ATE531070T1 - Transmissions-rasterelektronenmikroskop, das gasverstärkung anwendet - Google Patents

Transmissions-rasterelektronenmikroskop, das gasverstärkung anwendet

Info

Publication number
ATE531070T1
ATE531070T1 AT09174824T AT09174824T ATE531070T1 AT E531070 T1 ATE531070 T1 AT E531070T1 AT 09174824 T AT09174824 T AT 09174824T AT 09174824 T AT09174824 T AT 09174824T AT E531070 T1 ATE531070 T1 AT E531070T1
Authority
AT
Austria
Prior art keywords
electron microscope
gas amplification
scanning electron
transmission scanning
amplification
Prior art date
Application number
AT09174824T
Other languages
English (en)
Inventor
William Knowles
Milos Toth
Original Assignee
Fei Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fei Co filed Critical Fei Co
Application granted granted Critical
Publication of ATE531070T1 publication Critical patent/ATE531070T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/244—Detectors; Associated components or circuits therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002—Controlling environment of sample
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2444—Electron Multiplier
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2444—Electron Multiplier
    • H01J2237/24445—Electron Multiplier using avalanche in a gas
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2449—Detector devices with moving charges in electric or magnetic fields
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/2602—Details
    • H01J2237/2605—Details operating at elevated pressures, e.g. atmosphere
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/28—Scanning microscopes
    • H01J2237/2802—Transmission microscopes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT09174824T 2008-11-04 2009-11-03 Transmissions-rasterelektronenmikroskop, das gasverstärkung anwendet ATE531070T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/264,805 US8299432B2 (en) 2008-11-04 2008-11-04 Scanning transmission electron microscope using gas amplification

Publications (1)

Publication Number Publication Date
ATE531070T1 true ATE531070T1 (de) 2011-11-15

Family

ID=41467138

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09174824T ATE531070T1 (de) 2008-11-04 2009-11-03 Transmissions-rasterelektronenmikroskop, das gasverstärkung anwendet

Country Status (4)

Country Link
US (1) US8299432B2 (de)
EP (1) EP2182546B1 (de)
JP (1) JP5571355B2 (de)
AT (1) ATE531070T1 (de)

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EP2722866A1 (de) * 2012-10-22 2014-04-23 Fei Company Konfigurierbarer Teilchenstrahlapparat
US9123506B2 (en) * 2013-06-10 2015-09-01 Fei Company Electron beam-induced etching
EP2838108A1 (de) * 2013-08-12 2015-02-18 Fei Company Verfahren zur Verwendung eines Environmental-TEMs (Transmissionselektronenmikroskop)
US9633816B2 (en) * 2015-05-18 2017-04-25 Fei Company Electron beam microscope with improved imaging gas and method of use
CN108292580B (zh) * 2015-12-03 2019-06-11 松定精度株式会社 荷电粒子线装置及扫描电子显微镜
CN106645250B (zh) * 2016-11-21 2024-04-26 宁波聚瑞精密仪器有限公司 一种具备光学成像功能的扫描透射电子显微镜
US11852598B2 (en) 2018-11-05 2023-12-26 Battelle Energy Alliance, Llc Hyperdimensional scanning transmission electron microscopy and examinations and related systems, methods, and devices
CN110686817B (zh) * 2019-10-31 2020-06-23 电子科技大学 一种粒子束发射角的测量装置

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Also Published As

Publication number Publication date
JP2010114081A (ja) 2010-05-20
EP2182546A2 (de) 2010-05-05
US20100108881A1 (en) 2010-05-06
US8299432B2 (en) 2012-10-30
JP5571355B2 (ja) 2014-08-13
EP2182546A3 (de) 2011-03-30
EP2182546B1 (de) 2011-10-26

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