ATE539324T1 - Verfahren zur herstellung von unabhängigen mehrdimensionalen kalibrationsmustern - Google Patents

Verfahren zur herstellung von unabhängigen mehrdimensionalen kalibrationsmustern

Info

Publication number
ATE539324T1
ATE539324T1 AT05772334T AT05772334T ATE539324T1 AT E539324 T1 ATE539324 T1 AT E539324T1 AT 05772334 T AT05772334 T AT 05772334T AT 05772334 T AT05772334 T AT 05772334T AT E539324 T1 ATE539324 T1 AT E539324T1
Authority
AT
Austria
Prior art keywords
properties
calibratable
measuring
calibrating
sample
Prior art date
Application number
AT05772334T
Other languages
English (en)
Inventor
Vladimir Aleksandrovich Zubkov
Konstantin Anatolyevich Zharinov
Aleksandr Valeryevich Shamrai
Original Assignee
Vladimir Aleksandrovich Zubkov
Konstantin Anatolyevich Zharinov
Aleksandr Valeryevich Shamrai
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vladimir Aleksandrovich Zubkov, Konstantin Anatolyevich Zharinov, Aleksandr Valeryevich Shamrai filed Critical Vladimir Aleksandrovich Zubkov
Application granted granted Critical
Publication of ATE539324T1 publication Critical patent/ATE539324T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Epoxy Resins (AREA)
  • Steroid Compounds (AREA)
  • Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
AT05772334T 2004-07-27 2005-07-04 Verfahren zur herstellung von unabhängigen mehrdimensionalen kalibrationsmustern ATE539324T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
RU2004123573/12A RU2266523C1 (ru) 2004-07-27 2004-07-27 Способ создания независимых многомерных градуировочных моделей
PCT/RU2005/000372 WO2006014123A1 (en) 2004-07-27 2005-07-04 Method for producing independent multidimensional calibrating patterns

Publications (1)

Publication Number Publication Date
ATE539324T1 true ATE539324T1 (de) 2012-01-15

Family

ID=35787367

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05772334T ATE539324T1 (de) 2004-07-27 2005-07-04 Verfahren zur herstellung von unabhängigen mehrdimensionalen kalibrationsmustern

Country Status (9)

Country Link
US (1) US20080034025A1 (de)
EP (1) EP1780517B1 (de)
CN (1) CN101010567B (de)
AT (1) ATE539324T1 (de)
CA (1) CA2575585A1 (de)
EA (1) EA009692B1 (de)
RU (1) RU2266523C1 (de)
UA (1) UA86820C2 (de)
WO (1) WO2006014123A1 (de)

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CN111678830A (zh) * 2020-06-17 2020-09-18 中检(河南)计量检测有限公司 一种面团拉伸仪校准方法
CN112683816B (zh) * 2020-12-25 2021-08-06 中船重工安谱（湖北）仪器有限公司 一种光谱模型传递的光谱识别方法
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CN114812651B (zh) * 2022-04-18 2023-05-12 上海悉德信息科技有限公司 基于传感器技术的仪器仪表运行安全智能监测预警系统
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Also Published As

Publication number Publication date
CN101010567B (zh) 2010-04-21
UA86820C2 (uk) 2009-05-25
EP1780517A4 (de) 2010-04-28
EP1780517A1 (de) 2007-05-02
EA200700048A1 (ru) 2007-06-29
EA009692B1 (ru) 2008-02-28
CA2575585A1 (en) 2006-02-09
WO2006014123A1 (en) 2006-02-09
EP1780517B1 (de) 2011-12-28
US20080034025A1 (en) 2008-02-07
CN101010567A (zh) 2007-08-01
RU2266523C1 (ru) 2005-12-20

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