ATE528637T1 - Taupunktmessverfahren und einrichtung zur ausführung des verfahrens - Google Patents

Taupunktmessverfahren und einrichtung zur ausführung des verfahrens

Info

Publication number
ATE528637T1
ATE528637T1 AT04748911T AT04748911T ATE528637T1 AT E528637 T1 ATE528637 T1 AT E528637T1 AT 04748911 T AT04748911 T AT 04748911T AT 04748911 T AT04748911 T AT 04748911T AT E528637 T1 ATE528637 T1 AT E528637T1
Authority
AT
Austria
Prior art keywords
dew point
executing
point measuring
light flux
measuring method
Prior art date
Application number
AT04748911T
Other languages
English (en)
Inventor
Alexandr Mikhailovich Derevyagin
Alexander Sergeevich Fomin
Sergei Viktorovich Seleznev
Original Assignee
Alexandr Mikhailovich Derevyagin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alexandr Mikhailovich Derevyagin filed Critical Alexandr Mikhailovich Derevyagin
Application granted granted Critical
Publication of ATE528637T1 publication Critical patent/ATE528637T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/56—Investigating or analyzing materials by the use of thermal means by investigating moisture content
    • G01N25/66—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
    • G01N25/68—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point by varying the temperature of a condensing surface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0641—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/556—Measuring separately scattering and specular

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Sink And Installation For Waste Water (AREA)
AT04748911T 2003-05-30 2004-05-25 Taupunktmessverfahren und einrichtung zur ausführung des verfahrens ATE528637T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
RU2003116084/28A RU2231046C1 (ru) 2003-05-30 2003-05-30 Способ измерения точки росы и устройство для его осуществления
PCT/RU2004/000197 WO2004106898A1 (en) 2003-05-30 2004-05-25 Dew point measurement method and device for carrying out said method

Publications (1)

Publication Number Publication Date
ATE528637T1 true ATE528637T1 (de) 2011-10-15

Family

ID=32847039

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04748911T ATE528637T1 (de) 2003-05-30 2004-05-25 Taupunktmessverfahren und einrichtung zur ausführung des verfahrens

Country Status (7)

Country Link
US (1) US7350970B2 (de)
EP (1) EP1632768B1 (de)
CN (1) CN100552447C (de)
AT (1) ATE528637T1 (de)
EA (1) EA006871B1 (de)
RU (1) RU2231046C1 (de)
WO (1) WO2004106898A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004038397B3 (de) * 2004-08-06 2006-04-13 Bartec Gmbh Vorrichtung zum Bestimmen der Taupunkttemperatur eines Messgases
RU2318207C1 (ru) * 2006-05-19 2008-02-27 ООО Завод "Саратовгазатоматика" Способ определения температуры точки росы по воде в природном газе
EP3051279B1 (de) * 2007-04-04 2025-05-07 Espec Corp. Hygrometer und taupunktinstrument
US8641270B2 (en) 2009-05-22 2014-02-04 Alexandr Mikhailovich Derevyagin Method for hydrocarbon dew point temperature measurement and device for carrying out said method
EP2780701B1 (de) 2011-11-18 2017-09-20 Shell Internationale Research Maatschappij B.V. Verfahren zur bestimmung des taupunkts eines verdampften kohlenwasserstoffrohstoffs
RU2472141C1 (ru) * 2011-12-16 2013-01-10 Общество С Ограниченной Ответственностью Научно-Техническая Фирма "Бакс" Способ определения точек росы в газах с анализом химической природы конденсирующихся веществ и устройство для его осуществления
CN112912714A (zh) * 2018-11-01 2021-06-04 ams有限公司 结合光学波导的湿度传感器
RU2705709C1 (ru) * 2019-05-07 2019-11-11 Федеральное государственное автономное образовательное учреждение высшего образования "Дальневосточный федеральный университет" (ДВФУ) Реактор для контроля гидратообразования
RU2705935C1 (ru) * 2019-05-07 2019-11-12 Федеральное государственное автономное образовательное учреждение высшего образования "Дальневосточный федеральный университет" (ДВФУ) Реактор для контроля гидратообразования
RU2705707C1 (ru) * 2019-05-07 2019-11-11 Федеральное государственное автономное образовательное учреждение высшего образования "Дальневосточный федеральный университет" (ДВФУ) Реактор для контроля гидратообразования

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3552186A (en) * 1969-04-01 1971-01-05 Alco Standard Corp Apparatus for measuring the dew point temperature of a gas
JPS5764130A (en) * 1980-10-08 1982-04-19 Mitsubishi Electric Corp Radiation thermometer
DE3136887A1 (de) * 1981-09-17 1983-03-31 Ibm Deutschland Gmbh, 7000 Stuttgart Verfahren und einrichtung zur interferometrischen dickenmessung
US4629333A (en) * 1984-10-19 1986-12-16 Eg&G, Inc. Chilled mirror hygrometer with performance monitoring
US4701052A (en) * 1985-05-24 1987-10-20 Schoen Jr Oscar W Dew point hygrometer
US5022045A (en) * 1985-08-06 1991-06-04 Elliott Stanley B Optical-type, phase transition humidity-responsive devices
US4652745A (en) * 1985-12-06 1987-03-24 Ford Motor Company Optical moisture sensor for a window or windshield
US4908508A (en) * 1987-02-12 1990-03-13 Akzo N.V. Process and apparatus for determining thicknesses of layers
SU1536278A1 (ru) * 1987-02-16 1990-01-15 Войсковая Часть 11284 Гигрометр точки росы
JPH07104304B2 (ja) * 1987-06-11 1995-11-13 大阪酸素工業株式会社 ガス中の微量水分量測定装置
US4826321A (en) * 1988-03-14 1989-05-02 Nanometrics, Incorporated Thin dielectric film measuring system
DE4014375A1 (de) * 1990-03-21 1991-11-14 Dreier Kuechen & Einrichtung Kuecheneckschrank
US5804817A (en) * 1993-01-13 1998-09-08 Robert Bosch Gmbh Sensor device for detecting the degree of wetting and/or contamination of windows, especially windshields of motor vehicles
CN2156506Y (zh) * 1993-03-02 1994-02-16 中国科学院半导体研究所 一种自动检测露点仪
RU2085925C1 (ru) * 1995-07-20 1997-07-27 Деревягин Александр Михайлович Способ измерения температуры точки росы и устройство для его осуществления
US6134011A (en) * 1997-09-22 2000-10-17 Hdi Instrumentation Optical measurement system using polarized light
US6174081B1 (en) * 1998-01-30 2001-01-16 The United States Of America As Represented By The Secretary Of The Navy Specular reflection optical bandgap thermometry
CN2490167Y (zh) * 2001-06-20 2002-05-08 武汉钢铁(集团)公司 连续退火炉露点检测装置

Also Published As

Publication number Publication date
EA200500338A1 (ru) 2005-08-25
EP1632768A1 (de) 2006-03-08
EA006871B1 (ru) 2006-04-28
US7350970B2 (en) 2008-04-01
EP1632768B1 (de) 2011-10-12
US20060083287A1 (en) 2006-04-20
CN1701227A (zh) 2005-11-23
CN100552447C (zh) 2009-10-21
EP1632768A4 (de) 2010-08-25
RU2231046C1 (ru) 2004-06-20
WO2004106898A1 (en) 2004-12-09

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