピュータプログラム及び記録媒体
JP7362409B2 (ja) 2019-10-17 2023-10-17 キヤノン株式会社 照明装置およびカメラシステム
CN115190968B (zh) * 2020-03-04 2026-03-17 三菱电机株式会社 生物体成分测定装置
JP7772422B2 (ja) * 2022-02-24 2025-11-18 国立大学法人大阪大学 テラヘルツ波出力装置およびセンシング装置
JP7851175B2 (ja) 2022-04-15 2026-04-24 キヤノン株式会社 アンテナ装置、通信装置、及び、撮像システム
JP7801938B2 (ja) 2022-04-15 2026-01-19 キヤノン株式会社 アンテナ装置、通信装置、及び、撮像システム

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006528466A (ja) 2003-07-23 2006-12-14 プレジデント・アンド・フェロウズ・オブ・ハーバード・カレッジ コプレーナストリップ線路に基づく方法および装置
JP4136858B2 (ja) 2003-09-12 2008-08-20 キヤノン株式会社 位置検出装置、及び情報入力装置
JP3913253B2 (ja) * 2004-07-30 2007-05-09 キヤノン株式会社 光半導体装置およびその製造方法
JP4878180B2 (ja) 2005-03-24 2012-02-15 キヤノン株式会社 電磁波を用いる検査装置
JP4898472B2 (ja) 2006-04-11 2012-03-14 キヤノン株式会社 検査装置
JP4958278B2 (ja) * 2007-03-13 2012-06-20 キヤノン株式会社 検査装置
US8067739B2 (en) 2007-06-22 2011-11-29 Canon Kabushiki Kaisha Photoconductive element for generation and detection of terahertz wave

Also Published As

Publication number Publication date
JP4975000B2 (ja) 2012-07-11
US8003961B2 (en) 2011-08-23
EP2068140A1 (de) 2009-06-10
DE602008003653D1 (de) 2011-01-05
JP2009158926A (ja) 2009-07-16
US20090146084A1 (en) 2009-06-11
EP2068140B1 (de) 2010-11-24

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