ATE543205T1 - METHOD AND APPARATUS FOR PRODUCING THIN EPITACTIC SEMICONDUCTOR LAYERS - Google Patents
METHOD AND APPARATUS FOR PRODUCING THIN EPITACTIC SEMICONDUCTOR LAYERSInfo
- Publication number
- ATE543205T1 ATE543205T1 AT02779254T AT02779254T ATE543205T1 AT E543205 T1 ATE543205 T1 AT E543205T1 AT 02779254 T AT02779254 T AT 02779254T AT 02779254 T AT02779254 T AT 02779254T AT E543205 T1 ATE543205 T1 AT E543205T1
- Authority
- AT
- Austria
- Prior art keywords
- deposition
- semiconductor layers
- semiconductor layer
- substrates
- thin
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/02—Pretreatment of the material to be coated
- C23C16/0209—Pretreatment of the material to be coated by heating
- C23C16/0218—Pretreatment of the material to be coated by heating in a reactive atmosphere
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/24—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
- H10P14/3404—Deposited materials, e.g. layers characterised by the chemical composition being Group IVA materials
- H10P14/3408—Silicon carbide
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
- H10P14/3404—Deposited materials, e.g. layers characterised by the chemical composition being Group IVA materials
- H10P14/3411—Silicon, silicon germanium or germanium
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/36—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by treatments done before the formation of the materials
- H10P14/3602—In-situ cleaning
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Production of thin, preferably diffusion-limiting epitaxial semiconductor layers based on SiGeC or SiG comprises simultaneously treating a number of substrates, preferably more than 75, having a diameter of at least 150 mm in a low pressure batch reactor; cleaning the surfaces to be coated by wet chemical method and/or in the gas phase; heating the cleaned substrates to a pre-bake temperature and subjecting the hydrogen pre-bake at the same or higher reactor pressure; heating the substrates to a deposition temperature and depositing the semiconductor layers at the same or lower reactor pressure. The deposition is controlled by surface reactions on the substrate and deposition of the semiconductor layer is controlled in such a way that the deposition of the thin epitaxial semiconductor layer terminates when the thin epitaxial semiconductor layer has reached a thickness of 10-1000 nm. An Independent claim is also included for a device for carrying out the process comprising a main chamber (1) containing a low pressure batch reactor (2), a transfer chamber (3) arranged on the main chamber, and a door (4) fitted to the transfer chamber.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10137441 | 2001-07-27 | ||
| DE10144431A DE10144431A1 (en) | 2001-07-27 | 2001-09-06 | Production of thin, preferably diffusion-limiting epitaxial semiconductor layers used in the production of high frequency components comprises simultaneously treating substrates in a low pressure batch reactor before further processing |
| PCT/EP2002/008296 WO2003012840A2 (en) | 2001-07-27 | 2002-07-25 | Method and device for the production of thin epiatctic semiconductor layers |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE543205T1 true ATE543205T1 (en) | 2012-02-15 |
Family
ID=7693828
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT02779254T ATE543205T1 (en) | 2001-07-27 | 2002-07-25 | METHOD AND APPARATUS FOR PRODUCING THIN EPITACTIC SEMICONDUCTOR LAYERS |
Country Status (2)
| Country | Link |
|---|---|
| AT (1) | ATE543205T1 (en) |
| DE (1) | DE10144431A1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102004024207B4 (en) * | 2004-05-10 | 2016-03-24 | Ihp Gmbh - Innovations For High Performance Microelectronics / Leibniz-Institut Für Innovative Mikroelektronik | A method and apparatus for low temperature epitaxy on a variety of semiconductor substrates |
-
2001
- 2001-09-06 DE DE10144431A patent/DE10144431A1/en not_active Ceased
-
2002
- 2002-07-25 AT AT02779254T patent/ATE543205T1/en active
Also Published As
| Publication number | Publication date |
|---|---|
| DE10144431A1 (en) | 2003-02-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10737476B2 (en) | Methods for transferring graphene films and substrates comprising graphene films | |
| WO2003054256A3 (en) | Method and device for depositing crystalline layers on crystalline substrates | |
| KR20000060438A (en) | Method for forming aluminum oxide films | |
| TW200741831A (en) | Method of manufacturing semiconductor device | |
| EP1382400B1 (en) | Silan-based thin films | |
| ATE181969T1 (en) | PCVD METHOD AND DEVICE FOR COATING CURVED SUBSTRATES | |
| TW325601B (en) | Process of manufacturing thin film semiconductor | |
| DE69511573D1 (en) | DEVICE FOR CARRYING OUT THE GAS PHASE INFILTRATION OR COATING METHOD | |
| EP0838536A3 (en) | Method and apparatus for depositing highly oriented and reflective crystalline layers | |
| WO2020119639A1 (en) | Composite diamond coating and preparation method therefor, microfluidic channel and microfluidic device | |
| WO2001066834A3 (en) | Chemical vapor deposition process for fabricating layered superlattice materials | |
| KR970072186A (en) | Improved method and system for forming dielectric film using helium as carrier gas | |
| EP0164928A3 (en) | Vertical hot wall cvd reactor | |
| DE60035648D1 (en) | Method for cleaning a device for producing thin-film silicon | |
| CN116374998B (en) | Method for directly growing single-walled carbon nanotube horizontal array by using silicon oxide | |
| TW201535515A (en) | Critical chamber component surface improvement to reduce chamber particles | |
| DE60322042D1 (en) | METHOD FOR FORMING A SILICON EPITAXIAL LAYER | |
| US20070062648A1 (en) | Electrostatic chuck, thin film manufacturing apparatus having the same, thin film manufacturing method, and substrate surface treatment method | |
| KR101184924B1 (en) | Method for forming metal layer | |
| CN1389592A (en) | Method for heating lining | |
| WO2000067311A3 (en) | Method for producing a wafer support in a high-temperature cvd reactor | |
| TW200631114A (en) | Yttrium-containing ceramic coated material and method of manufacturing the same | |
| CN102653885A (en) | Method for preparing structured graphene on 3C-SiC substrate | |
| ATE242342T1 (en) | METHOD AND DEVICE FOR PRODUCING PLAN-PARALLEL PLATES | |
| WO2012161561A1 (en) | Method and apparatus for depositing nanomaterials |