ATE506701T1 - Verfahren für hochqualitative begrenzung für auf einem unterteilten substrat hergestellte halbleiterbauelemente - Google Patents

Verfahren für hochqualitative begrenzung für auf einem unterteilten substrat hergestellte halbleiterbauelemente

Info

Publication number
ATE506701T1
ATE506701T1 AT08748460T AT08748460T ATE506701T1 AT E506701 T1 ATE506701 T1 AT E506701T1 AT 08748460 T AT08748460 T AT 08748460T AT 08748460 T AT08748460 T AT 08748460T AT E506701 T1 ATE506701 T1 AT E506701T1
Authority
AT
Austria
Prior art keywords
semiconductor devices
devices produced
divided substrate
substrate
partitioned
Prior art date
Application number
AT08748460T
Other languages
English (en)
Inventor
Li Wang
Fengyi Jiang
Original Assignee
Lattice Power Jiangxi Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lattice Power Jiangxi Corp filed Critical Lattice Power Jiangxi Corp
Application granted granted Critical
Publication of ATE506701T1 publication Critical patent/ATE506701T1/de

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01—Manufacture or treatment
    • H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
    • H10H20/0133—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials
    • H10H20/01335—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials the light-emitting regions comprising nitride materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/323—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/32308—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
    • H01S5/32341—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm blue laser based on GaN or GaP
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/327—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIBVI compounds, e.g. ZnCdSe-laser

Landscapes

  • Led Devices (AREA)
  • Element Separation (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
AT08748460T 2007-04-20 2008-05-06 Verfahren für hochqualitative begrenzung für auf einem unterteilten substrat hergestellte halbleiterbauelemente ATE506701T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CN200710104428A CN100580905C (zh) 2007-04-20 2007-04-20 获得在分割衬底上制造的半导体器件的高质量边界的方法
US11/776,881 US20080261403A1 (en) 2007-04-20 2007-07-12 Method for obtaining high-quality boundary for semiconductor devices fabricated on a partitioned substrate
PCT/CN2008/000902 WO2008128444A1 (en) 2007-04-20 2008-05-06 Method for obtaining high-quality boundary for semiconductor devices fabricated on a partitioned substrate

Publications (1)

Publication Number Publication Date
ATE506701T1 true ATE506701T1 (de) 2011-05-15

Family

ID=39872642

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08748460T ATE506701T1 (de) 2007-04-20 2008-05-06 Verfahren für hochqualitative begrenzung für auf einem unterteilten substrat hergestellte halbleiterbauelemente

Country Status (6)

Country Link
US (2) US20080261403A1 (de)
EP (1) EP2140504B1 (de)
CN (1) CN100580905C (de)
AT (1) ATE506701T1 (de)
DE (1) DE602008006376D1 (de)
WO (1) WO2008128444A1 (de)

Families Citing this family (59)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8847249B2 (en) 2008-06-16 2014-09-30 Soraa, Inc. Solid-state optical device having enhanced indium content in active regions
US8805134B1 (en) 2012-02-17 2014-08-12 Soraa Laser Diode, Inc. Methods and apparatus for photonic integration in non-polar and semi-polar oriented wave-guided optical devices
US8143148B1 (en) * 2008-07-14 2012-03-27 Soraa, Inc. Self-aligned multi-dielectric-layer lift off process for laser diode stripes
US8767787B1 (en) 2008-07-14 2014-07-01 Soraa Laser Diode, Inc. Integrated laser diodes with quality facets on GaN substrates
US8284810B1 (en) 2008-08-04 2012-10-09 Soraa, Inc. Solid state laser device using a selected crystal orientation in non-polar or semi-polar GaN containing materials and methods
WO2010017148A1 (en) 2008-08-04 2010-02-11 Soraa, Inc. White light devices using non-polar or semipolar gallium containing materials and phosphors
JP5207944B2 (ja) * 2008-12-11 2013-06-12 スタンレー電気株式会社 半導体発光素子の製造方法
US8247886B1 (en) 2009-03-09 2012-08-21 Soraa, Inc. Polarization direction of optical devices using selected spatial configurations
US8837545B2 (en) 2009-04-13 2014-09-16 Soraa Laser Diode, Inc. Optical device structure using GaN substrates and growth structures for laser applications
US8634442B1 (en) 2009-04-13 2014-01-21 Soraa Laser Diode, Inc. Optical device structure using GaN substrates for laser applications
US9531164B2 (en) * 2009-04-13 2016-12-27 Soraa Laser Diode, Inc. Optical device structure using GaN substrates for laser applications
US8427590B2 (en) 2009-05-29 2013-04-23 Soraa, Inc. Laser based display method and system
US8509275B1 (en) 2009-05-29 2013-08-13 Soraa, Inc. Gallium nitride based laser dazzling device and method
US8247887B1 (en) 2009-05-29 2012-08-21 Soraa, Inc. Method and surface morphology of non-polar gallium nitride containing substrates
US9250044B1 (en) 2009-05-29 2016-02-02 Soraa Laser Diode, Inc. Gallium and nitrogen containing laser diode dazzling devices and methods of use
US9800017B1 (en) 2009-05-29 2017-10-24 Soraa Laser Diode, Inc. Laser device and method for a vehicle
KR101640830B1 (ko) * 2009-08-17 2016-07-22 삼성전자주식회사 기판 구조체 및 그 제조 방법
US8355418B2 (en) 2009-09-17 2013-01-15 Soraa, Inc. Growth structures and method for forming laser diodes on {20-21} or off cut gallium and nitrogen containing substrates
US8750342B1 (en) 2011-09-09 2014-06-10 Soraa Laser Diode, Inc. Laser diodes with scribe structures
US9583678B2 (en) 2009-09-18 2017-02-28 Soraa, Inc. High-performance LED fabrication
US10147850B1 (en) 2010-02-03 2018-12-04 Soraa, Inc. System and method for providing color light sources in proximity to predetermined wavelength conversion structures
US8905588B2 (en) 2010-02-03 2014-12-09 Sorra, Inc. System and method for providing color light sources in proximity to predetermined wavelength conversion structures
CN101814565A (zh) * 2010-03-02 2010-08-25 上海蓝光科技有限公司 一种发光二极管芯片的结构及其制造方法
US8451876B1 (en) 2010-05-17 2013-05-28 Soraa, Inc. Method and system for providing bidirectional light sources with broad spectrum
US9450143B2 (en) 2010-06-18 2016-09-20 Soraa, Inc. Gallium and nitrogen containing triangular or diamond-shaped configuration for optical devices
US8816319B1 (en) 2010-11-05 2014-08-26 Soraa Laser Diode, Inc. Method of strain engineering and related optical device using a gallium and nitrogen containing active region
US9048170B2 (en) 2010-11-09 2015-06-02 Soraa Laser Diode, Inc. Method of fabricating optical devices using laser treatment
US8597967B1 (en) 2010-11-17 2013-12-03 Soraa, Inc. Method and system for dicing substrates containing gallium and nitrogen material
CN102569543B (zh) * 2010-12-30 2015-09-02 比亚迪股份有限公司 一种发光二极管芯片的制作方法
US9025635B2 (en) 2011-01-24 2015-05-05 Soraa Laser Diode, Inc. Laser package having multiple emitters configured on a support member
US9595813B2 (en) 2011-01-24 2017-03-14 Soraa Laser Diode, Inc. Laser package having multiple emitters configured on a substrate member
US9093820B1 (en) 2011-01-25 2015-07-28 Soraa Laser Diode, Inc. Method and structure for laser devices using optical blocking regions
US9287684B2 (en) * 2011-04-04 2016-03-15 Soraa Laser Diode, Inc. Laser package having multiple emitters with color wheel
US8686431B2 (en) 2011-08-22 2014-04-01 Soraa, Inc. Gallium and nitrogen containing trilateral configuration for optical devices
US9178114B2 (en) 2011-09-29 2015-11-03 Manutius Ip, Inc. P-type doping layers for use with light emitting devices
US20130082274A1 (en) 2011-09-29 2013-04-04 Bridgelux, Inc. Light emitting devices having dislocation density maintaining buffer layers
US8664679B2 (en) 2011-09-29 2014-03-04 Toshiba Techno Center Inc. Light emitting devices having light coupling layers with recessed electrodes
US9012921B2 (en) 2011-09-29 2015-04-21 Kabushiki Kaisha Toshiba Light emitting devices having light coupling layers
US8853668B2 (en) 2011-09-29 2014-10-07 Kabushiki Kaisha Toshiba Light emitting regions for use with light emitting devices
US8698163B2 (en) 2011-09-29 2014-04-15 Toshiba Techno Center Inc. P-type doping layers for use with light emitting devices
US8971370B1 (en) 2011-10-13 2015-03-03 Soraa Laser Diode, Inc. Laser devices using a semipolar plane
US8912025B2 (en) 2011-11-23 2014-12-16 Soraa, Inc. Method for manufacture of bright GaN LEDs using a selective removal process
TWI705150B (zh) * 2012-01-12 2020-09-21 日商大日本印刷股份有限公司 蒸鍍遮罩的製造方法、層積體、圖案的製造方法及有機半導體元件的製造方法
TWI720818B (zh) 2012-01-12 2021-03-01 日商大日本印刷股份有限公司 蒸鍍遮罩、圖案之製造方法、有機半導體元件的製造方法
US9020003B1 (en) 2012-03-14 2015-04-28 Soraa Laser Diode, Inc. Group III-nitride laser diode grown on a semi-polar orientation of gallium and nitrogen containing substrates
US9343871B1 (en) 2012-04-05 2016-05-17 Soraa Laser Diode, Inc. Facet on a gallium and nitrogen containing laser diode
US9978904B2 (en) 2012-10-16 2018-05-22 Soraa, Inc. Indium gallium nitride light emitting devices
WO2014084682A1 (ko) * 2012-11-29 2014-06-05 Kim Sungdong 모기판으로부터 반도체 박막을 박피하는 방법 및 이를 이용한 반도체 장치의 제조 방법
WO2015011583A1 (en) 2013-07-22 2015-01-29 Koninklijke Philips N.V. Method of separating light emitting devices formed on a substrate wafer
CN104576865A (zh) * 2013-10-25 2015-04-29 广东德力光电有限公司 一种应力释放的GaN基发光二极管结构及制作方法
US9419189B1 (en) 2013-11-04 2016-08-16 Soraa, Inc. Small LED source with high brightness and high efficiency
US11437774B2 (en) 2015-08-19 2022-09-06 Kyocera Sld Laser, Inc. High-luminous flux laser-based white light source
US10707308B2 (en) 2017-12-24 2020-07-07 HangZhou HaiCun Information Technology Co., Ltd. Hetero-epitaxial output device array
US11239637B2 (en) 2018-12-21 2022-02-01 Kyocera Sld Laser, Inc. Fiber delivered laser induced white light system
US11421843B2 (en) 2018-12-21 2022-08-23 Kyocera Sld Laser, Inc. Fiber-delivered laser-induced dynamic light system
US12000552B2 (en) 2019-01-18 2024-06-04 Kyocera Sld Laser, Inc. Laser-based fiber-coupled white light system for a vehicle
US11884202B2 (en) 2019-01-18 2024-01-30 Kyocera Sld Laser, Inc. Laser-based fiber-coupled white light system
US12152742B2 (en) 2019-01-18 2024-11-26 Kyocera Sld Laser, Inc. Laser-based light guide-coupled wide-spectrum light system
TWI725688B (zh) * 2019-12-26 2021-04-21 新唐科技股份有限公司 半導體結構及其製造方法

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4680085A (en) * 1986-04-14 1987-07-14 Ovonic Imaging Systems, Inc. Method of forming thin film semiconductor devices
JPH0575110A (ja) * 1991-09-13 1993-03-26 Fuji Electric Co Ltd 半導体装置
US5406095A (en) * 1992-08-27 1995-04-11 Victor Company Of Japan, Ltd. Light emitting diode array and production method of the light emitting diode
GB9313843D0 (en) * 1993-07-05 1993-08-18 Philips Electronics Uk Ltd A semiconductor device comprising an insulated gate field effect transistor
US6001678A (en) * 1995-03-14 1999-12-14 Mitsubishi Denki Kabushiki Kaisha Insulated gate semiconductor device
US5874747A (en) * 1996-02-05 1999-02-23 Advanced Technology Materials, Inc. High brightness electroluminescent device emitting in the green to ultraviolet spectrum and method of making the same
JPH10275936A (ja) * 1997-03-28 1998-10-13 Rohm Co Ltd 半導体発光素子の製法
JP3805883B2 (ja) * 1997-12-26 2006-08-09 東芝電子エンジニアリング株式会社 窒化ガリウム系半導体ウエハおよび窒化ガリウム系半導体素子、ならびにそれらの製造方法
JP3338360B2 (ja) * 1998-03-23 2002-10-28 三洋電機株式会社 窒化ガリウム系半導体ウエハの製造方法
JP3724620B2 (ja) * 1998-09-29 2005-12-07 シャープ株式会社 発光ダイオードの製造方法
JP3484394B2 (ja) * 2000-04-12 2004-01-06 Necエレクトロニクス株式会社 光半導体装置およびその製造方法
US6294414B1 (en) * 2000-05-04 2001-09-25 Agere Systems Guardian Corp. Method of fabricating heterointerface devices having diffused junctions
JP4120184B2 (ja) * 2000-06-30 2008-07-16 セイコーエプソン株式会社 実装用微小構造体および光伝送装置
US6611002B2 (en) * 2001-02-23 2003-08-26 Nitronex Corporation Gallium nitride material devices and methods including backside vias
DE60212755T2 (de) * 2001-04-18 2006-11-16 Nippon Telegraph And Telephone Corp. Optische Halbleitervorrichtung und Herstellungsverfahren
US6939730B2 (en) * 2001-04-24 2005-09-06 Sony Corporation Nitride semiconductor, semiconductor device, and method of manufacturing the same
JP4121740B2 (ja) * 2001-12-19 2008-07-23 三洋電機株式会社 半導体素子の製造方法
JP2003209280A (ja) * 2002-01-11 2003-07-25 Hitachi Cable Ltd 発光ダイオードアレイ
US7030032B2 (en) * 2003-05-13 2006-04-18 Raytheon Company Photodiode passivation technique
JP2006086516A (ja) * 2004-08-20 2006-03-30 Showa Denko Kk 半導体発光素子の製造方法
CN1697205A (zh) * 2005-04-15 2005-11-16 南昌大学 在硅衬底上制备铟镓铝氮薄膜及发光器件的方法
US20080087875A1 (en) * 2006-10-11 2008-04-17 Feng-Hsu Fan Protection for the epitaxial structure of metal devices

Also Published As

Publication number Publication date
CN100580905C (zh) 2010-01-13
EP2140504A1 (de) 2010-01-06
EP2140504A4 (de) 2010-04-28
WO2008128444A1 (en) 2008-10-30
CN101290908A (zh) 2008-10-22
EP2140504B1 (de) 2011-04-20
US20080261403A1 (en) 2008-10-23
US8426325B2 (en) 2013-04-23
US20110281422A1 (en) 2011-11-17
DE602008006376D1 (de) 2011-06-01

Similar Documents

Publication Publication Date Title
DE602008006376D1 (de) Verfahren für hochqualitative begrenzung für auf einem unterteilten substrat hergestellte halbleiterbauelemente
WO2012050321A3 (ko) 3차원 구조의 메모리 소자를 제조하는 방법 및 장치
WO2012017978A3 (en) Electromechanical transducer and method of producing the same
WO2012057517A3 (ko) 화합물 반도체 장치 및 화합물 반도체 제조방법
TW200614507A (en) Finfet transistor process
WO2017200621A3 (en) Assembly processes for three-dimensional microstructures
WO2010059790A3 (en) Integration sequences with top profile modification
EP3803980A4 (de) Verfahren zur entfernung von halbleitenden schichten aus einem halbleitenden substrat
SG144121A1 (en) Nitride semiconductor substrate and manufacturing method thereof
FR2984599B1 (fr) Procede de fabrication d'un micro- ou nano- fil semiconducteur, structure semiconductrice comportant un tel micro- ou nano- fil et procede de fabrication d'une structure semiconductrice
FR2932923B1 (fr) Substrat heterogene comportant une couche sacrificielle et son procede de realisation.
WO2010090394A3 (ko) 절연된 도전성 패턴의 제조 방법
EP4032700A4 (de) Verfahren zur herstellung eines siliziumnitridsubstrats
WO2012050322A3 (ko) 3차원 구조의 메모리 소자를 제조하는 방법 및 장치
EP2477237A4 (de) Gruppe-iii-nitrid-kristallsubstrat, gruppe-iii-nitrid-kristallsubstrat mit epitaktischer schicht, halbleiterbauelement und herstellungsverfahren dafür
EP2835884A3 (de) Lichtemittierendes Element und Herstellungsverfahren dafür
WO2010044642A3 (en) Semiconductor light emitting device and method for manufacturing the same
TW201703194A (zh) 形成淺溝槽隔離結構之方法
PH12018502444A1 (en) Production method for fabry-perot interference filter
FR2978605B1 (fr) Procede de fabrication d'une structure semi-conductrice comprenant une couche fonctionnalisee sur un substrat support
WO2013056831A3 (de) Bohrer mit beschichtung
FR3021454B1 (fr) Procede de fabrication d'un materiau semi-conducteur incluant une couche de nitrure d'element iii semi-polaire
WO2010018946A3 (ko) 반도체 발광소자 및 그 제조방법
FR2935067B1 (fr) Procede de fabrication d'une structure semi-conductrice plan de masse enterre
WO2009014345A3 (en) Light emitting device and method of manufacturing the same

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties