Classifications

• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
  • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
  • G01R31/317—Testing of digital circuits
  • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
• • G—PHYSICS
  • G06—COMPUTING OR CALCULATING; COUNTING
  • G06F—ELECTRIC DIGITAL DATA PROCESSING
  • G06F11/00—Error detection; Error correction; Monitoring
  • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
  • G06F11/26—Functional testing
  • G06F11/273—Tester hardware, i.e. output processing circuits
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
  • G11C29/003—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation in serial memories
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
  • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
  • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
  • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
  • G11C29/46—Test trigger logic

Landscapes

• Engineering & Computer Science (AREA)
• General Engineering & Computer Science (AREA)
• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Theoretical Computer Science (AREA)
• Computer Hardware Design (AREA)
• Quality & Reliability (AREA)
• Information Transfer Systems (AREA)
• Test And Diagnosis Of Digital Computers (AREA)
• Techniques For Improving Reliability Of Storages (AREA)
• Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)

Applications Claiming Priority (2)

Publications (1)

Family

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Family Applications (1)

Country Status (6)

Families Citing this family (1)

Family Cites Families (11)

• 2006
  • 2006-02-16 AT AT06735222T patent/ATE534077T1/de active
  • 2006-02-16 US US11/355,619 patent/US7603601B2/en active Active
  • 2006-02-16 EP EP06735222A patent/EP1851635B1/de not_active Expired - Lifetime
  • 2006-02-16 KR KR1020077018878A patent/KR101087225B1/ko not_active Expired - Lifetime
  • 2006-02-16 CN CN2006800058951A patent/CN101128803B/zh not_active Expired - Lifetime
  • 2006-02-16 WO PCT/US2006/005462 patent/WO2006091468A2/en not_active Ceased

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