ATE534889T1 - Kalibrierungsquellenanordnung für einen infrarotdetektor - Google Patents

Kalibrierungsquellenanordnung für einen infrarotdetektor

Info

Publication number
ATE534889T1
ATE534889T1 AT08853931T AT08853931T ATE534889T1 AT E534889 T1 ATE534889 T1 AT E534889T1 AT 08853931 T AT08853931 T AT 08853931T AT 08853931 T AT08853931 T AT 08853931T AT E534889 T1 ATE534889 T1 AT E534889T1
Authority
AT
Austria
Prior art keywords
light
infrared detector
source arrangement
calibration source
substrate
Prior art date
Application number
AT08853931T
Other languages
English (en)
Inventor
Eric Moskun
Lacy Cook
Ruyter Howard De
Original Assignee
Raytheon Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Raytheon Co filed Critical Raytheon Co
Application granted granted Critical
Publication of ATE534889T1 publication Critical patent/ATE534889T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
    • G01J5/53—Reference sources, e.g. standard lamps; Black bodies
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/007—Optical devices or arrangements for the control of light using movable or deformable optical elements the movable or deformable optical element controlling the colour, i.e. a spectral characteristic, of the light
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0004—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
    • G02B19/0028—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed refractive and reflective surfaces, e.g. non-imaging catadioptric systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
    • G02B19/0047—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
    • G02B19/0061—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source the light source comprising a LED
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
    • G02B19/0085—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with both a detector and a source
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
    • G02B19/009—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with infrared radiation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0927—Systems for changing the beam intensity distribution, e.g. Gaussian to top-hat
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0933—Systems for active beam shaping by rapid movement of an element
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0938—Using specific optical elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0938—Using specific optical elements
    • G02B27/0977—Reflective elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B23/00—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
    • G02B23/12—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices with means for image conversion or intensification

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Astronomy & Astrophysics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AT08853931T 2007-10-30 2008-10-29 Kalibrierungsquellenanordnung für einen infrarotdetektor ATE534889T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/978,738 US7592588B2 (en) 2007-10-30 2007-10-30 Calibration source infrared assembly for an infrared detector
PCT/US2008/081589 WO2009070408A1 (en) 2007-10-30 2008-10-29 Calibration source assembly for an infrared detector

Publications (1)

Publication Number Publication Date
ATE534889T1 true ATE534889T1 (de) 2011-12-15

Family

ID=40365363

Family Applications (3)

Application Number Title Priority Date Filing Date
AT10169745T ATE536536T1 (de) 2007-10-30 2008-10-29 Infrarotdetektor mit einer kalibrierquellenanordnung
AT10169746T ATE536537T1 (de) 2007-10-30 2008-10-29 Dewar infrarotdetektor
AT08853931T ATE534889T1 (de) 2007-10-30 2008-10-29 Kalibrierungsquellenanordnung für einen infrarotdetektor

Family Applications Before (2)

Application Number Title Priority Date Filing Date
AT10169745T ATE536536T1 (de) 2007-10-30 2008-10-29 Infrarotdetektor mit einer kalibrierquellenanordnung
AT10169746T ATE536537T1 (de) 2007-10-30 2008-10-29 Dewar infrarotdetektor

Country Status (4)

Country Link
US (1) US7592588B2 (de)
EP (3) EP2205951B1 (de)
AT (3) ATE536536T1 (de)
WO (1) WO2009070408A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8716651B2 (en) 2011-08-18 2014-05-06 Raytheon Company Calibration system for detector
US8861106B2 (en) 2011-12-02 2014-10-14 Raytheon Company Variable monochromatic uniform calibration source
JP2014020817A (ja) * 2012-07-13 2014-02-03 Nippon Steel & Sumitomo Metal 放射温度計用校正装置及び放射温度計の校正方法
US9024253B2 (en) 2012-08-21 2015-05-05 Raytheon Company Calibration system for detector
EP3093637B1 (de) 2015-05-01 2021-11-10 ABB Schweiz AG Kalibrierungssysteme und -verfahren für kleinvolumige infrarotquelle mit hoher emissivität
US11268860B2 (en) 2020-07-24 2022-03-08 Raytheon Company Radiometric calibration of detector
US11800051B2 (en) * 2021-12-17 2023-10-24 Raytheon Company Device and method for optical sensor calibration
KR20250011160A (ko) * 2022-05-13 2025-01-21 유니버시티 오브 시카고 광학 공동 어레이
DE102023002291A1 (de) * 2023-06-06 2024-12-12 Diehl Defence Gmbh & Co. Kg Suchkopfmesssystem und Messverfahren zur optischen Vermessung eines Suchkopfs

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5404016A (en) * 1984-08-31 1995-04-04 Santa Barbara Research Center Dewar detector assembly
US4876453A (en) * 1986-02-19 1989-10-24 Hughes Aircraft Company Method and apparatus for calibrating an imaging sensor
GB8607356D0 (en) * 1986-03-25 1986-05-21 Ortec Inc Modular cryogenic detector head assembly
US4727255A (en) * 1986-06-03 1988-02-23 Hughes Aircraft Company Silicone dielectric gel cryogenic detector interface
US5587784A (en) * 1995-06-16 1996-12-24 Hughes Electronics Multispectral-staring sensor
US7119337B1 (en) * 1997-08-04 2006-10-10 Ion Optics, Inc. Infrared radiation sources, sensors and source combinations, and methods of manufacture
US7238942B2 (en) * 2001-05-02 2007-07-03 Csir Spectrometric using broadband filters with overlapping spectral ranges
SE524086C2 (sv) * 2001-10-30 2004-06-22 Phase In Ab Mäthuvud för gasanalysator
US6765663B2 (en) * 2002-03-14 2004-07-20 Raytheon Company Efficient multiple emitter boresight reference source
KR100601964B1 (ko) * 2004-09-07 2006-07-19 삼성전자주식회사 다채널 다중 컬러 측정을 위한 광검출장치 및 이를 채용한다채널 시료 분석기

Also Published As

Publication number Publication date
US7592588B2 (en) 2009-09-22
WO2009070408A1 (en) 2009-06-04
EP2244076B1 (de) 2011-12-07
EP2244077A1 (de) 2010-10-27
EP2205951B1 (de) 2011-11-23
US20090108201A1 (en) 2009-04-30
ATE536537T1 (de) 2011-12-15
EP2244077B1 (de) 2011-12-07
EP2205951A1 (de) 2010-07-14
ATE536536T1 (de) 2011-12-15
EP2244076A1 (de) 2010-10-27

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