ATE544064T1 - Optische messeinheit und verfahren zur durchführung einer reflexionsmessung - Google Patents

Optische messeinheit und verfahren zur durchführung einer reflexionsmessung

Info

Publication number
ATE544064T1
ATE544064T1 AT09766169T AT09766169T ATE544064T1 AT E544064 T1 ATE544064 T1 AT E544064T1 AT 09766169 T AT09766169 T AT 09766169T AT 09766169 T AT09766169 T AT 09766169T AT E544064 T1 ATE544064 T1 AT E544064T1
Authority
AT
Austria
Prior art keywords
light
light source
measuring unit
optical measuring
measured
Prior art date
Application number
AT09766169T
Other languages
English (en)
Inventor
Karoly Kunstar
Original Assignee
77 Elektronika Mueszeripari Kft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from HU0800386A external-priority patent/HU0800386D0/hu
Priority claimed from HU0900350A external-priority patent/HUP0900350A2/hu
Application filed by 77 Elektronika Mueszeripari Kft filed Critical 77 Elektronika Mueszeripari Kft
Application granted granted Critical
Publication of ATE544064T1 publication Critical patent/ATE544064T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8483—Investigating reagent band
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4709—Backscatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4735—Solid samples, e.g. paper, glass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N2021/4776—Miscellaneous in diffuse reflection devices
    • G01N2021/478—Application in testing analytical test strips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8645—Investigating moving sheets using multidetectors, detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G01N2201/0627—Use of several LED's for spectral resolution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12723—Self check capacity; automatic, periodic step of checking
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12792—Compensating own radiation in apparatus

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Molecular Biology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
AT09766169T 2008-06-20 2009-06-17 Optische messeinheit und verfahren zur durchführung einer reflexionsmessung ATE544064T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
HU0800386A HU0800386D0 (en) 2008-06-20 2008-06-20 Optiocal probe
HU0900350A HUP0900350A2 (en) 2009-06-09 2009-06-09 Optical measuring unit and method for implementation of reflective measuring
PCT/HU2009/000051 WO2009153609A1 (en) 2008-06-20 2009-06-17 Optical measuring unit and method for carrying out a reflective measurement

Publications (1)

Publication Number Publication Date
ATE544064T1 true ATE544064T1 (de) 2012-02-15

Family

ID=89989027

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09766169T ATE544064T1 (de) 2008-06-20 2009-06-17 Optische messeinheit und verfahren zur durchführung einer reflexionsmessung

Country Status (7)

Country Link
US (1) US20110122411A1 (de)
EP (1) EP2300804B1 (de)
CN (1) CN102066909B (de)
AT (1) ATE544064T1 (de)
BR (1) BRPI0913283B1 (de)
EA (1) EA020255B1 (de)
WO (1) WO2009153609A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5686230B1 (ja) * 2013-05-29 2015-03-18 コニカミノルタ株式会社 照明装置及び反射特性測定装置
CN103344337B (zh) * 2013-06-21 2015-03-18 杭州新叶光电工程技术有限公司 应用led照明光源的棉花色泽仪
CN104374767A (zh) * 2013-08-13 2015-02-25 嘉兴驰网工业自动化科技有限公司 一种便携式智能食品安全检测仪
DE102015100977A1 (de) * 2015-01-23 2016-07-28 Vorwerk & Co. Interholding Gmbh Gerät zur Bearbeitung einer Oberfläche
CA2988658C (en) * 2015-06-25 2023-07-18 Fresenius Medical Care Holdings, Inc. Direct light differential measurement system
US10054763B2 (en) * 2015-08-17 2018-08-21 Apple Inc. Optical position sensing with temperature calibration
CN105527252A (zh) * 2016-01-13 2016-04-27 中国工程物理研究院激光聚变研究中心 一种光学元件反射率测量仪
EP3620745B1 (de) * 2018-09-06 2021-06-02 TESA Sàrl Tragbare messvorrichtung mit autokonfiguration
CN111426631A (zh) * 2020-05-21 2020-07-17 深圳市拓普泰克电子有限公司 光谱探头和光谱分析仪

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4092068A (en) * 1976-05-05 1978-05-30 Domtar Inc. Surface sensor
DE3407754A1 (de) * 1984-03-02 1985-09-12 Boehringer Mannheim Gmbh, 6800 Mannheim Geraet zur bestimmung des diffusen reflexionsvermoegens einer probenflaeche kleiner abmessungen
GB8429211D0 (en) * 1984-11-19 1984-12-27 Mit Peritronic Ltd Reflectometer
US5118183A (en) * 1989-02-10 1992-06-02 X-Rite, Incorporated Automated strip reader densitometer
US5611999A (en) * 1995-09-05 1997-03-18 Bayer Corporation Diffused light reflectance readhead
JP3436093B2 (ja) * 1996-08-01 2003-08-11 株式会社サタケ 葉の成分測定装置
JPH1065218A (ja) * 1996-08-23 1998-03-06 Kdk Corp 光学系用ｌｅｄ
DE10061336A1 (de) * 2000-12-08 2002-06-13 Roche Diagnostics Gmbh System zur Analyse von Probeflüssigkeiten beinhaltend eine Lagekontrolleinheit
JP2005274231A (ja) * 2004-03-23 2005-10-06 Sunx Ltd 光電センサ
JP2006205682A (ja) * 2005-01-31 2006-08-10 Kyocera Mita Corp Ｌｅｄアレイ露光装置及びこれを使用する画像形成装置
EP1694049B1 (de) * 2005-02-16 2009-07-01 X-Rite Europe GmbH Farbmessgerät und zugehöriger Messkopf
EP1938063B1 (de) * 2005-08-15 2011-12-21 X-Rite Incorporated Spektrophotometer mit lichtleitelement

Also Published As

Publication number Publication date
EA201100067A1 (ru) 2011-08-30
CN102066909A (zh) 2011-05-18
US20110122411A1 (en) 2011-05-26
BRPI0913283B1 (pt) 2022-02-08
BRPI0913283A2 (pt) 2021-01-26
CN102066909B (zh) 2013-07-10
EA020255B1 (ru) 2014-09-30
EP2300804A1 (de) 2011-03-30
WO2009153609A1 (en) 2009-12-23
EP2300804B1 (de) 2012-02-01

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