ATE537437T1 - Verfahren und gerät zur überprüfung des betriebes eines optischen scanners - Google Patents

Verfahren und gerät zur überprüfung des betriebes eines optischen scanners

Info

Publication number
ATE537437T1
ATE537437T1 AT03713712T AT03713712T ATE537437T1 AT E537437 T1 ATE537437 T1 AT E537437T1 AT 03713712 T AT03713712 T AT 03713712T AT 03713712 T AT03713712 T AT 03713712T AT E537437 T1 ATE537437 T1 AT E537437T1
Authority
AT
Austria
Prior art keywords
beams
scan
reference target
observing
scanning system
Prior art date
Application number
AT03713712T
Other languages
English (en)
Inventor
Oliver Hamann
Original Assignee
Mettler Toledo Autochem Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mettler Toledo Autochem Inc filed Critical Mettler Toledo Autochem Inc
Application granted granted Critical
Publication of ATE537437T1 publication Critical patent/ATE537437T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4785—Standardising light scatter apparatus; Standards therefor

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AT03713712T 2002-02-22 2003-02-24 Verfahren und gerät zur überprüfung des betriebes eines optischen scanners ATE537437T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US35945902P 2002-02-22 2002-02-22
PCT/US2003/005883 WO2003073077A1 (en) 2002-02-22 2003-02-24 Method and apparatus for validating the operation of an optical scanning device

Publications (1)

Publication Number Publication Date
ATE537437T1 true ATE537437T1 (de) 2011-12-15

Family

ID=27766088

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03713712T ATE537437T1 (de) 2002-02-22 2003-02-24 Verfahren und gerät zur überprüfung des betriebes eines optischen scanners

Country Status (7)

Country Link
US (1) US6940064B2 (de)
EP (1) EP1476740B1 (de)
JP (1) JP4381148B2 (de)
AT (1) ATE537437T1 (de)
AU (1) AU2003217750B2 (de)
CA (1) CA2476533C (de)
WO (1) WO2003073077A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7193712B2 (en) 2004-10-14 2007-03-20 The Procter & Gamble Company Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate
US7274453B2 (en) * 2004-10-14 2007-09-25 The Procter & Gamble Company Methods and apparatus for calibrating an electromagnetic measurement device
US8164747B2 (en) * 2006-12-14 2012-04-24 ASD, Inc Apparatus, system and method for optical spectroscopic measurements
PH12012500885A1 (en) 2009-11-04 2012-11-26 Colgate Palmolive Co Process to produce stable suspending system
CA2776996C (en) 2009-11-04 2015-06-30 Colgate-Palmolive Company Microfibrous cellulose having a particle size distribution for structured surfactant compositions
JP2025092247A (ja) * 2023-12-08 2025-06-19 横河電機株式会社 分光分析装置及び分光分析方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4871251A (en) * 1987-04-27 1989-10-03 Preikschat F K Apparatus and method for particle analysis
JPH07113705B2 (ja) * 1988-10-24 1995-12-06 大日本スクリーン製造株式会社 光ビーム走査装置
US5751423A (en) * 1996-12-06 1998-05-12 United Sciences, Inc. Opacity and forward scattering monitor using beam-steered solid-state light source
US6449042B1 (en) * 1999-05-04 2002-09-10 Laser Sensor Technology, Inc. Method and apparatus for particle assessment using multiple scanning beam reflectance
EP1305602B1 (de) * 2000-07-28 2014-01-22 Otsuka Electronics Co., Ltd. Automatisches optisches messverfahren
US20020140990A1 (en) * 2001-03-27 2002-10-03 Rong-Ji Liu Focus calibrating method for image scanning device by testing focus chart

Also Published As

Publication number Publication date
WO2003073077A1 (en) 2003-09-04
EP1476740B1 (de) 2011-12-14
AU2003217750B2 (en) 2009-05-21
EP1476740A1 (de) 2004-11-17
JP2005518539A (ja) 2005-06-23
US6940064B2 (en) 2005-09-06
JP4381148B2 (ja) 2009-12-09
US20030160162A1 (en) 2003-08-28
CA2476533A1 (en) 2003-09-04
CA2476533C (en) 2012-04-03
AU2003217750A1 (en) 2003-09-09

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