ATE533248T1 - Eingebettete kanalanalyse für ein hf-datenmodem - Google Patents

Eingebettete kanalanalyse für ein hf-datenmodem

Info

Publication number
ATE533248T1
ATE533248T1 AT05745714T AT05745714T ATE533248T1 AT E533248 T1 ATE533248 T1 AT E533248T1 AT 05745714 T AT05745714 T AT 05745714T AT 05745714 T AT05745714 T AT 05745714T AT E533248 T1 ATE533248 T1 AT E533248T1
Authority
AT
Austria
Prior art keywords
data
receiver
transmitted data
received
bits
Prior art date
Application number
AT05745714T
Other languages
English (en)
Inventor
Richard Kwolek
Bruce Wight
Original Assignee
Itt Mfg Enterprises Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Itt Mfg Enterprises Inc filed Critical Itt Mfg Enterprises Inc
Application granted granted Critical
Publication of ATE533248T1 publication Critical patent/ATE533248T1/de

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70325—Resolution enhancement techniques not otherwise provided for, e.g. darkfield imaging, interfering beams, spatial frequency multiplication, nearfield lenses or solid immersion lenses
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H04L1/242—Testing correct operation by comparing a transmitted test signal with a locally generated replica
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
    • H04B1/69—Spread spectrum techniques
    • H04B1/713—Spread spectrum techniques using frequency hopping

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Nanotechnology (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Mobile Radio Communication Systems (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Stereophonic System (AREA)
  • Channel Selection Circuits, Automatic Tuning Circuits (AREA)
  • Communication Control (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
AT05745714T 2004-05-03 2005-05-03 Eingebettete kanalanalyse für ein hf-datenmodem ATE533248T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/836,196 US7085561B1 (en) 2004-05-03 2004-05-03 Embedded channel analysis for RF data modem
PCT/US2005/015311 WO2005109731A2 (en) 2004-05-03 2005-05-03 Embedded channel analysis for rf data modem

Publications (1)

Publication Number Publication Date
ATE533248T1 true ATE533248T1 (de) 2011-11-15

Family

ID=34968805

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05745714T ATE533248T1 (de) 2004-05-03 2005-05-03 Eingebettete kanalanalyse für ein hf-datenmodem

Country Status (6)

Country Link
US (1) US7085561B1 (de)
EP (1) EP1745584B1 (de)
AT (1) ATE533248T1 (de)
AU (1) AU2005241964B2 (de)
GB (1) GB2418576A (de)
WO (1) WO2005109731A2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8667343B2 (en) 2010-03-11 2014-03-04 The Johns Hopkins University High speed error detector for fading propagation channels
US20170176534A1 (en) * 2015-12-18 2017-06-22 Intel Corporation Self-characterizing high-speed communication interfaces
US10050860B2 (en) 2016-05-23 2018-08-14 The Boeing Company System and methods for determining channel characteristics
EP3629497B1 (de) * 2018-09-26 2022-06-15 Rohde & Schwarz GmbH & Co. KG Testvorrichtung und testverfahren zum testen einer drahtlosen frequenzsprungsverbindung
CN114257318B (zh) * 2021-12-21 2023-09-22 合肥博雷电气有限公司 一种信道质量测量系统及方法

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3765947D1 (de) 1986-01-18 1990-12-13 Hewlett Packard Ltd Beeinflussungsfreier analysator zur erfassung von kanalstoerungen.
US5131010A (en) * 1989-10-12 1992-07-14 General Electric Company Voice guard digital voter for multiple site PST RF trunking system
US5450305A (en) * 1991-08-12 1995-09-12 Auckland Uniservices Limited Resonant power supplies
EP0528075A1 (de) * 1991-08-19 1993-02-24 ALCATEL BELL Naamloze Vennootschap Verfahren und Vorrichtung zum Messen der Leistung in einer Telekommunkationsleitung
US5448616A (en) 1993-07-30 1995-09-05 Hughes Aircraft Company Integrated bit error rate test function in analog channel unit of digital cellular network
US5454039A (en) * 1993-12-06 1995-09-26 International Business Machines Corporation Software-efficient pseudorandom function and the use thereof for encryption
JP2954475B2 (ja) 1994-02-18 1999-09-27 リーダー電子株式会社 デジタル伝送システムを評価するための方法及び装置
US5802105A (en) 1994-11-30 1998-09-01 Qualcomm Incorporated Method and apparatus for testing a digital communication channel
JP2693922B2 (ja) 1995-02-13 1997-12-24 日本電気エンジニアリング株式会社 移動無線端末機のチャンネル切替判定装置
JPH08335909A (ja) 1995-06-08 1996-12-17 Advantest Corp 高速光パルス列の信号誤り率測定装置
US5764626A (en) * 1995-11-17 1998-06-09 Telecommunications Techniques Corporation Rate-matched cell identification and modification, replacement, or insertion for test and measurement of ATM network virtual connections
JP2848440B2 (ja) 1995-11-22 1999-01-20 日本電気株式会社 回線品質監視回路
JP3017955B2 (ja) 1996-03-27 2000-03-13 アンリツ株式会社 無線機試験装置及び方法
US5940765A (en) * 1996-08-30 1999-08-17 Telefonaktiebolaget Lm Ericsson Radio communications systems and methods for jittered beacon transmission
US5862177A (en) 1996-09-09 1999-01-19 The United States Of America As Represented By The Secretary Of The Army Method for testing communications channels
US6292516B1 (en) 1997-02-13 2001-09-18 Cisco Technology, Inc. Communication system using packets stuffed with test words for evaluating data reception characteristics while providing increased data throughput
US5828672A (en) 1997-04-30 1998-10-27 Telefonaktiebolaget Lm Ericsson (Publ) Estimation of radio channel bit error rate in a digital radio telecommunication network
US5991622A (en) 1997-08-22 1999-11-23 Ericsson Inc. Method and apparatus for automatic channel measurements
US6137830A (en) 1998-01-16 2000-10-24 Motorola Measuring bit error rate performance of a receiver by the receiver and conveying measurement acoustically
US6539205B1 (en) 1998-03-23 2003-03-25 Skyworks Solutions, Inc. Traffic channel quality estimation from a digital control channel
EP1067730A1 (de) 1999-07-02 2001-01-10 Alcatel Bestimmung der Qualität eines Funkkanals
EP1126640A1 (de) 2000-02-18 2001-08-22 Westinghouse Air Brake Company Automatisierte in situ Uberprüfung von Telemetrie-Eisenbahnrundfunkgeräten
GB2368504B (en) 2000-07-13 2002-10-09 Advantest Corp Bit error measurement apparatus and method, and recording medium
US7050717B2 (en) * 2000-09-06 2006-05-23 The Regents Of The University Of California System and method of all optical label swapping using two-stage optical wavelength converters
US6715112B2 (en) * 2000-11-29 2004-03-30 Agilent Technologies, Inc. Method and apparatus for displaying triggered waveform on an error performance analyzer
US6961317B2 (en) 2001-09-28 2005-11-01 Agilent Technologies, Inc. Identifying and synchronizing permuted channels in a parallel channel bit error rate tester
US6980824B2 (en) * 2003-04-17 2005-12-27 International Business Machines Corporation Method and system for optimizing transmission and reception power levels in a communication system
US20050084031A1 (en) * 2003-08-04 2005-04-21 Lowell Rosen Holographic communications using multiple code stages

Also Published As

Publication number Publication date
EP1745584A2 (de) 2007-01-24
WO2005109731A2 (en) 2005-11-17
US7085561B1 (en) 2006-08-01
GB0519805D0 (en) 2005-11-09
WO2005109731A3 (en) 2006-01-12
AU2005241964B2 (en) 2008-11-27
GB2418576A (en) 2006-03-29
EP1745584B1 (de) 2011-11-09
GB2418576A8 (en) 2006-11-17
AU2005241964A1 (en) 2005-11-17

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