ATE511218T1 - Verfahren zur bildung eines durchschmelzkontakts - Google Patents
Verfahren zur bildung eines durchschmelzkontaktsInfo
- Publication number
- ATE511218T1 ATE511218T1 AT99970510T AT99970510T ATE511218T1 AT E511218 T1 ATE511218 T1 AT E511218T1 AT 99970510 T AT99970510 T AT 99970510T AT 99970510 T AT99970510 T AT 99970510T AT E511218 T1 ATE511218 T1 AT E511218T1
- Authority
- AT
- Austria
- Prior art keywords
- layer
- column
- forming
- heated
- thin film
- Prior art date
Links
- 230000004927 fusion Effects 0.000 title 1
- 239000000463 material Substances 0.000 abstract 2
- 239000010409 thin film Substances 0.000 abstract 2
- 229910052581 Si3N4 Inorganic materials 0.000 abstract 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 1
- 239000002019 doping agent Substances 0.000 abstract 1
- 239000011521 glass Substances 0.000 abstract 1
- 230000005012 migration Effects 0.000 abstract 1
- 238000013508 migration Methods 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 abstract 1
- 229910052814 silicon oxide Inorganic materials 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/121—The active layers comprising only Group IV materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
- H10F77/148—Shapes of potential barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/20—Electrodes
- H10F77/206—Electrodes for devices having potential barriers
- H10F77/211—Electrodes for devices having potential barriers for photovoltaic cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/914—Doping
- Y10S438/919—Compensation doping
Landscapes
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Photovoltaic Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AUPP6462A AUPP646298A0 (en) | 1998-10-12 | 1998-10-12 | Melt through contact formation method |
| PCT/AU1999/000871 WO2000022681A1 (en) | 1998-10-12 | 1999-10-12 | Melt through contact formation method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE511218T1 true ATE511218T1 (de) | 2011-06-15 |
Family
ID=3810684
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT99970510T ATE511218T1 (de) | 1998-10-12 | 1999-10-12 | Verfahren zur bildung eines durchschmelzkontakts |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6551903B1 (de) |
| EP (1) | EP1138088B1 (de) |
| JP (1) | JP2002527910A (de) |
| AT (1) | ATE511218T1 (de) |
| AU (1) | AUPP646298A0 (de) |
| WO (1) | WO2000022681A1 (de) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AUPQ385899A0 (en) * | 1999-11-04 | 1999-11-25 | Pacific Solar Pty Limited | Formation of contacts on thin films |
| DE10046170A1 (de) * | 2000-09-19 | 2002-04-04 | Fraunhofer Ges Forschung | Verfahren zur Herstellung eines Halbleiter-Metallkontaktes durch eine dielektrische Schicht |
| US20080289683A1 (en) * | 2004-06-04 | 2008-11-27 | Timothy Michael Walsh | Thin-Film Solar Cell Interconnection |
| WO2006005116A1 (en) * | 2004-07-08 | 2006-01-19 | Newsouth Innovations Pty Limited | Laser-formed electrodes for solar cells |
| DE102005045704A1 (de) * | 2005-09-19 | 2007-03-22 | Gebr. Schmid Gmbh & Co. | Verfahren und Vorrichtung zur Bearbeitung von Substraten, insbesondere Solarzellen |
| TWI401810B (zh) * | 2006-10-04 | 2013-07-11 | Gigastorage Corp | 太陽能電池 |
| JP2009152222A (ja) * | 2006-10-27 | 2009-07-09 | Kyocera Corp | 太陽電池素子の製造方法 |
| JP2010518609A (ja) * | 2007-02-08 | 2010-05-27 | ウーシー・サンテック・パワー・カンパニー・リミテッド | ハイブリッドシリコン太陽電池及び該ハイブリッドシリコン太陽電池の製造方法 |
| DE102008017312B4 (de) | 2008-04-04 | 2012-11-22 | Universität Stuttgart | Verfahren zur Herstellung einer Solarzelle |
| US20090283145A1 (en) * | 2008-05-13 | 2009-11-19 | Kim Yun-Gi | Semiconductor Solar Cells Having Front Surface Electrodes |
| US20100000589A1 (en) * | 2008-07-03 | 2010-01-07 | Amelio Solar, Inc. | Photovoltaic devices having conductive paths formed through the active photo absorber |
| EP2422377A4 (de) * | 2009-04-22 | 2013-12-04 | Tetrasun Inc | Lokalisierte metallkontakte mit lokalisierter laserunterstützter umwandlung von funktionalen folien in solarzellen |
| DE102011018386A1 (de) * | 2011-04-18 | 2012-10-18 | Universität Stuttgart | Verfahren zum Aufschmelzen von durchgehenden Bereichen an Halbleitersubstraten |
| US9847438B2 (en) * | 2013-03-15 | 2017-12-19 | Sunpower Corporation | Reduced contact resistance and improved lifetime of solar cells |
| WO2024141103A1 (zh) * | 2022-12-30 | 2024-07-04 | 上海联影微电子科技有限公司 | 光电二极管及其制造方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4312114A (en) * | 1977-02-24 | 1982-01-26 | The United States Of America As Represented By The Secretary Of The Navy | Method of preparing a thin-film, single-crystal photovoltaic detector |
| JPS6059751A (ja) * | 1983-09-13 | 1985-04-06 | Matsushita Electronics Corp | 半導体プログラマブル素子およびその製造方法 |
| JPS63119586A (ja) * | 1986-11-07 | 1988-05-24 | Sanyo Electric Co Ltd | 光起電力装置の製造方法 |
| JPH01134976A (ja) * | 1987-11-20 | 1989-05-26 | Mitsubishi Electric Corp | 太陽電池の製造方法 |
| US4838952A (en) * | 1988-04-29 | 1989-06-13 | Spectrolab, Inc. | Controlled reflectance solar cell |
| JPH02268472A (ja) * | 1989-04-10 | 1990-11-02 | Showa Shell Sekiyu Kk | 光起電力装置およびその製造方法 |
| JPH03124067A (ja) * | 1989-10-07 | 1991-05-27 | Showa Shell Sekiyu Kk | 光起電力装置およびその製造方法 |
| JPH0415962A (ja) * | 1990-05-09 | 1992-01-21 | Sharp Corp | 太陽電池及びその製造方法 |
| JPH0423364A (ja) * | 1990-05-15 | 1992-01-27 | Showa Shell Sekiyu Kk | 鏡として利用可能な光起電力装置 |
| JPH04223378A (ja) * | 1990-12-25 | 1992-08-13 | Sharp Corp | 太陽電池 |
| JPH11126916A (ja) * | 1997-10-24 | 1999-05-11 | Sharp Corp | 集積形薄膜太陽電池及びその製造方法 |
-
1998
- 1998-10-12 AU AUPP6462A patent/AUPP646298A0/en not_active Abandoned
-
1999
- 1999-10-12 JP JP2000576498A patent/JP2002527910A/ja active Pending
- 1999-10-12 AT AT99970510T patent/ATE511218T1/de not_active IP Right Cessation
- 1999-10-12 EP EP99970510A patent/EP1138088B1/de not_active Expired - Lifetime
- 1999-10-12 US US09/807,373 patent/US6551903B1/en not_active Expired - Fee Related
- 1999-10-12 WO PCT/AU1999/000871 patent/WO2000022681A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| EP1138088A1 (de) | 2001-10-04 |
| EP1138088A4 (de) | 2006-08-30 |
| JP2002527910A (ja) | 2002-08-27 |
| US6551903B1 (en) | 2003-04-22 |
| AUPP646298A0 (en) | 1998-11-05 |
| WO2000022681A1 (en) | 2000-04-20 |
| EP1138088B1 (de) | 2011-05-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |