ATE500516T1 - System und verfahren zur signalform-verarbeitung - Google Patents

System und verfahren zur signalform-verarbeitung

Info

Publication number
ATE500516T1
ATE500516T1 AT02750276T AT02750276T ATE500516T1 AT E500516 T1 ATE500516 T1 AT E500516T1 AT 02750276 T AT02750276 T AT 02750276T AT 02750276 T AT02750276 T AT 02750276T AT E500516 T1 ATE500516 T1 AT E500516T1
Authority
AT
Austria
Prior art keywords
waveform
data
digitized
sequences
transition points
Prior art date
Application number
AT02750276T
Other languages
English (en)
Inventor
John Drinkard
Javier Cardona
Christopher Dums
Original Assignee
Omron Scientific Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Scientific Technologies Inc filed Critical Omron Scientific Technologies Inc
Application granted granted Critical
Publication of ATE500516T1 publication Critical patent/ATE500516T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2882—Testing timing characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
  • Selective Calling Equipment (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Manipulation Of Pulses (AREA)
AT02750276T 2001-07-27 2002-07-24 System und verfahren zur signalform-verarbeitung ATE500516T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/917,477 US6665621B2 (en) 2000-11-28 2001-07-27 System and method for waveform processing
PCT/US2002/023483 WO2003012464A1 (en) 2001-07-27 2002-07-24 System and method for waveform processing

Publications (1)

Publication Number Publication Date
ATE500516T1 true ATE500516T1 (de) 2011-03-15

Family

ID=25438844

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02750276T ATE500516T1 (de) 2001-07-27 2002-07-24 System und verfahren zur signalform-verarbeitung

Country Status (6)

Country Link
US (1) US6665621B2 (de)
EP (1) EP1412764B1 (de)
AT (1) ATE500516T1 (de)
DE (1) DE60239341D1 (de)
ES (1) ES2359230T3 (de)
WO (1) WO2003012464A1 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004022911B4 (de) * 2004-05-10 2012-03-01 Sick Ag Signalabtastung
US8242476B2 (en) 2005-12-19 2012-08-14 Leddartech Inc. LED object detection system and method combining complete reflection traces from individual narrow field-of-view channels
WO2008154737A1 (en) 2007-06-18 2008-12-24 Leddartech Inc. Lighting system with traffic management capabilities
DE102006049935B4 (de) * 2006-10-19 2009-12-17 Ingenieurbüro Spies GbR (vertretungsberechtigte Gesellschafter: Hans Spies, Martin Spies, 86558 Hohenwart) Pulslaufzeitsensor
US8600656B2 (en) 2007-06-18 2013-12-03 Leddartech Inc. Lighting system with driver assistance capabilities
US7965384B2 (en) * 2007-09-27 2011-06-21 Omron Scientific Technologies, Inc. Clutter rejection in active object detection systems
CA2710212C (en) 2007-12-21 2014-12-09 Leddartech Inc. Detection and ranging methods and systems
WO2009079779A1 (en) 2007-12-21 2009-07-02 Leddartech Inc. Parking management system and method using lighting system
WO2009121181A1 (en) * 2008-04-04 2009-10-08 Leddartech Inc. Optical level measurement device and method
EP2517189B1 (de) 2009-12-22 2014-03-19 Leddartech Inc. Aktives 3d-überwachungssystem für verkehrsdetektion
US8908159B2 (en) 2011-05-11 2014-12-09 Leddartech Inc. Multiple-field-of-view scannerless optical rangefinder in high ambient background light
WO2012172526A1 (en) 2011-06-17 2012-12-20 Leddartech Inc. System and method for traffic side detection and characterization
CA3112113A1 (en) 2012-03-02 2013-09-06 Leddartech Inc. System and method for multipurpose traffic detection and characterization
EP2787320B1 (de) * 2013-04-05 2017-09-20 Leica Geosystems AG Totalstation mit Scanfunktionalität und wählbaren Scanmodi
JP6214993B2 (ja) 2013-10-11 2017-10-18 株式会社キーエンス 光電センサ
CA2960123C (en) 2014-09-09 2021-04-13 Leddartech Inc. Discretization of detection zone
EP3455645A4 (de) * 2017-07-20 2019-04-24 SZ DJI Technology Co., Ltd. Systeme und verfahren zur optischen abstandsmessung

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2901160A1 (de) 1979-01-10 1980-07-24 Werner Dipl Ing Strauss Messanordnung zur periodischen messung eines beliebigen augenblickswertes einer wechselspannung oder einer welligen gleichspannung
US4507740A (en) 1981-09-08 1985-03-26 Grumman Aerospace Corporation Programmable signal analyzer
US4701803A (en) 1984-06-05 1987-10-20 Canon Kabushiki Kaisha Image data compression apparatus
US4755951A (en) 1986-03-03 1988-07-05 Tektronix, Inc. Method and apparatus for digitizing a waveform
US5103466A (en) * 1990-03-26 1992-04-07 Intel Corporation CMOS digital clock and data recovery circuit

Also Published As

Publication number Publication date
ES2359230T3 (es) 2011-05-19
US20020065620A1 (en) 2002-05-30
US6665621B2 (en) 2003-12-16
EP1412764B1 (de) 2011-03-02
DE60239341D1 (de) 2011-04-14
WO2003012464A1 (en) 2003-02-13
EP1412764A1 (de) 2004-04-28

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties