ATE524723T1 - Blendschutzträger für reflektiertes polarisiertes licht - Google Patents

Blendschutzträger für reflektiertes polarisiertes licht

Info

Publication number
ATE524723T1
ATE524723T1 AT03760755T AT03760755T ATE524723T1 AT E524723 T1 ATE524723 T1 AT E524723T1 AT 03760755 T AT03760755 T AT 03760755T AT 03760755 T AT03760755 T AT 03760755T AT E524723 T1 ATE524723 T1 AT E524723T1
Authority
AT
Austria
Prior art keywords
support
2jbeta1
polarized light
reflected polarized
thickness
Prior art date
Application number
AT03760755T
Other languages
English (en)
Inventor
Dominique Ausserre
Marie-Pierre Valignat
Original Assignee
Centre Nat Rech Scient
Univ Paris Curie
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre Nat Rech Scient, Univ Paris Curie filed Critical Centre Nat Rech Scient
Application granted granted Critical
Publication of ATE524723T1 publication Critical patent/ATE524723T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/211—Ellipsometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G01J4/04—Polarimeters using electric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/0303—Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/08—Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of polarising materials
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/08—Mirrors
    • G02B5/09—Multifaceted or polygonal mirrors, e.g. polygonal scanning mirrors; Fresnel mirrors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Polarising Elements (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Transforming Electric Information Into Light Information (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Microscoopes, Condenser (AREA)
AT03760755T 2002-06-19 2003-06-19 Blendschutzträger für reflektiertes polarisiertes licht ATE524723T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0207599A FR2841339B1 (fr) 2002-06-19 2002-06-19 Supports anti-reflechissants et supports amplificateurs de contraste pour la lumiere polarisee en reflexion
PCT/FR2003/001895 WO2004001399A1 (fr) 2002-06-19 2003-06-19 Supports anti-reflechissants et supports amplificateurs de contraste pour la lumiere polarisee en reflexion

Publications (1)

Publication Number Publication Date
ATE524723T1 true ATE524723T1 (de) 2011-09-15

Family

ID=29719891

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03760755T ATE524723T1 (de) 2002-06-19 2003-06-19 Blendschutzträger für reflektiertes polarisiertes licht

Country Status (12)

Country Link
US (1) US7652762B2 (de)
EP (1) EP1532432B1 (de)
JP (1) JP4408805B2 (de)
KR (1) KR20050042265A (de)
CN (1) CN100520357C (de)
AT (1) ATE524723T1 (de)
AU (1) AU2003258819A1 (de)
CA (1) CA2489581C (de)
FR (1) FR2841339B1 (de)
IL (1) IL165798A0 (de)
PL (1) PL374376A1 (de)
WO (1) WO2004001399A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2872910B1 (fr) * 2004-07-07 2006-10-13 Nanoraptor Sa Composant optique pour l'observation d'un echantillon nanometrique, systeme comprenant un tel composant, procede d'analyse mettant en oeuvre ce composant, et leurs applications
FR2962804B1 (fr) 2010-07-19 2014-04-18 Horiba Jobin Yvon Sas Dispositif et procede de mesure polarimetrique a resolution microscopique, accessoire de polarimetrie pour microscope, ellipso-microscope et microscope a contraste ellipsometrique
FR2993987B1 (fr) * 2012-07-26 2016-12-09 Centre Nat Rech Scient Procedes optiques pour l'observation d'echantillons et pour la detection ou le dosage d'especes chimiques ou biologiques.
FR3012131B1 (fr) * 2013-10-18 2018-01-19 Centre National De La Recherche Scientifique Supports amplificateurs de contraste pour l'observation d'un echantillon, leur procedes de fabrication et leurs utilisations
FR3012132B1 (fr) 2013-10-18 2016-08-05 Centre Nat Rech Scient Procede de fabrication de supports amplificateurs de contraste
CN113916797B (zh) * 2021-09-30 2022-08-02 华中科技大学 一种磁性薄膜的磁光参数表征方法及系统

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4747674A (en) * 1986-04-18 1988-05-31 Polaroid Corporation Contrast enhancement filter
JPH02190704A (ja) * 1989-01-20 1990-07-26 Ricoh Co Ltd 屈折率・膜厚測定に於ける入射角決定方法
US5639671A (en) * 1989-09-18 1997-06-17 Biostar, Inc. Methods for optimizing of an optical assay device
IL96483A (en) * 1990-11-27 1995-07-31 Orbotech Ltd Optical inspection method and apparatus
US5408322A (en) * 1993-04-26 1995-04-18 Materials Research Corporation Self aligning in-situ ellipsometer and method of using for process monitoring
JP2648098B2 (ja) * 1994-07-29 1997-08-27 日本電気株式会社 薄膜形成装置
US5812405A (en) * 1995-05-23 1998-09-22 Viratec Thin Films, Inc. Three variable optimization system for thin film coating design
CN1144906A (zh) * 1995-09-06 1997-03-12 东南大学 薄膜厚度和折射率的成像检测法及其设备
US6172812B1 (en) * 1997-01-27 2001-01-09 Peter D. Haaland Anti-reflection coatings and coated articles
DE19708036C2 (de) * 1997-02-27 2000-06-29 Gunther Elender Ellipsometrisches Mikroskop
JP2967474B2 (ja) * 1997-03-27 1999-10-25 株式会社巴川製紙所 防眩材料及びそれを使用した偏光フィルム
GB2352030A (en) * 1999-07-14 2001-01-17 Ibm Measuring surface roughness and contaminant thickness using ellipsometry
JP3645523B2 (ja) * 1999-08-06 2005-05-11 サーモ エレクトロン コーポレイション−ポイント オブ ケア エンド ラピッド ダイアグノスティックス 薄膜による光の減衰に基づく分析結合アッセイ用装置
US6693746B1 (en) * 1999-09-29 2004-02-17 Fuji Photo Film Co., Ltd. Anti-glare and anti-reflection film, polarizing plate, and image display device
US7130029B2 (en) * 2000-09-20 2006-10-31 Kla-Tencor Technologies Corp. Methods and systems for determining an adhesion characteristic and a thickness of a specimen
FR2818376B1 (fr) * 2000-12-18 2003-03-28 Centre Nat Rech Scient Dispositif de visualisation bidimensionnelle ellipsometrique d'un echantillon, procede de visualisation et procede de mesure ellipsometrique avec resolution spatiale

Also Published As

Publication number Publication date
KR20050042265A (ko) 2005-05-06
JP2005530169A (ja) 2005-10-06
WO2004001399A1 (fr) 2003-12-31
EP1532432A1 (de) 2005-05-25
FR2841339B1 (fr) 2004-09-10
JP4408805B2 (ja) 2010-02-03
IL165798A0 (en) 2006-01-15
FR2841339A1 (fr) 2003-12-26
CA2489581A1 (fr) 2003-12-31
PL374376A1 (en) 2005-10-17
CA2489581C (fr) 2013-01-08
EP1532432B1 (de) 2011-09-14
US7652762B2 (en) 2010-01-26
US20060103933A1 (en) 2006-05-18
CN1668911A (zh) 2005-09-14
AU2003258819A1 (en) 2004-01-06
AU2003258819A2 (en) 2004-01-06
CN100520357C (zh) 2009-07-29

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties