ATE533128T1 - Verfahren zum überprüfen von abdrücken - Google Patents

Verfahren zum überprüfen von abdrücken

Info

Publication number
ATE533128T1
ATE533128T1 AT03292310T AT03292310T ATE533128T1 AT E533128 T1 ATE533128 T1 AT E533128T1 AT 03292310 T AT03292310 T AT 03292310T AT 03292310 T AT03292310 T AT 03292310T AT E533128 T1 ATE533128 T1 AT E533128T1
Authority
AT
Austria
Prior art keywords
image
prepare
applying
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Prior art date
Application number
AT03292310T
Other languages
English (en)
Inventor
Masaki Shikami
Hirofumi Torita
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Application granted granted Critical
Publication of ATE533128T1 publication Critical patent/ATE533128T1/de

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Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/12—Edge-based segmentation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/155—Segmentation; Edge detection involving morphological operators
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30144—Printing quality

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Inking, Control Or Cleaning Of Printing Machines (AREA)
AT03292310T 2002-09-20 2003-09-19 Verfahren zum überprüfen von abdrücken ATE533128T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002275115A JP3669698B2 (ja) 2002-09-20 2002-09-20 印刷物の検査方法及び検査装置

Publications (1)

Publication Number Publication Date
ATE533128T1 true ATE533128T1 (de) 2011-11-15

Family

ID=31944604

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03292310T ATE533128T1 (de) 2002-09-20 2003-09-19 Verfahren zum überprüfen von abdrücken

Country Status (4)

Country Link
US (1) US7260244B2 (de)
EP (1) EP1400922B1 (de)
JP (1) JP3669698B2 (de)
AT (1) ATE533128T1 (de)

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US8717647B2 (en) * 2005-10-13 2014-05-06 Hewlett-Packard Development Company, L.P. Imaging methods, imaging device calibration methods, imaging devices, and hard imaging device sensor assemblies
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US8655048B2 (en) * 2008-02-05 2014-02-18 Centre De Recherche Industrielle Du Quebec Apparatus and method for measuring size distribution of granular matter
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JP5324391B2 (ja) * 2009-10-22 2013-10-23 キヤノン株式会社 画像処理装置およびその制御方法
JP5537121B2 (ja) * 2009-10-30 2014-07-02 キヤノン株式会社 画像処理装置およびその制御方法
CN102811863B (zh) * 2010-01-21 2015-07-22 惠普印迪戈股份公司 打印图像的自动检查
JP5411049B2 (ja) * 2010-04-07 2014-02-12 オムロン株式会社 画像処理装置
CN101984346A (zh) * 2010-10-19 2011-03-09 浙江大学 基于低通滤波的水果表面缺陷检测方法
US8922641B2 (en) 2011-06-29 2014-12-30 The Procter & Gamble Company System and method for inspecting components of hygienic articles
JP5699051B2 (ja) * 2011-07-15 2015-04-08 株式会社Ｓｃｒｅｅｎホールディングス 画像検査装置および画像記録装置、並びに、画像検査方法
CN103175839A (zh) * 2011-12-21 2013-06-26 北京兆维电子(集团)有限责任公司 胶印版材表面检测的处理方法及系统
JP6010933B2 (ja) * 2012-03-08 2016-10-19 富士ゼロックス株式会社 印刷システムおよび画像形成装置
CN103175844A (zh) * 2012-03-16 2013-06-26 沈阳理工大学 一种金属零部件表面划痕缺陷检测方法
US8805025B2 (en) * 2012-03-30 2014-08-12 Ncr Corporation Stain detection
CN102788806B (zh) * 2012-07-19 2014-09-03 北京农业智能装备技术研究中心 基于类球形亮度变换的水果表面缺陷检测方法
CN102809565A (zh) * 2012-08-29 2012-12-05 常州大学 一种消失模切削表面质量的检测方法
JP6286921B2 (ja) * 2012-09-14 2018-03-07 株式会社リコー 画像検査装置、画像検査システム及び画像検査方法
CN103760165B (zh) * 2013-12-31 2016-08-17 深圳市华星光电技术有限公司 显示面板的缺陷检测方法及缺陷检测装置
CN104296667A (zh) * 2014-11-07 2015-01-21 重庆邮电大学 基于优化盒维数图像匹配的微机电系统面内位移测量方法
JP6327163B2 (ja) * 2015-01-28 2018-05-23 京セラドキュメントソリューションズ株式会社 検査装置および検査方法
DE102015204800B3 (de) * 2015-03-17 2016-12-01 MTU Aero Engines AG Verfahren und Vorrichtung zur Qualitätsbeurteilung eines mittels eines additiven Herstellungsverfahrens hergestellten Bauteils
JP6694362B2 (ja) * 2016-09-30 2020-05-13 富士フイルム株式会社 画像検査方法及び装置、プログラム並びに画像記録システム
CN107610090B (zh) * 2017-07-15 2020-09-18 河北工业大学 一种光伏电池片表面栅线偏移的检测方法
CN108416765B (zh) * 2018-01-30 2020-08-18 华南理工大学 一种字符缺陷自动检测方法和系统
JP2019158757A (ja) * 2018-03-15 2019-09-19 コニカミノルタ株式会社 画像処理装置およびプログラム
US10643332B2 (en) * 2018-03-29 2020-05-05 Uveye Ltd. Method of vehicle image comparison and system thereof
US10650530B2 (en) * 2018-03-29 2020-05-12 Uveye Ltd. Method of vehicle image comparison and system thereof
JP2019217724A (ja) * 2018-06-22 2019-12-26 コニカミノルタ株式会社 画像検査装置、画像形成システム及びプログラム
CN109580632B (zh) * 2018-11-23 2021-03-30 京东方科技集团股份有限公司 一种缺陷确定方法、装置及存储介质
DE102019106437A1 (de) * 2019-03-13 2020-09-17 Bundesdruckerei Gmbh Vorrichtung zum Erfassen eines Oberflächendefekts eines Identifikationsdokumentes
CN112991243B (zh) * 2019-12-17 2023-08-25 中国科学院沈阳自动化研究所 均匀目标表面缺陷检测灰度照度补偿方法
CN111060527B (zh) 2019-12-30 2021-10-29 歌尔股份有限公司 一种字符缺陷检测方法及装置
JP7474067B2 (ja) * 2020-02-26 2024-04-24 キヤノン株式会社 画像処理装置、画像処理方法
CN112834515B (zh) * 2020-12-30 2022-09-23 常州创度信息技术有限公司 一种基于图像处理的产品表面检测系统
CN113034488B (zh) * 2021-04-13 2024-04-19 荣旗工业科技(苏州)股份有限公司 一种喷墨印刷品的视觉检测方法
CN113450316B (zh) * 2021-06-09 2022-03-22 广州大学 一种金属表面字符缺陷检测方法、系统、装置及存储介质
CN118134886B (zh) * 2024-03-19 2025-12-16 北京大恒图像视觉有限公司 一种镭射印刷品成像缺陷检测方法
CN119688732B (zh) * 2024-12-21 2025-09-12 东莞市众嘉印刷有限公司 一种印刷品质量检测方法、装置及存储介质
CN120908214A (zh) * 2025-07-24 2025-11-07 建宏印刷(山东)有限公司 一种数字印刷品缺陷检测装置

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Also Published As

Publication number Publication date
US20040057629A1 (en) 2004-03-25
JP3669698B2 (ja) 2005-07-13
JP2004109047A (ja) 2004-04-08
EP1400922A1 (de) 2004-03-24
US7260244B2 (en) 2007-08-21
EP1400922B1 (de) 2011-11-09

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